المؤلفون: Yang, Hao-I, Chang, Ming-Hung, Lai, Ssu-Yun, Wang, Hsiang-Fei, Hwang, Wei

المصدر: 2007 International Symposium on VLSI Design, Automation and Test (VLSI-DAT) VLSI Design, Automation and Test, 2007. VLSI-DAT 2007. International Symposium on. :1-4 Apr, 2007

Relation: 2007 International Symposium on VLSI Design, Automation and Test