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1
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2
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3دورية أكاديمية
المؤلفون: Lee, C.-S., Cheng, C.-T., Ke, J.-H., Hsu, W.-C.
المصدر: IEEE Journal of the Electron Devices Society IEEE J. Electron Devices Soc. Electron Devices Society, IEEE Journal of the. 11:256-261 2023
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4تقرير
المؤلفون: de Franca, F. O., Virgolin, M., Kommenda, M., Majumder, M. S., Cranmer, M., Espada, G., Ingelse, L., Fonseca, A., Landajuela, M., Petersen, B., Glatt, R., Mundhenk, N., Lee, C. S., Hochhalter, J. D., Randall, D. L., Kamienny, P., Zhang, H., Dick, G., Simon, A., Burlacu, B., Kasak, Jaan, Machado, Meera, Wilstrup, Casper, La Cava, W. G.
URL الوصول: http://arxiv.org/abs/2304.01117
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5دورية أكاديمية
المؤلفون: Kim, I. K., Lee, C. S., Bae, J. H., Han, S. R., Alshalawi, W.Aff1, Aff3, Kim, B. C., Lee, I. K., Lee, D. S., Lee, Y. S.Aff1, IDs1015102302895y_cor9
المصدر: Techniques in Coloproctology. 28(1)
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6
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7مؤتمر
المؤلفون: Das, Debasmit, Lee, C. S. George
المصدر: 2021 IEEE International Conference on Systems, Man, and Cybernetics (SMC) Systems, Man, and Cybernetics (SMC), 2021 IEEE International Conference on. :1849-1854 Oct, 2021
Relation: 2021 IEEE International Conference on Systems, Man, and Cybernetics (SMC)
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8
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9مؤتمر
المؤلفون: Lee, C-S., Vaitheeswaran, P., Subbarayan, G., Park, Y-J., Chung, J., Krishnan, S.
المصدر: 2020 IEEE International Reliability Physics Symposium (IRPS) Reliability Physics Symposium (IRPS), 2020 IEEE International. :1-6 Apr, 2020
Relation: 2020 IEEE International Reliability Physics Symposium (IRPS)
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10مؤتمر
المؤلفون: Lee, C. S., Tiong, A., Tang, W. L., Yap, K. H.
المصدر: 2019 IEEE International Conference on Industrial Engineering and Engineering Management (IEEM) Industrial Engineering and Engineering Management (IEEM), 2019 IEEE International Conference on. :576-580 Dec, 2019
Relation: 2019 IEEE International Conference on Industrial Engineering and Engineering Management (IEEM)