المؤلفون: Bautista, A., Ibort, A., Lafuente, J., Low, R.

المصدر: Journal of Mathematical Physics, 58, 022503 (2017)

مصطلحات موضوعية: General Relativity and Quantum Cosmology, Mathematical Physics

URL الوصول: http://arxiv.org/abs/2207.01273

المؤلفون: Lee, T. Y., Yamane, K., Hau, L. Y., Chao, R., Chung, N. L., Naik, V. B., Sivabalan, K., Kwon, J., Lim, J. H., Neo, W. P., Khua, K., Thiyagarajah, N., Jang, S. H., Behin-Aein, B., Toh, E. H., Otani, Y., Zeng, D., Balasankaran, N., Goh, L. C., Ling, T., Hwang, J., Zhang, L., Low, R., Tan, S. L, Seet, C. S., Ting, J. W., Ong, S., You, Y. S., Woo, S. T., Quek, E., Siah, S. Y.

المصدر: 2020 IEEE International Reliability Physics Symposium (IRPS) Reliability Physics Symposium (IRPS), 2020 IEEE International. :1-4 Apr, 2020

Relation: 2020 IEEE International Reliability Physics Symposium (IRPS)

المؤلفون: Low, R., Cheah, L., You, L.

المصدر: IEEE Transactions on Intelligent Transportation Systems IEEE Trans. Intell. Transport. Syst. Intelligent Transportation Systems, IEEE Transactions on. 22(3):1401-1410 Mar, 2021

المؤلفون: Urano, S., Low, R. S., Faris, M., Ishiguro, M., Nagase, I., Baratov, A., Asubar, J. T., Motoyama, T., Nakamura, Y., Yatabe, Z., Kuzuhara, M.

المصدر: 2021 IEEE International Meeting for Future Electron Devices, Kansai (IMFEDK) Future of Electron Devices, Kansai (IMFEDK), 2021 IEEE International Meeting for. :1-2 Nov, 2021

Relation: 2021 IEEE International Meeting for Future of Electron Devices, Kansai (IMFEDK)

المؤلفون: Ishiguro, M., Urano, S., Low, R. S., Faris, M., Nagase, I., Baratov, A., Asubar, J. T., Motoyama, T., Nakamura, Y., Yatabe, Z., Kuzuhara, M.

المصدر: 2021 IEEE International Meeting for Future Electron Devices, Kansai (IMFEDK) Future of Electron Devices, Kansai (IMFEDK), 2021 IEEE International Meeting for. :1-2 Nov, 2021

Relation: 2021 IEEE International Meeting for Future of Electron Devices, Kansai (IMFEDK)

المؤلفون: Mugebe, P., Kizil, M.S., Yahyaei, M., Low, R.

المصدر: In Resources Policy August 2023 85 Part A

المؤلفون: Lee, T. Y., Yamane, K., Kwon, J., Naik, V. B., Otani, Y., Zeng, D., Lim, J. H., Sivabalan, K., Chiang, C., Huang, Y., Jang, S. H., Hau, L. Y., Chao, R., Chung, N. L., Neo, W. P., Khua, K., Thiyagarajah, N., Ling, T., Goh, L. C., Hwang, J., Zhang, L., Low, R., Balasankaran, N., Tan, F., Wong, J., Seet, C. S., Ting, J. W., Ong, S., You, Y. S., Woo, S. T., Siah, S. Y.

المصدر: 2020 IEEE Symposium on VLSI Technology VLSI Technology, 2020 IEEE Symposium on. :1-2 Jun, 2020

Relation: 2020 IEEE Symposium on VLSI Technology

المؤلفون: Naik, V.B., Yamane, K., Lim, J.H., Lee, T.Y., Kwon, J., Aein, B., Chung, N.L., Hau, L.Y., Chao, R., Zeng, D., Otani, Y., Chiang, C., Huang, Y., Pu, L., Thiyagarajah, N., Jang, S.H., Neo, W.P., Dixit, H., Aris, S.K., Goh, L.C., Ling, T., Hwang, J., Ting, J.W., Zhang, L., Low, R., Balasankaran, N., Seet, C.S., Ong, S., Wong, J., You, Y.S., Woo, S.T., Siah, S.Y.

المصدر: 2020 IEEE Symposium on VLSI Technology VLSI Technology, 2020 IEEE Symposium on. :1-2 Jun, 2020

Relation: 2020 IEEE Symposium on VLSI Technology

المؤلفون: Low, R. S., Kawabata, S., Asubar, J. T., Tokuda, H., Kuzuhara, M.

المصدر: 2019 IEEE International Meeting for Future of Electron Devices, Kansai (IMFEDK) Electron Devices, Kansai (IMFEDK), 2019 IEEE International Meeting for Future of. :77-78 Nov, 2019

Relation: 2019 IEEE International Meeting for Future of Electron Devices, Kansai (IMFEDK)

المؤلفون: Naik, V. B., Yamane, K., Lee, T.Y., Kwon, J., Chao, R., Lim, J.H., Chung, N.L., Behin-Aein, B., Hau, L.Y., Zeng, D., Otani, Y., Chiang, C., Huang, Y., Pu, L., Jang, S.H., Neo, W.P., Dixit, H., Goh, S. K L. C., Toh, E. H., Ling, T., Hwang, J., Ting, J.W., Low, R., Zhang, L., Lee, C.G., Balasankaran, N., Tan, F., Gan, K. W., Yoon, H., Congedo, G., Mueller, J., Pfefferling, B., Kallensee, O., Vogel, A., Kriegerstein, V., Merbeth, T., Seet, C.S., Ong, S., Xu, J., Wong, J., You, Y.S., Woo, S.T., Chan, T.H., Quek, E., Siah, S. Y.

المصدر: 2020 IEEE International Electron Devices Meeting (IEDM) Electron Devices Meeting (IEDM), 2020 IEEE International. :11.3.1-11.3.4 Dec, 2020

Relation: 2020 IEEE International Electron Devices Meeting (IEDM)