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1
المؤلفون: Scott M. Johnson, R. N. Jacobs, Jeffrey M. Peterson, L. O. Bubulac, J. M. Arias, D. D. Lofgreen, J. W. Bangs, Andrew J. Stoltz, L. A. Almeida, M. Reddy, J. D. Benson, A. Wang
المصدر: Journal of Electronic Materials. 48:6194-6202
مصطلحات موضوعية: 010302 applied physics, Materials science, Analytical chemistry, Oxide, Polishing, 02 engineering and technology, Substrate (electronics), 021001 nanoscience & nanotechnology, Condensed Matter Physics, 01 natural sciences, Electronic, Optical and Magnetic Materials, chemistry.chemical_compound, chemistry, Impurity, Desorption, 0103 physical sciences, Materials Chemistry, Wafer, Electrical and Electronic Engineering, 0210 nano-technology, Deposition (law), Molecular beam epitaxy
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2
المؤلفون: Andrew J. Stoltz, A. Yulius, L. A. Almeida, L. O. Bubulac, Jeffrey M. Peterson, Scott M. Johnson, M. Carmody, M. Jaime-Vasquez, P. J. Smith, A. Wang, J. D. Benson, M. Reddy, R. N. Jacobs, D. D. Lofgreen, J. M. Arias, J. W. Bangs, Priyalal Wijewarnasuriya
المصدر: Journal of Electronic Materials. 47:5671-5679
مصطلحات موضوعية: 010302 applied physics, Materials science, Solid-state physics, Analytical chemistry, Hot spot (veterinary medicine), 02 engineering and technology, Substrate (electronics), 021001 nanoscience & nanotechnology, Condensed Matter Physics, 01 natural sciences, Focused ion beam, Electronic, Optical and Magnetic Materials, Impurity, 0103 physical sciences, Scanning transmission electron microscopy, Materials Chemistry, Electrical and Electronic Engineering, 0210 nano-technology, Molecular beam epitaxy
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3
المؤلفون: D. D. Lofgreen, Priyalal Wijewarnasuriya, Scott M. Johnson, J. K. Markunas, R. N. Jacobs, Kelly A. Jones, J. Arias, Jeffrey M. Peterson, L. A. Almeida, M. Reddy, P. J. Smith, L. O. Bubulac, Andrew J. Stoltz, M. Jaime-Vasquez, J. D. Benson
المصدر: Journal of Electronic Materials. 46:5418-5423
مصطلحات موضوعية: 010302 applied physics, Auger electron spectroscopy, Materials science, business.industry, Infrared, Scanning electron microscope, Energy-dispersive X-ray spectroscopy, 02 engineering and technology, Substrate (electronics), 021001 nanoscience & nanotechnology, Condensed Matter Physics, 01 natural sciences, Electronic, Optical and Magnetic Materials, Optics, 0103 physical sciences, Materials Chemistry, Optoelectronics, Wafer, Electrical and Electronic Engineering, 0210 nano-technology, business, Molecular beam epitaxy, Dark current
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4
المؤلفون: R. N. Jacobs, Priyalal Wijewarnasuriya, C. M. Lennon, J. K. Markunas, Andrew J. Stoltz, L. O. Bubulac, J. M. Arias, Jeffrey M. Peterson, Kelly A. Jones, D. D. Lofgreen, M. Reddy, M. Jaime-Vasquez, J. D. Benson, P. J. Smith, L. A. Almeida, Scott M. Johnson
المصدر: Journal of Electronic Materials. 45:4502-4510
مصطلحات موضوعية: 010302 applied physics, Materials science, Solid-state physics, Analytical chemistry, Polishing, 02 engineering and technology, 021001 nanoscience & nanotechnology, Condensed Matter Physics, 01 natural sciences, Electronic, Optical and Magnetic Materials, Impurity, 0103 physical sciences, Materials Chemistry, Wafer, Electrical and Electronic Engineering, 0210 nano-technology, Molecular beam epitaxy
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5
المؤلفون: A. Yulius, C. M. Lennon, L. A. Almeida, Priyalal Wijewarnasuriya, R. N. Jacobs, Jeffrey M. Peterson, M. Jaime-Vasquez, R. Hirsch, Andrew J. Stoltz, S. Motakef, M. Reddy, J. D. Benson, M. F. Vilela, P. J. Smith, M. Carmody, J. K. Markunas, L. O. Bubulac, J. M. Arias, D. D. Lofgreen, J. Fiala, Scott M. Johnson
المصدر: Journal of Electronic Materials. 44:3082-3091
