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1مؤتمر
المؤلفون: Ewy, Erich, Langanke, Steve
المصدر: 2022 38th Semiconductor Thermal Measurement, Modeling & Management Symposium (SEMI-THERM) Semiconductor Thermal Measurement, Modeling & Management Symposium (SEMI-THERM), 2022. :67-75 Mar, 2022
Relation: 2022 38th Semiconductor Thermal Measurement, Modeling & Management Symposium (SEMI-THERM)