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1مؤتمر
المؤلفون: Shigenobu Maeda, Jung-A Choi, Jeong-Hwan Yang, You-Seung Jin, Su-Kon Bae, Young-Wug Kim, Kwang-Pyuk Suh
المصدر: 2004 IEEE International Reliability Physics Symposium. Proceedings Reliability physics Reliability Physics Symposium Proceedings, 2004. 42nd Annual. 2004 IEEE International. :8-12 2004
Relation: 2004 IEEE International Reliability Physics Symposium. Proceedings
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2مؤتمر
المؤلفون: Jong Pyo Kim, Yun-Seok Kim, Ha Jin Lim, Jung Hyoung Lee, Seok Joo Doh, Hyung-Suk Jung, Sung-Kee Han, Min-Joo Kim, Jong-Ho Lee, Nae-In Lee, Ho-Kyu Kang, Kwang-Pyuk Suh, Young-Su Chung
المصدر: IEDM Technical Digest. IEEE International Electron Devices Meeting, 2004. Electron devices meeting Electron Devices Meeting, 2004. IEDM Technical Digest. IEEE International. :125-128 2004
Relation: 2004 International Electron Devices Meeting
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3مؤتمر
المؤلفون: Choi, J.A., Kwon Lee, You Seung Jin, Yong Jun Lee, Soo Yong Lee, Geon Ung Lee, Seung Hwan Lee, Min Chul Sun, Dong Chan Kim, Young Mi Lee, Su Gon Bae, Jeong Hwan Yang, Maeda, S., Nae In Lee, Ho Kyu Kang, Kwang Pyuk Suh
المصدر: IEDM Technical Digest. IEEE International Electron Devices Meeting, 2004. Electron devices meeting Electron Devices Meeting, 2004. IEDM Technical Digest. IEEE International. :647-650 2004
Relation: 2004 International Electron Devices Meeting
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4مؤتمر
المؤلفون: Seung Hwan Lee, Dong Suk Shin, Hwa Sung Rhee, Tetsuji Ueno, Ho Lee Moon Han Park, Nae-In Lee, Ho-Kyu Kang, Kwang-Pyuk Suh
المصدر: IEDM Technical Digest. IEEE International Electron Devices Meeting, 2004. Electron devices meeting Electron Devices Meeting, 2004. IEDM Technical Digest. IEEE International. :1051-1054 2004
Relation: 2004 International Electron Devices Meeting
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5مؤتمر
المؤلفون: Jung-Hyoung Lee, Jong Pyo Kim, Jong-Ho Lee, Yun-Seok Kim, Hyung-Seok Jung, Nae-In Lee, Ho-Kyu Kang, Kwang-Pyuk Suh, Mun-Mo Jeong, Kyu-Taek Hyun, Hion-Suck Baik, Young Su Chung, Xinye Liu, Ramanathan, S., Seidel, T., Winkler, J., Londergan, A., Hae young Kim, Jung Min Ha, Nam Kyu Lee
المصدر: Digest. International Electron Devices Meeting, Electron devices meeting Electron Devices Meeting, 2002. IEDM '02. International. :221-224 2002
Relation: IEEE International Electron Devices Meeting
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6مؤتمر
المؤلفون: Jae-Eun Park, Ja-Hum Ku, Joo-Won Lee, Jong-ho Yang, Kang-Soo Chu, Seung-Hwan Lee, Moon-Han Park, Nae-In Lee, Ho-Kyu Kang, Kwang-Pyuk Suh, Byoung-Ha Cho, Byoung-Chul Kim, Cheol-Ho Shin
المصدر: Digest. International Electron Devices Meeting, Electron devices meeting Electron Devices Meeting, 2002. IEDM '02. International. :229-232 2002
Relation: IEEE International Electron Devices Meeting
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7مؤتمر
المؤلفون: Soo-Geun Lee, Kyoung-Woo Lee, Il-Goo Kim, Wan-Jae Park, Young-Jin Wee, Won-Sang Song, Jae-Hak Kim, Seung-Jin Lee, Hyeok-Sang Oh, Yong-Tak Lee, Joo-Hyuk Chung, Ho-kyu Kang, Kwang-Pyuk Suh
المصدر: Digest. International Electron Devices Meeting, Electron devices meeting Electron Devices Meeting, 2002. IEDM '02. International. :591-594 2002
Relation: IEEE International Electron Devices Meeting
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8مؤتمر
المؤلفون: Hyung-Seok Jung, Yun-Seok Kim, Jong Pyo Kim, Jung Hyoung Lee, Jong-Ho Lee, Nae-In Lee, Ho-Kyu Kang, Kwang-Pyuk Suh, Hyuk Ju Ryu, Chang-Bong Oh, Young-Wug Kim, Kyung-Hwan Cho, Hion-Suck Baik, Young Su Chung, Hyo Sik Chang, Dae Won Moon
المصدر: Digest. International Electron Devices Meeting, Electron devices meeting Electron Devices Meeting, 2002. IEDM '02. International. :853-856 2002
Relation: IEEE International Electron Devices Meeting
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9مؤتمر
المؤلفون: Seung Woo Lee, Sang Jung Jeon, Jong Chun Park, Jong Hyon Ahn, Young Wug Kim, Kwang Pyuk Suh
المصدر: ICVC '99. 6th International Conference on VLSI and CAD (Cat. No.99EX361) VLSI and CAD VLSI and CAD, 1999. ICVC '99. 6th International Conference on. :136-139 1999
Relation: ICVC'99. 6th International Conference on VLSI and CAD
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10مؤتمر
المؤلفون: Jeong-Hwan Yang, Dae-Rim Kang, Seong-Ho Kwak, Su-Cheol Lee, Young-Wug Kim, Kwang Pyuk Suh
المصدر: ICVC '99. 6th International Conference on VLSI and CAD (Cat. No.99EX361) VLSI and CAD VLSI and CAD, 1999. ICVC '99. 6th International Conference on. :253-256 1999
Relation: ICVC'99. 6th International Conference on VLSI and CAD