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المؤلفون: L. Morancho, P. Canet, R. Bouchakour, F. Lalande, F. Jeuland, Jérémy Postel-Pellerin
المصدر: Microelectronics Reliability. 49:1060-1063
مصطلحات موضوعية: Arrhenius equation, Physics, Charge loss, Charge (physics), T-model, Variation (game tree), Condensed Matter Physics, Atomic and Molecular Physics, and Optics, Displacement (vector), Surfaces, Coatings and Films, Electronic, Optical and Magnetic Materials, Computational physics, Flash (photography), symbols.namesake, symbols, Electronic engineering, Electrical and Electronic Engineering, Data retention, Safety, Risk, Reliability and Quality
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2دورية أكاديمية
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