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المؤلفون: E Voelkl, L F Allard, J Bruley, V J Keast, D B Williams
المصدر: Electron Microscopy and Analysis 1997 ISBN: 9781003063056
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::eeaaf015fcdafe4e800e5c4eb73c2063
https://doi.org/10.1201/9781003063056-10 -
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المؤلفون: Andy Drews, Munish K. Sharma, R.J. Kudla, H.-W. Jen, Obiefune K. Ezekoye, Robert Walter Mccabe, L. F. Allard, Jane Y. Howe, George W. Graham, Xiaoqing Pan
المصدر: Journal of Catalysis. 280:125-136
مصطلحات موضوعية: Chemistry, Nanotechnology, Heterogeneous catalysis, Catalysis, law.invention, Chemical engineering, law, Transmission electron microscopy, Scanning transmission electron microscopy, Calcination, Thermal stability, Particle size, Physical and Theoretical Chemistry, Bimetallic strip
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3
المؤلفون: J. Howe, L. F. Allard, K. Jagannadham
المصدر: Applied Physics A. 98:285-292
مصطلحات موضوعية: Materials science, business.industry, Vapor pressure, Analytical chemistry, General Chemistry, Nanocrystalline material, Nanopore, Quantum dot, Physical vapor deposition, Optoelectronics, Deposition (phase transition), General Materials Science, Nanodot, Crystallite, business
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المؤلفون: Tejas G. Murthy, Yang Guo, L. F. Allard, Travis L. Brown, James B. Mann, Srinivasan Chandrasekar, Christopher Saldana, Alexander H. King, Kevin P. Trumble, W. Dale Compton
المصدر: Acta Materialia. 57:5491-5500
مصطلحات موضوعية: Materials science, Polymers and Plastics, Metallurgy, Metals and Alloys, Portevin–Le Chatelier effect, Diffusion creep, Strain rate, Microstructure, Electronic, Optical and Magnetic Materials, Deformation mechanism, Ceramics and Composites, Dynamic recrystallization, Composite material, Deformation (engineering), Severe plastic deformation
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المؤلفون: Edgar Lara-Curzio, E. A. Payzant, Waltraud M. Kriven, M. Radovic, L. Fegely, L. F. Allard, Nina Orlovskaya, J. Lloyd, Scott A. Speakman
المصدر: Journal of Power Sources. 184:77-83
مصطلحات موضوعية: Renewable Energy, Sustainability and the Environment, Reducing atmosphere, Oxide, Energy Engineering and Power Technology, Mineralogy, Atmospheric temperature range, Thermal expansion, chemistry.chemical_compound, Chemical engineering, chemistry, Phase (matter), Thermal, Thermomechanical analysis, Electrical and Electronic Engineering, Physical and Theoretical Chemistry, Perovskite (structure)
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المؤلفون: L. F. Allard, David W. McComb, Douglas A. Blom, J M Perkins
المصدر: Microscopy Today. 16:46-49
مصطلحات موضوعية: Materials science, General Computer Science, Atomic resolution, Microscopy, Remote sensing
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::7039216a72f6c4c776bd4b5743330892
https://doi.org/10.1017/s1551929500059277 -
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المؤلفون: Edgar Lara-Curzio, Stephen D. Smith, L. F. Allard, Laura Riester, Shreyes N. Melkote, Thomas R. Watkins
المصدر: Materials Science and Engineering: A. 459:337-346
مصطلحات موضوعية: Materials science, Mechanical Engineering, Superfinishing, Condensed Matter Physics, Surface conditions, Grinding, Mechanics of Materials, Residual stress, Metallography, Forensic engineering, General Materials Science, Composite material, Surface integrity, White layer
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المؤلفون: L. M. He, Y. -F. Su, W. Y. Lee, L. F. Allard, M. J. Lance
المصدر: Metallurgical and Materials Transactions A. 35:1113-1124
مصطلحات موضوعية: Mechanics of Materials, Metals and Alloys, Condensed Matter Physics
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المؤلفون: Y. -F. Su, W. Y. Lee, L. F. Allard, D. W. Coffey
المصدر: Metallurgical and Materials Transactions A. 35:1055-1065
مصطلحات موضوعية: Mechanics of Materials, Metals and Alloys, Condensed Matter Physics
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المؤلفون: Bruce C. Gates, Ghansham Panjabi, L. F. Allard, S. N. Salvi
المصدر: Nano Letters. 2:381-384
مصطلحات موضوعية: Materials science, Extended X-ray absorption fine structure, Mechanical Engineering, Dispersity, Decarbonylation, chemistry.chemical_element, Mineralogy, Bioengineering, General Chemistry, Condensed Matter Physics, Nanoclusters, Crystallography, chemistry, Transmission electron microscopy, Yield (chemistry), General Materials Science, Osmium, High-resolution transmission electron microscopy