المؤلفون: Wen-Jie Qi, Nieh, R., Onishi, R., Byoung Hun Lee, Laegu Kang, Yongjoo Jeon, Gopalan, S., Lee, J.C.

المصدر: 2000 IEEE International Reliability Physics Symposium Proceedings. 38th Annual (Cat. No.00CH37059) Reliability physics Reliability Physics Symposium, 2000. Proceedings. 38th Annual 2000 IEEE International. :72-76 2000

Relation: 2000 IEEE International Reliability Physics Symposium Proceedings. 38th Annual

المؤلفون: Byoung Hun Lee, Laegu Kang, Wen-Jie Qi, Renee Nieh, Yongjoo Jeon, Katsunori Onishi, Lee, J.C.

المصدر: International Electron Devices Meeting 1999. Technical Digest (Cat. No.99CH36318) Electron devices Electron Devices Meeting, 1999. IEDM '99. Technical Digest. International. :133-136 1999

Relation: International Electron Devices Meeting 1999. Technical Digest

المؤلفون: Wen-Jie Qi, Renee Nieh, Byoung Hun Lee, Laegu Kang, Yongjoo Jeon, Onishi, K., Ngai, T., Banerjee, S., Lee, J.C.

المصدر: International Electron Devices Meeting 1999. Technical Digest (Cat. No.99CH36318) Electron devices Electron Devices Meeting, 1999. IEDM '99. Technical Digest. International. :145-148 1999

Relation: International Electron Devices Meeting 1999. Technical Digest

المؤلفون: Laegu Kang, Byoung Hun Lee, Wen-Jie Qi, Yongjoo Jeon, Nieh, R., Gopalan, S., Onishi, K., Lee, J.C.

المصدر: IEEE Electron Device Letters IEEE Electron Device Lett. Electron Device Letters, IEEE. 21(4):181-183 Apr, 2000

المؤلفون: Jianan Yang, Byoung Min, Yasuhito, S., Laegu Kang, Walker, P., Mendicino, M., Yeap, G., Foisy, M., Cox, K., Cartwright, J., Venkatesan, S.

المصدر: 2003 IEEE International Conference on SOI SOI conference SOI Conference, 2003. IEEE International. :41-42 2003

Relation: 2003 IEEE International SOI Conference. Proceedings

المؤلفون: Seung-Chul Song, Filipiak, S., Perera, A., Turner, M., Huang, F., Anderson, S.G.H., Laegu Kang, Byoung Min, Menke, D., Tukunang, S., Venkatesan, S.

المصدر: 2002 Symposium on VLSI Technology. Digest of Technical Papers (Cat. No.01CH37303) VLSI technology VLSI Technology, 2002. Digest of Technical Papers. 2002 Symposium on. :72-73 2002

Relation: 2002 Symposium on VLSI Technology Digest of Technical Papers

المؤلفون: Wen-Jie Qi, Nieh, R., Byoung Hun Lee, Onishi, K., Laegu Kang, Yongjoo Jeon, Lee, J.C., Kaushik, V., Bich-Yen Neuyen, Prabhu, L., Eisenbeiser, K., Finder, J.

المصدر: 2000 Symposium on VLSI Technology. Digest of Technical Papers (Cat. No.00CH37104) VLSI technology VLSI Technology, 2000. Digest of Technical Papers. 2000 Symposium on. :40-41 2000

Relation: 2000 Symposium on VLSI Technology. Digest of Technical Papers

المؤلفون: Christoph Schwan, Andreas Huschka, Edward J. Nowak, Laegu Kang, Rick Carter, David L. Harame, Mckay Thomas G, R. Taylor, Thomas Feudel, Kok Wai Johnny Chew, Jon Kluth, Josef S. Watts, Thorsten Kammler, Juergen Faul

المصدر: ECS Transactions. 75:21-27

مصطلحات موضوعية: Engineering, business.industry, Electrical engineering, business, Power (physics)

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::1fc661d06a387fa0dd44e0df2a208435
https://doi.org/10.1149/07508.0021ecst

المؤلفون: Scott Luning, Jon Kluth, Girish Bohra, Xiaobo Chen, Suraj K. Patil, Sherry Straub, Mitsuhiro Togo, Dina H. Triyoso, Anil Kumar, Alex Chen, Ryan Sporer, Kasun Punchihewa, Bob Mulfinger, Rohit Pal, X. Zhang, Jeremy A. Wahl, Amy Child, Laegu Kang, Rick Carter

المصدر: ECS Transactions. 69:103-110

مصطلحات موضوعية: Engineering, CMOS, business.industry, Electrical engineering, Microelectronics, Node (circuits), business, Metal gate, Threshold voltage

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::9574743996ec5e2c320cb27e5003f17b
https://doi.org/10.1149/06905.0103ecst

المؤلفون: Arifuzzaman (Arif) Sheikh, J. Chen, Michael V. Aquilino, Mukesh Khare, James Chingwei Li, Weipeng Li, X. Chen, Laegu Kang, G. Massey, J. Sudijono, An L. Steegen, Vijay Narayanan, Jin-Ping Han, M. Zaleski, Rashmi Jha, Haoren Zhuang, M. Chowdhury, C. Reddy, Douglas D. Coolbaugh, Yi-Wei Lee, Michael P. Chudzik, Kenneth J. Stein, Zhenrong Jin, Shesh Mani Pandey, D. Tekleab, S. Samavedam, Christopher V. Baiocco, Haining Yang, Deleep R. Nair, JiYeon Ku, Chandrasekharan Kothandaraman, Craig S. Lage, Jaeger Daniel, R. Mo, C. Hobbs, S. Kalpat, Da Zhang, Naim Moumen, Nam-Sung Kim, S. Kirshnan, J. Wallner, X. Wang, R. Lindsay, Melanie J. Sherony, Aaron Thean, Young Way Teh

مصطلحات موضوعية: Materials science, business.industry, Transistor, Electrical engineering, law.invention, PMOS logic, CMOS, law, Low-power electronics, Logic gate, business, Metal gate, NMOS logic, Leakage (electronics)

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::ad4bb3545ca27a0a35b2cac57515af2c
https://doi.org/10.1109/vlsit.2008.4588573