المؤلفون: Ewy, Erich, Langanke, Steve

المصدر: 2022 38th Semiconductor Thermal Measurement, Modeling & Management Symposium (SEMI-THERM) Semiconductor Thermal Measurement, Modeling & Management Symposium (SEMI-THERM), 2022. :67-75 Mar, 2022

Relation: 2022 38th Semiconductor Thermal Measurement, Modeling & Management Symposium (SEMI-THERM)