يعرض 1 - 10 نتائج من 1,067 نتيجة بحث عن '"Lee, Kuen"', وقت الاستعلام: 0.89s تنقيح النتائج
  1. 1
    مؤتمر
    A Novel Unified Modular Arithmetic Unit for Elliptic Curve Cryptography

    المؤلفون: Chen, Hsiang-Yu, Peng, Kuan-Ying, Lee, Kuen-Jong

    المصدر: 2023 International VLSI Symposium on Technology, Systems and Applications (VLSI-TSA/VLSI-DAT) Technology, Systems and Applications (VLSI-TSA/VLSI-DAT), 2023 International VLSI Symposium on. :1-4 Apr, 2023

    Relation: 2023 International VLSI Symposium on Technology, Systems and Applications (VLSI-TSA/VLSI-DAT)

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  2. 2
    مؤتمر
    An Authentication-Based Secure IJTAG Network

    المؤلفون: Yeh, Shih-Chun, Lee, Kuen-Jong, Chen, Dong-Yi

    المصدر: 2022 IEEE 31st Asian Test Symposium (ATS) ATS Test Symposium (ATS), 2022 IEEE 31st Asian. :25-30 Nov, 2022

    Relation: 2022 IEEE 31st Asian Test Symposium (ATS)

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  3. 3
    مؤتمر
    Scan-Based Test Chip Design with XOR-based C-testable Functional Blocks

    المؤلفون: Chen, Yan-Fu, Kang, Duo-Yao, Lee, Kuen-Jong

    المصدر: 2022 IEEE International Test Conference (ITC) ITC Test Conference (ITC), 2022 IEEE International. :82-91 Sep, 2022

    Relation: 2022 IEEE International Test Conference (ITC)

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  4. 4
    مؤتمر
    Diagnosing Transition Delay Faults under Scan-Based Logic Array

    المؤلفون: Kang, Duo-Yao, Lin, Shiou-Ning, Lee, Kuen-Jong

    المصدر: 2022 IEEE International Test Conference in Asia (ITC-Asia) ITC-ASIA Test Conference in Asia (ITC-Asia), 2022 IEEE International. :13-18 Aug, 2022

    Relation: 2022 IEEE International Test Conference in Asia (ITC-Asia)

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  5. 5
    مؤتمر
    Accurate Estimation of Test Pattern Counts for a Wide-Range of EDT Input/Output Channel Configurations

    المؤلفون: Zheng, Shi-Xuan, Yeh, Chung-Yu, Lee, Kuen-Jong, Wang, Chen, Cheng, Wu-Tung, Kassab, Mark, Rajski, Janusz, Reddy, Sudhakar M.

    المصدر: 2022 IEEE 40th VLSI Test Symposium (VTS) VLSI Test Symposium (VTS), 2022 IEEE 40th. :1-7 Apr, 2022

    Relation: 2022 IEEE 40th VLSI Test Symposium (VTS)

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  6. 6
    مؤتمر
    Lightweight Hardware-Based Memory Protection Mechanism on IoT Processors

    المؤلفون: Chi, Hung-Yao, Lee, Kuen-Jong, Jao, Tzu-Chun

    المصدر: 2021 IEEE 30th Asian Test Symposium (ATS) ATS Asian Test Symposium (ATS), 2021 IEEE 30th. :13-18 Nov, 2021

    Relation: 2021 IEEE 30th Asian Test Symposium (ATS)

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  7. 7
    دورية أكاديمية
    Comparison of assistance preferences of older adults with different functional dependence levels on domestic tasks performed by robots

    المؤلفون: Linda Yin-king Lee, Chun-kit Yeung, Chun-wa Choi, Man-nga Leung, Shing-yan Lui, Wing-yi Tam, Ka-yi Tang, Chun-san Wong, Yuen-shan Wong, Cheuk-yi Yau, Tik-ling Yeung, Joseph Kok-long Lee, Debby Lee-kuen Chui

    المصدر: BMC Geriatrics, Vol 24, Iss 1, Pp 1-16 (2024)

    مصطلحات موضوعية: Domestic tasks, Assistance, Robot, Functional dependence level, Geriatrics, RC952-954.6

    وصف الملف: electronic resource

    Relation: https://doaj.org/toc/1471-2318

    URL الوصول: https://doaj.org/article/47b87c6a76e9435ba10b907e888245f8

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  8. 8
    مؤتمر
    Prediction of Test Pattern Count and Test Data Volume for Scan Architectures under Different Input Channel Configurations

    المؤلفون: Tsai, Fong-Jyun, Ye, Chong-Siao, Lee, Kuen-Jong, Zheng, Shi-Xuan, Huang, Yu, Cheng, Wu-Tung, Reddy, Sudhakar M., Kassab, Mark, Rajski, Janusz, Wang, Chen, Zawada, Justyna

    المصدر: 2020 IEEE International Test Conference (ITC) Test Conference (ITC), 2020 IEEE International. :1-10 Nov, 2020

    Relation: 2020 IEEE International Test Conference (ITC)

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  9. 9
    مؤتمر
    Estimation of Test Data Volume for Scan Architectures with Different Numbers of Input Channels

    المؤلفون: Tsai, Fong-Jyun, Ye, Chong-Siao, Huang, Yu, Lee, Kuen-Jong, Cheng, Wu-Tung, Reddy, Sudhakar M., Kassab, Mark, Rajski, Janusz, Zheng, Shi-Xuan

    المصدر: 2020 IEEE International Test Conference in Asia (ITC-Asia) Test Conference in Asia (ITC-Asia), 2020 IEEE International. :130-135 Sep, 2020

    Relation: 2020 IEEE International Test Conference in Asia (ITC-Asia)

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  10. 10
    مؤتمر
    Deep Learning Based Test Compression Analyzer

    المؤلفون: Wu, Cheng-Hung, Huang, Yu, Lee, Kuen-Jong, Cheng, Wu-Tung, Veda, Gaurav, Reddy, Sudhakar, Hu, Chun-Cheng, Ye, Chong-Siao

    المصدر: 2019 IEEE 28th Asian Test Symposium (ATS) ATS Asian Test Symposium (ATS), 2019 IEEE 28th. :1-15 Dec, 2019

    Relation: 2019 IEEE 28th Asian Test Symposium (ATS)

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