المؤلفون: Toulemonde, E.^{Aff1, IDs00262023034499_cor1}, Chevret, S., Battistella, M.^{Aff3, Aff16}, Neidhardt, E. M., Nardin, C., Le Du, F., Meyer, N., Véron, M., Gambotti, L., Lamrani-Ghaouti, A., Jamme, P., Chaffaut, C., De Pontville, M.^{Aff10, Aff16}, Saada-Bouzid, E., Beylot-Barry, M.^{Aff12, Aff16}, Simon, C., Jouary, T.^{Aff13, Aff16}, Marabelle, A., Mortier, L.^{Aff15, Aff16}

المصدر: Cancer Immunology, Immunotherapy. 72(8):2649-2657

المؤلفون: Epaillard, N., Lusque, A., Jacot, W., Mailliez, A., Bachelot, T., Arnedos, M., Le Du, F., Brain, E., Ferrero, J.M., Massard, V., Desmoulins, I., Mouret-Reynier, M.A., Levy, C., Gonçalves, A., Leheurteur, M., Petit, T., Filleron, T., Bosquet, L., Pistilli, B., Frenel, J.S.

المصدر: In ESMO Open May 2024 9(5)

المؤلفون: Balic, Marija, Heibl, Sonja, Zabernigg, August Felix, Egle, Daniel, Sandholzer, Margit, Roitner, Florian, Andel, Johannes, Pichler, Petra, Hager, Christopher, Knauer, Michael, Hubalek, Michael, Bighin, Claudia, De Laurentiis, Michelino, De Placido, Sabino, Puglisi, Fabio, Boni, Luca, de Gregorio, Amelie, Degenhardt, Tom, Formisano, Luigi, Beelen, Karin, Robinson, Timothy, Fitzpatrick, Amanda, Dieras, Veronique, Muller, Volkmar, Gennari, Alessandra, Linn, Sabine, Braga, Sofia, Cortes, Javier, Palmieri, Carlo, Gampenrieder, S.P., Dezentjé, V., Lambertini, M., de Nonneville, A., Marhold, M., Le Du, F., Cortés Salgado, A., Alpuim Costa, D., Vaz Batista, M., Chic Ruché, N., Tinchon, C., Petzer, A., Blondeaux, E., Del Mastro, L., Targato, G., Bertucci, F., Gonçalves, A., Viret, F., Bartsch, R., Mannsbart, C., Deleuze, A., Robert, L., Saavedra Serrano, C., Gion Cortés, M., Sampaio-Alves, M., Vitorino, M., Pecen, L., Singer, C., Harbeck, N., Rinnerthaler, G., Greil, R.

المصدر: In ESMO Open February 2023 8(1)

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المؤلفون: Hornung, V., Le Du, F., Starck, C., Gelly, G., Crusson, C., Laffitte, D., Vinchant, J.F., Lesterlin, D.

المصدر: Proceedings of the 7th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis Reliability of Electron Devices, Failure Physics and Analysis, 1996. Proceedings of the 7th European Symposium on. :1919-1922 1996

Relation: Proceedings of the 7th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis

المؤلفون: Gage, M.M., Mylander, W.C., Rosman, M., Fujii, T., Le Du, F., Raghavendra, A., Sinha, A.K., Espinosa Fernandez, J.R., James, A., Ueno, N.T. ^*, Tafra, L., Jackson, R.S. ^*

المصدر: In Annals of Oncology May 2018 29(5):1280-1285

المؤلفون: Hornung, V., Le Du, F., Starck, C., Gelly, G., Emery, J.Y., Chaumont, C., Bodere, A., Hache, C., Le Gouziegou, O., Derouin, E., Michaud, G., Matabon, M., Vinchant, J.F., Lesterlin, D.

المصدر: IEEE Photonics Technology Letters IEEE Photon. Technol. Lett. Photonics Technology Letters, IEEE. 8(9):1136-1138 Sep, 1996

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المؤلفون: Laakmann, E., Agostinetto, E., van Ramshorst, M., Schettini, F., Fontes e Sousa, M., Matos, L.V., Fitzpatrick, A.M., Batista, M. Vaz, Le Du, F., Riecke, K., Schmidt, M., Neunhöffer, T., Weide, R., Park-Simon, T-W., Denkert, C., Witzel, I., Rey, J., Loibl, S., Mueller, V.

المصدر: In ESMO Open May 2023 8(1) Supplement 4

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