مصطلحات موضوعية: Materials science, Analytical chemistry, Polishing, chemistry.chemical_element, Substrate (electronics), Contamination, Condensed Matter Physics, Electronic, Optical and Magnetic Materials, Crystallography, chemistry, Impurity, Materials Chemistry, Wafer, Electrical and Electronic Engineering, Inclusion (mineral), Tellurium, Molecular beam epitaxy
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6
المؤلفون: Priyalal Wijewarnasuriya, Jeffrey M. Peterson, D. D. Lofgreen, L. A. Almeida, Daeyeon Lee, G. Bostrup, R. N. Jacobs, Y. Chen, Andrew J. Stoltz, Scott M. Johnson, L. O. Bubulac, M. Jaime-Vasquez, M. Carmody, M. Reddy, J. D. Benson, A. Yulius, G. Brill, M. F. Vilela, J. K. Markunas, S. Couture, P. J. Smith
المصدر: Journal of Electronic Materials. 43:3993-3998
مصطلحات موضوعية: Materials science, Solid-state physics, Analytical chemistry, chemistry.chemical_element, Condensed Matter Physics, Dark field microscopy, Electronic, Optical and Magnetic Materials, Crystallography, chemistry, Materials Chemistry, Wafer, Undercut, Electrical and Electronic Engineering, Tellurium, Deposition (law), Molecular beam epitaxy
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7
المؤلفون: M. F. Vilela, David R. Rhiger, Jeffrey M. Peterson, L. O. Bubulac, Y. Chen, J. A. Arias, M. Jaime-Vasquez, P. J. Smith, C. M. Lennon, J. W. Bangs, R. N. Jacobs, J. D. Benson, E. A. Patten, Scott M. Johnson, J. K. Markunas, G. Brill, Priyalal Wijewarnasuriya, L. A. Almeida, D. D. Lofgreen, Andrew J. Stoltz
المصدر: Journal of Electronic Materials. 42:3217-3223
مصطلحات موضوعية: Materials science, Annealing (metallurgy), business.industry, chemistry.chemical_element, Condensed Matter Physics, Cadmium telluride photovoltaics, Electronic, Optical and Magnetic Materials, Crystallography, Etch pit density, chemistry, Impurity, Getter, Scanning transmission electron microscopy, Materials Chemistry, Optoelectronics, Electrical and Electronic Engineering, business, Indium, Molecular beam epitaxy
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8
المؤلفون: M. Jaime-Vasquez, W. F. Zhao, David J. Smith, L. O. Bubulac, R. N. Jacobs
المصدر: Journal of Electronic Materials. 40:1733-1737
مصطلحات موضوعية: Materials science, Stacking, Analytical chemistry, Heterojunction, Condensed Matter Physics, Microstructure, Microanalysis, Cadmium telluride photovoltaics, Electronic, Optical and Magnetic Materials, Crystallography, Lattice constant, Transmission electron microscopy, Materials Chemistry, Electrical and Electronic Engineering, Molecular beam epitaxy
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9
المؤلفون: M. Jaime-Vasquez, J. D. Benson, R. N. Jacobs, Jeffrey M. Peterson, U. Lee, Andrew J. Stoltz, L. A. Almeida, S. Farrell, Y. Chen, L. O. Bubulac, Scott M. Johnson, M. F. Vilela, D. D. Lofgreen, P. J. Smith, E. A. Patten, P. M. Goetz, Priyalal Wijewarnasuriya, G. Brill, J. K. Markunas, David R. Rhiger
المصدر: Journal of Electronic Materials. 40:1847-1853
مصطلحات موضوعية: Materials science, Solid-state physics, Condensed matter physics, Annealing (metallurgy), Activation energy, Condensed Matter Physics, Epitaxy, Cadmium telluride photovoltaics, Electronic, Optical and Magnetic Materials, Condensed Matter::Materials Science, Crystallography, Etch pit density, Thermal, Materials Chemistry, Electrical and Electronic Engineering, Molecular beam epitaxy
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10
المؤلفون: R. Hellmer, T. D. Golding, Jeffrey M. Peterson, M. Jaime-Vasquez, David R. Rhiger, M. Carmody, J. D. Benson, John H. Dinan, Priyalal Wijewarnasuriya, M. F. Vilela, D.F. Lofgreen, L. A. Almeida, Andrew J. Stoltz, L. O. Bubulac, Scott M. Johnson, M.F. Lee, R. N. Jacobs, A. Wang, Li Wang
المصدر: Journal of Electronic Materials. 40:280-288
مصطلحات موضوعية: Materials science, Pixel, Solid-state physics, business.industry, Infrared, Detector, Condensed Matter Physics, Mass spectrometry, Cadmium telluride photovoltaics, Electronic, Optical and Magnetic Materials, Optics, Materials Chemistry, Optoelectronics, Electrical and Electronic Engineering, Dislocation, business, Layer (electronics)