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1مؤتمر
المؤلفون: Chen, Hsiang-Yu, Peng, Kuan-Ying, Lee, Kuen-Jong
المصدر: 2023 International VLSI Symposium on Technology, Systems and Applications (VLSI-TSA/VLSI-DAT) Technology, Systems and Applications (VLSI-TSA/VLSI-DAT), 2023 International VLSI Symposium on. :1-4 Apr, 2023
Relation: 2023 International VLSI Symposium on Technology, Systems and Applications (VLSI-TSA/VLSI-DAT)
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2مؤتمر
المؤلفون: Yeh, Shih-Chun, Lee, Kuen-Jong, Chen, Dong-Yi
المصدر: 2022 IEEE 31st Asian Test Symposium (ATS) ATS Test Symposium (ATS), 2022 IEEE 31st Asian. :25-30 Nov, 2022
Relation: 2022 IEEE 31st Asian Test Symposium (ATS)
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3مؤتمر
المؤلفون: Chen, Yan-Fu, Kang, Duo-Yao, Lee, Kuen-Jong
المصدر: 2022 IEEE International Test Conference (ITC) ITC Test Conference (ITC), 2022 IEEE International. :82-91 Sep, 2022
Relation: 2022 IEEE International Test Conference (ITC)
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4مؤتمر
المؤلفون: Kang, Duo-Yao, Lin, Shiou-Ning, Lee, Kuen-Jong
المصدر: 2022 IEEE International Test Conference in Asia (ITC-Asia) ITC-ASIA Test Conference in Asia (ITC-Asia), 2022 IEEE International. :13-18 Aug, 2022
Relation: 2022 IEEE International Test Conference in Asia (ITC-Asia)
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5مؤتمر
المؤلفون: Zheng, Shi-Xuan, Yeh, Chung-Yu, Lee, Kuen-Jong, Wang, Chen, Cheng, Wu-Tung, Kassab, Mark, Rajski, Janusz, Reddy, Sudhakar M.
المصدر: 2022 IEEE 40th VLSI Test Symposium (VTS) VLSI Test Symposium (VTS), 2022 IEEE 40th. :1-7 Apr, 2022
Relation: 2022 IEEE 40th VLSI Test Symposium (VTS)
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6مؤتمر
المؤلفون: Chi, Hung-Yao, Lee, Kuen-Jong, Jao, Tzu-Chun
المصدر: 2021 IEEE 30th Asian Test Symposium (ATS) ATS Asian Test Symposium (ATS), 2021 IEEE 30th. :13-18 Nov, 2021
Relation: 2021 IEEE 30th Asian Test Symposium (ATS)
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7دورية أكاديمية
المؤلفون: Linda Yin-king Lee, Chun-kit Yeung, Chun-wa Choi, Man-nga Leung, Shing-yan Lui, Wing-yi Tam, Ka-yi Tang, Chun-san Wong, Yuen-shan Wong, Cheuk-yi Yau, Tik-ling Yeung, Joseph Kok-long Lee, Debby Lee-kuen Chui
المصدر: BMC Geriatrics, Vol 24, Iss 1, Pp 1-16 (2024)
مصطلحات موضوعية: Domestic tasks, Assistance, Robot, Functional dependence level, Geriatrics, RC952-954.6
وصف الملف: electronic resource
Relation: https://doaj.org/toc/1471-2318
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8مؤتمر
المؤلفون: Tsai, Fong-Jyun, Ye, Chong-Siao, Lee, Kuen-Jong, Zheng, Shi-Xuan, Huang, Yu, Cheng, Wu-Tung, Reddy, Sudhakar M., Kassab, Mark, Rajski, Janusz, Wang, Chen, Zawada, Justyna
المصدر: 2020 IEEE International Test Conference (ITC) Test Conference (ITC), 2020 IEEE International. :1-10 Nov, 2020
Relation: 2020 IEEE International Test Conference (ITC)
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9مؤتمر
المؤلفون: Tsai, Fong-Jyun, Ye, Chong-Siao, Huang, Yu, Lee, Kuen-Jong, Cheng, Wu-Tung, Reddy, Sudhakar M., Kassab, Mark, Rajski, Janusz, Zheng, Shi-Xuan
المصدر: 2020 IEEE International Test Conference in Asia (ITC-Asia) Test Conference in Asia (ITC-Asia), 2020 IEEE International. :130-135 Sep, 2020
Relation: 2020 IEEE International Test Conference in Asia (ITC-Asia)
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10مؤتمر
المؤلفون: Wu, Cheng-Hung, Huang, Yu, Lee, Kuen-Jong, Cheng, Wu-Tung, Veda, Gaurav, Reddy, Sudhakar, Hu, Chun-Cheng, Ye, Chong-Siao
المصدر: 2019 IEEE 28th Asian Test Symposium (ATS) ATS Asian Test Symposium (ATS), 2019 IEEE 28th. :1-15 Dec, 2019
Relation: 2019 IEEE 28th Asian Test Symposium (ATS)