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1مؤتمر
المؤلفون: Nan, Siti Nurjatikesuma Che, Oung, Pey Fen, Lee, Chong Haw
المصدر: 2023 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) Physical and Failure Analysis of Integrated Circuits (IPFA), 2023 IEEE International Symposium on the. :1-5 Jul, 2023
Relation: 2023 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA)
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المؤلفون: Che Nan Siti Nurjatikesuma, Loo Huey Wen, Oung Pey Fen, Lee Chong Haw
المصدر: International Symposium for Testing and Failure Analysis.
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::9ab147c9156afaf0eba886da5faf213b
https://doi.org/10.31399/asm.cp.istfa2022p0343 -
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المؤلفون: Lee Chong Haw, Ng Yi Jie, Lau Kok Heng, Liew Chiun Ning, Goh Lay Lay, Loo Huey Wen
المصدر: 2018 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA).
مصطلحات موضوعية: Materials science, business.industry, Scan chain, Integrated circuit, Focused ion beam, law.invention, Wafer fabrication, law, Ball grid array, Microscopy, Miniaturization, Optoelectronics, business, Nanoprobing
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::f7bbe23ea047fe702369ac2ba3794eb6
https://doi.org/10.1109/ipfa.2018.8452562
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