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1دورية أكاديمية
المؤلفون: Jongseo Park, Kyeong-Keun Choi, Jehyun An, Bohyeon Kang, Hyeonseo You, Giryun Hong, Sung-Min Ahn, Rock-Hyun Baek
المصدر: IEEE Access, Vol 11, Pp 60660-60667 (2023)
مصطلحات موضوعية: Plasma-enhanced atomic layer deposition, forming gas annealing, CMOS image sensor, surface passivation, SiO₂, HfO₂, Electrical engineering. Electronics. Nuclear engineering, TK1-9971
وصف الملف: electronic resource
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2دورية أكاديمية
المؤلفون: Honggyun Kim, Vijay D. Chavan, Jamal Aziz, Byoungsu Ko, Jae-Sung Lee, Junsuk Rho, Tukaram D. Dongale, Kyeong-Keun Choi, Deok-Kee Kim
المصدر: IEEE Access, Vol 10, Pp 68724-68730 (2022)
مصطلحات موضوعية: Atomic layer deposition, carrier lifetime, CMOS image sensor, surface passivation, forming gas, HfO₂, Electrical engineering. Electronics. Nuclear engineering, TK1-9971
وصف الملف: electronic resource
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3دورية أكاديمية
المؤلفون: Ruhan E. Ustad, Vijay D. Chavan, Honggyun Kim, Min-ho Shin, Sung-Kyu Kim, Kyeong-Keun Choi, Deok-kee Kim
المصدر: Nanomaterials, Vol 13, Iss 19, p 2642 (2023)
مصطلحات موضوعية: polyimide, photosensitive, Cu RDL, resistivity, advanced packaging, Chemistry, QD1-999
وصف الملف: electronic resource
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4دورية أكاديمية
المؤلفون: Muhammad Hussain, Woonyoung Jeong, Il-Suk Kang, Kyeong-Keun Choi, Syed Hassan Abbas Jaffery, Asif Ali, Tassawar Hussain, Muhammad Ayaz, Sajjad Hussain, Jongwan Jung
المصدر: Sensors, Vol 21, Iss 4, p 1042 (2021)
مصطلحات موضوعية: hydron sensor, high temperature, Schottky diode, tantalum oxide, silicon carbide, Chemical technology, TP1-1185
وصف الملف: electronic resource
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5مؤتمر
المؤلفون: Won-Chong Baek, Zhou, J.P., Im, J., Ho, P.S., Jeong Gun Lee, Sung Bo Hwang, Kyeong-Keun Choi, Shang Kyun Park, Oh-Jin Jung, Smith, L., Pfeifer, K.
المصدر: 2006 IEEE International Reliability Physics Symposium Proceedings Reliability Physics Symposium Proceedings, 2006. 44th Annual., IEEE International. :131-135 Mar, 2006
Relation: 2006 IEEE International Reliability Physics Symposium Proceedings
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6دورية أكاديمية
المؤلفون: Youn-Jang Kim, Kyeong-Keun Choi, Ohyun Kim
المصدر: IEEE Electron Device Letters IEEE Electron Device Lett. Electron Device Letters, IEEE. 23(8):479-481 Aug, 2002
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7
المؤلفون: Sajal Chakraborty, Kyeong-Keun Choi, Sung Il Ahn
المصدر: Journal of Manufacturing Processes. 84:531-538
مصطلحات موضوعية: Strategy and Management, Management Science and Operations Research, Industrial and Manufacturing Engineering
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8
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9
المؤلفون: Vijay D. Chavan, Honggyun Kim, Jamal Aziz, Kyeong-Keun Choi, Deok-kee Kim
المصدر: Materials Science in Semiconductor Processing. 161:107451
مصطلحات موضوعية: Mechanics of Materials, Mechanical Engineering, General Materials Science, Condensed Matter Physics
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10
المؤلفون: Bohyeon Kang, Rock-Hyun Baek, Kyeong-Keun Choi, Jehyun An
المصدر: Journal of Nanoscience and Nanotechnology. 21:4394-4399
مصطلحات موضوعية: Anatase, Materials science, Silicon, Band gap, Gate dielectric, Biomedical Engineering, Analytical chemistry, chemistry.chemical_element, Bioengineering, General Chemistry, Dielectric, Condensed Matter Physics, chemistry.chemical_compound, chemistry, Silicide, Band diagram, General Materials Science, High-κ dielectric
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::e6fdb75eb77b0a51993207f12978671f
https://doi.org/10.1166/jnn.2021.19420