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1دورية أكاديمية
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2دورية أكاديمية
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المؤلفون: Jacques Gierak, Ralf Jede, Lothar Bischoff, Paul Mazarov, L. Bruchhaus
المصدر: Journal of Vacuum Science & Technology B 36(2018)6, 06J101-1-06J101-6
مصطلحات موضوعية: 010302 applied physics, Liquid Metal Ion Source, Liquid metal, Materials science, Process Chemistry and Technology, Polyatomic ion, nongallium, Nanotechnology, 02 engineering and technology, nanoscience, 021001 nanoscience & nanotechnology, 01 natural sciences, Focused ion beam, Surfaces, Coatings and Films, Electronic, Optical and Magnetic Materials, Ion, Nanolithography, Physics::Plasma Physics, 0103 physical sciences, Materials Chemistry, Electrical and Electronic Engineering, 0210 nano-technology, Instrumentation, Metal clusters
وصف الملف: application/pdf
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4دورية أكاديمية
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5دورية أكاديمية
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المؤلفون: D. Lucot, Christian Ulysse, E. Bourhis, Juan Pelta, A. Morin, Ralf Jede, Abdelkarim Ouerghi, Loïc Auvray, Gilles Patriarche, L. Bruchhaus, Ali Madouri, Jacques Gierak
المصدر: Microelectronic Engineering. 97:311-316
مصطلحات موضوعية: Materials science, Carving, Ion beam, Graphene, chemistry.chemical_element, Nanotechnology, Substrate (electronics), Condensed Matter Physics, Engraving, Dna translocation, Atomic and Molecular Physics, and Optics, Surfaces, Coatings and Films, Electronic, Optical and Magnetic Materials, law.invention, Nanopore, chemistry, law, visual_art, visual_art.visual_art_medium, Electrical and Electronic Engineering, Gallium
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المؤلفون: Maxime G. Lemaitre, Ralf Jede, Joel Fridmann, Ryo Mimura, Jason E. Sanabia, S. Bauerdick, Brent P. Gila, Bill R. Appleton, Sefaattin Tongay, Paul Mazarov, L. Bruchhaus
المصدر: Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms. 272:153-157
مصطلحات موضوعية: Nuclear and High Energy Physics, Materials science, Ion beam, Ion beam mixing, X-ray lithography, Nanotechnology, Stencil lithography, Ion beam lithography, Instrumentation, Focused ion beam, Next-generation lithography, Maskless lithography
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المؤلفون: Christian Ulysse, Gilles Patriarche, Jacques Gierak, Ali Madouri, Ralf Jede, B. Schiedt, D. Lucot, E. Bourhis, Loïc Auvray, L. Bruchhaus, Xavier Lafosse
المصدر: Microscopy Today. 17:14-17
مصطلحات موضوعية: Materials science, General Computer Science, Nanotechnology, Instrumentation, Nanoscopic scale, Focused ion beam
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::a0938c66279e432700ba09eec3e95af7
https://doi.org/10.1017/s1551929509000479 -
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المؤلفون: Jacques Gierak, Anne-Laure Biance, Ali Madouri, S. Bauerdick, Gilles Patriarche, E. Bourhis, B. Schiedt, Giancarlo Faini, Loïc Auvray, Ralf Jede, L. Bruchhaus
المصدر: Ultramicroscopy. 109:457-462
مصطلحات موضوعية: Computer science, Nanotechnology, Instrumentation, Focused ion beam, Atomic and Molecular Physics, and Optics, Electronic, Optical and Magnetic Materials
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المؤلفون: Ralf Jede, Jaume Esteve, L. Bruchhaus, Francesc Pérez-Murano, Cristina Martin, Maria Villarroya, Nuria Barniol, E. Bourhis, Jacques Gierak
المصدر: Microelectronic Engineering. 84:1215-1218
مصطلحات موضوعية: Microelectromechanical systems, Nanoelectromechanical systems, Fabrication, Materials science, Silicon, chemistry.chemical_element, Nanotechnology, Condensed Matter Physics, Focused ion beam, Atomic and Molecular Physics, and Optics, Surfaces, Coatings and Films, Electronic, Optical and Magnetic Materials, Nanolithography, chemistry, Electrical and Electronic Engineering, Reactive-ion etching, Lithography