المؤلفون: Tan, C.-L., Lavizzari, S., Blomme, P., Breuil, L., Vecchio, G., Sebaai, F., Paraschiv, V., Tao, Z., Schepers, B., Nyns, L., Peter, A., Dekkers, H., Ong, P., Tsvetanova, D., Devriendt, K., Teugels, L., Heylen, N., Raymaekers, T., Jossart, N., Mennella, P., Delhougne, R., V-Palayam, S.S., Arreghini, A., Van den bosch, G., Furnemont, A.

المصدر: 2017 IEEE International Memory Workshop (IMW) Memory Workshop (IMW), 2017 IEEE International. :1-4 May, 2017

Relation: 2017 IEEE International Memory Workshop (IMW)

المؤلفون: Florent, K., Lavizzari, S., Di Piazza, L., Popovici, M., Duan, J., Groeseneken, G., Van Houdt, J.

المصدر: IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 64(10):4091-4098 Oct, 2017

المؤلفون: Redaelli, A., Laurin, L., Lavizzari, S., Cupeta, C., Servalli, G., Benvenuti, A.

المصدر: 2014 44th European Solid State Device Research Conference (ESSDERC) Solid State Device Research Conference (ESSDERC), 2014 44th European. :238-241 Sep, 2014

Relation: ESSDERC 2014 - 44th European Solid State Device Research Conference

المؤلفون: Florent, K., Pesic, M., Subirats, A., Banerjee, K., Lavizzari, S., Arreghini, A., Di Piazza, L., Potoms, G., Sebaai, F., McMitchell, S. R. C., Popovici, M., Groeseneken, G., Van Houdt, J.

المصدر: 2018 IEEE International Electron Devices Meeting (IEDM) Electron Devices Meeting (IEDM), 2018 IEEE International. :2.5.1-2.5.4 Dec, 2018

Relation: 2018 IEEE International Electron Devices Meeting (IEDM)

المؤلفون: Florent, K., Lavizzari, S., Di Piazza, L., Popovici, M., Vecchio, E., Potoms, G., Groeseneken, G., Van IHoudt, J.

المصدر: 2017 Symposium on VLSI Technology VLSI Technology, 2017 Symposium on. :T158-T159 Jun, 2017

Relation: 2017 Symposium on VLSI Technology

المؤلفون: Florent, K., Subirats, A., Lavizzari, S., Degraeve, R., Celano, U., Kaczer, B., Di Piazza, L., Popovici, M., Groeseneken, G., Van Houdt, J.

المصدر: 2018 IEEE International Reliability Physics Symposium (IRPS) Reliability Physics Symposium (IRPS), 2018 IEEE International. :6D.3-1-6D.3-7 Mar, 2018

Relation: 2018 IEEE International Reliability Physics Symposium (IRPS)

المؤلفون: Lavizzari, S., Ielmini, D., Lacaita, A. L.

المصدر: IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 57(12):3257-3264 Dec, 2010

المؤلفون: Boniardi, M., Ielmini, D., Lavizzari, S., Lacaita, A. L., Redaelli, A., Pirovano, A.

المصدر: IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 57(10):2690-2696 Oct, 2010

المؤلفون: Lavizzari, S., Ielmini, D., Lacaita, A. L.

المصدر: IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 57(8):1838-1845 Aug, 2010

المؤلفون: Lavizzari, S., Sharma, D., Ielmini, D.

المصدر: IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 57(5):1047-1054 May, 2010