المؤلفون: Boschi, Gabriele, Luongo, Donato, Lazzarotti, Duccio, Shaheen, Hanna, Grigoryan, Hayk, Harutyunyan, Gurgen, Shoukourian, Samvel, Zorian, Yervant

المصدر: 2019 IEEE International Test Conference (ITC) Test Conference (ITC), 2019 IEEE International. :1-6 Nov, 2019

Relation: 2019 IEEE International Test Conference (ITC)