المؤلفون: Lin, H., van der Plas, G., Sun, X., Velenis, D., Catthoor, F., Lauwereins, R., Beyne, E.

المصدر: IEEE Transactions on Very Large Scale Integration (VLSI) Systems IEEE Trans. VLSI Syst. Very Large Scale Integration (VLSI) Systems, IEEE Transactions on. 30(11):1748-1756 Nov, 2022

المؤلفون: Lin, H., Velenis, D., Nolmans, P., Sun, X., Catthoor, F., Lauwereins, R., Van der Plas, G., Beyne, E.

المصدر: IEEE Transactions on Very Large Scale Integration (VLSI) Systems IEEE Trans. VLSI Syst. Very Large Scale Integration (VLSI) Systems, IEEE Transactions on. 30(5):661-665 May, 2022

المؤلفون: Lin, H., Van der Plas, G., Sun, X., Velenis, D., Beyne, E., Lauwereins, R.

المصدر: IEEE Transactions on Components, Packaging and Manufacturing Technology IEEE Trans. Compon., Packag. Manufact. Technol. Components, Packaging and Manufacturing Technology, IEEE Transactions on. 12(3):401-409 Mar, 2022

المؤلفون: Doevenspeck, J., Degraeve, R., Fantini, A., Cosemans, S., Mallik, A., Debacker, P., Verkest, D., Lauwereins, R., Dehaene, W.

المصدر: IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 68(5):2301-2305 May, 2021

المؤلفون: Doevenspeck, J., Degraeve, R., Fantini, A., Debacker, P., Verkest, D., Lauwereins, R., Dehaene, W.

المصدر: 2019 IEEE International Reliability Physics Symposium (IRPS) Reliability Physics Symposium (IRPS), 2019 IEEE International. :1-6 Mar, 2019

Relation: 2019 IEEE International Reliability Physics Symposium (IRPS)

المؤلفون: Doevenspeck, J., Degraeve, R., Fantini, A., Debacker, P., Verkest, D., Lauwereins, R., Dehaene, W.

المصدر: IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 67(2):505-511 Feb, 2020

المؤلفون: Lin, H., Velenis, D., Nolmans, P., Sun, X., Catthoor, F., Lauwereins, R., Van der Plas, G., Beyne, E.

المصدر: 2021 Symposium on VLSI Technology VLSI Technology, 2021 Symposium on. :1-2 Jun, 2021

Relation: 2021 Symposium on VLSI Technology

المؤلفون: Doevenspeck, J., Garello, K., Rao, S., Yasin, F., Couet, S., Jayakumar, G., Mallik, A., Cosemans, S., Debacker, P., Verkest, D., Lauwereins, R., Dehaene, W., Kar, G.S.

المصدر: 2021 Symposium on VLSI Technology VLSI Technology, 2021 Symposium on. :1-2 Jun, 2021

Relation: 2021 Symposium on VLSI Technology

المؤلفون: Lin, H., Hiblot, G., Sun, X., Talmelli, G., Velenis, D., Bex, P., Adelmann, C., Lauwereins, R., Catthoor, F., Van der Plas, G., Beyne, E.

المصدر: 2021 Symposium on VLSI Technology VLSI Technology, 2021 Symposium on. :1-2 Jun, 2021

Relation: 2021 Symposium on VLSI Technology

المؤلفون: Zografos, O., De Meester, A., Testa, E., Soeken, M., Gaillardon, P.-E., De Micheli, G., Amaru, L., Raghavan, P., Catthoor, F., Lauwereins, R.

المصدر: Design, Automation & Test in Europe Conference & Exhibition (DATE), 2017. :1306-1311 Mar, 2017

Relation: 2017 Design, Automation & Test in Europe Conference & Exhibition (DATE)