المؤلفون: Sung Eun Kim, Sang Jin Lee, Jun Young Cha, Sang Won Yi, Tae Sun Kim, Il Leon Cho, Jae Young Kwak, Kwang Hoon Oh

المصدر: Clinical Endoscopy, Vol 52, Iss 5, Pp 506-509 (2019)

مصطلحات موضوعية: Colonic neoplasms, Hepatic metastasis, Superior mesenteric vein tumor thrombosis, Internal medicine, RC31-1245, Diseases of the digestive system. Gastroenterology, RC799-869

وصف الملف: electronic resource

Relation: http://www.e-ce.org/upload/pdf/ce-2018-135.pdf; https://doaj.org/toc/2234-2400; https://doaj.org/toc/2234-2443

URL الوصول: https://doaj.org/article/a7194ba5799748d79e1ae71aeb434a1c

المؤلفون: Ki Hun Lee, Sang Jin Lee, Hak Soo Kim, Sung Eun Kim, Soo Yong Choi, Hyun Ju Lee, Suk Hun Ha, Kwang Hoon Oh, Dae-Woon Eom

المصدر: Case Reports in Gastroenterology, Vol 11, Iss 3, Pp 559-563 (2017)

مصطلحات موضوعية: Squamous cell carcinoma, Esophagus, Polyps, Surgery, Diseases of the digestive system. Gastroenterology, RC799-869

وصف الملف: electronic resource

Relation: http://www.karger.com/Article/FullText/479312; https://doaj.org/toc/1662-0631

URL الوصول: https://doaj.org/article/99c1aa0e503e48e3a2307aebd0846726

المؤلفون: In-Hwan Ji, Young-Hwan Choi, Soo-Seong Kim, Kwang-Hoon Oh, Min-Koo Han

المصدر: 2006 IEEE International Symposium on Power Semiconductor Devices and IC's Power Semiconductor Devices and IC's, 2006. ISPSD 2006. IEEE International Symposium on. :1-4 2006

Relation: 2006 IEEE International Symposium on Power Semiconductor Devices and IC's (ISPSD)

المؤلفون: Kwang-Hoon Oh, Jung-Hoon Chun, Banerjee, K., Duvvury, C., Dutton, R.W.

المصدر: 2003 IEEE International Reliability Physics Symposium Proceedings, 2003. 41st Annual. Reliability physics symposium Reliability Physics Symposium Proceedings, 2003. 41st Annual. 2003 IEEE International. :249-255 2003

Relation: International Reliability Physics Symposium

المؤلفون: Kwang-Hoon Oh, Duvvury, C., Banerjee, K., Dutton, R.W.

المصدر: 2002 IEEE International Reliability Physics Symposium. Proceedings. 40th Annual (Cat. No.02CH37320) Reliability physics symposium Reliability Physics Symposium Proceedings, 2002. 40th Annual. :148-155 2002

Relation: 2002 IEEE International Reliability Physics Symposium Proceedings. 40th Annual

المؤلفون: Kwang-Hoon Oh, Banerjee, K., Duvvury, C., Dutton, R.W.

المصدر: Digest. International Electron Devices Meeting, Electron devices meeting Electron Devices Meeting, 2002. IEDM '02. International. :341-344 2002

Relation: IEEE International Electron Devices Meeting

المؤلفون: Kwang-Hoon Oh, Duvvury, C., Salling, C., Banerjee, K., Dutton, R.W.

المصدر: 2001 IEEE International Reliability Physics Symposium Proceedings. 39th Annual (Cat. No.00CH37167) Reliability physics symposium Reliability Physics Symposium, 2001. Proceedings. 39th Annual. 2001 IEEE International. :226-234 2001

Relation: 2001 IEEE International Reliability Physics Symposium Proceedings. 39th Annual

المؤلفون: Jung-Suk Goo, Kwang-Hoon Oh, Chang-Hoon Choi, Zhiping Yu, Lee, T.H., Dutton, R.W.

المصدر: 2000 International Conference on Simulation Semiconductor Processes and Devices (Cat. No.00TH8502) Simulation of semiconductor processes and devices Simulation of Semiconductor Processes and Devices, 2000. SISPAD 2000. 2000 International Conference on. :269-272 2000

Relation: 2000 International Conference on Simulation of Semiconductor Processes and Devices

المؤلفون: Kwang-Hoon Oh, Zhiping Yu, Dutton, R.W.

المصدر: ICVC '99. 6th International Conference on VLSI and CAD (Cat. No.99EX361) VLSI and CAD VLSI and CAD, 1999. ICVC '99. 6th International Conference on. :190-193 1999

Relation: ICVC'99. 6th International Conference on VLSI and CAD

المؤلفون: Chang-Hoon Choi, Kwang-Hoon Oh, Jung-Suk Goo, Zhiping Yu, Dutton, R.W.

المصدر: International Electron Devices Meeting 1999. Technical Digest (Cat. No.99CH36318) Electron devices Electron Devices Meeting, 1999. IEDM '99. Technical Digest. International. :735-738 1999

Relation: International Electron Devices Meeting 1999. Technical Digest