المؤلفون: Lee, N-H, Lee, S., Kim, G J., Kim, Y J., Woo, B W., Lee, Y Y., Kim, H K., Kim, E J., Lee, Y S., Hwang, Y C, Ko, S B., Pae, S.

المصدر: 2023 International Electron Devices Meeting (IEDM) Electron Devices Meeting (IEDM), 2023 International. :1-4 Dec, 2023

Relation: 2023 International Electron Devices Meeting (IEDM)

المؤلفون: Lee, S., Lee, N-H, Kim, G-J, Ahn, J., Kim, IH., Ha, S., Rhee, S., Bae, GH, Lee, KW, Lee, YS, Ko, SB., Pae, S.

المصدر: 2024 IEEE International Reliability Physics Symposium (IRPS) International Reliability Physics Symposium (IRPS), 2024 IEEE. :P69.TX-1-P69.TX-4 Apr, 2024

Relation: 2024 IEEE International Reliability Physics Symposium (IRPS)

المؤلفون: Lee, S., Lee, N-H, Lee, KW., Kim, JH., Jin, JH., Lee, YS., Hwang, YC, Kim, HS., Pae, S.

المصدر: 2023 IEEE International Reliability Physics Symposium (IRPS) Reliability Physics Symposium (IRPS), 2023 IEEE International. :1-4 Mar, 2023

Relation: 2023 IEEE International Reliability Physics Symposium (IRPS)

المؤلفون: Ha, Sungmock, Lee, S., Bae, GH., Lee, DS., Kim, S.H., Woo, BW., Lee, N-H, Lee, YS., Pae, S.

المصدر: 2023 IEEE International Reliability Physics Symposium (IRPS) Reliability Physics Symposium (IRPS), 2023 IEEE International. :1-7 Mar, 2023

Relation: 2023 IEEE International Reliability Physics Symposium (IRPS)

المؤلفون: Lee, N-H, Lee, S., Kim, S-H, Kim, G-J, Lee, KW., Lee, YS., Hwang, YC., Kim, HS., Pae, S.

المصدر: 2022 IEEE International Reliability Physics Symposium (IRPS) Reliability Physics Symposium (IRPS), 2022 IEEE International. :6A.1-1-6A.1-6 Mar, 2022

Relation: 2022 IEEE International Reliability Physics Symposium (IRPS)

المؤلفون: Lee, S., Kim, G.-J., Lee, N-H., Lee, KW., Woo, BW., Jin, J., Kim, JG., Lee, YS., Kim, HS., Pae, S.

المصدر: 2021 IEEE International Electron Devices Meeting (IEDM) Electron Devices Meeting (IEDM), 2021 IEEE International. :6.6.1-6.6.4 Dec, 2021

Relation: 2021 IEEE International Electron Devices Meeting (IEDM)

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المؤلفون: Kim, Y., Ju, S., Jeong, S., Kim, J.-Y., Lee, N.-H., Jung, H.-K., Han, W.-T.

المصدر: IEEE Transactions on Nuclear Science IEEE Trans. Nucl. Sci. Nuclear Science, IEEE Transactions on. 62(3):1362-1366 Jun, 2015

المؤلفون: Tang, M., Park, Y., Lee, N. H., Priebe, C. E.

المصدر: IEEE Transactions on Signal Processing IEEE Trans. Signal Process. Signal Processing, IEEE Transactions on. 61(7):1721-1732 Apr, 2013

المؤلفون: Cho, Y. S., Park, I. H., Yoon, S. Y., Lee, N. H., Joo, S. H., Song, K.-W., Choi, K., Han, J.-M., Kyung, K. H., Jun, Y.-H.

المصدر: IEEE Journal of Solid-State Circuits IEEE J. Solid-State Circuits Solid-State Circuits, IEEE Journal of. 48(4):948-959 Apr, 2013