المؤلفون: Lee, Taejun, Park, Heewon, Lee, Heejo

المصدر: 2023 IEEE/ACM International Conference on Automation of Software Test (AST) AST Automation of Software Test (AST), 2023 IEEE/ACM International Conference on. :47-55 May, 2023

Relation: 2023 IEEE/ACM International Conference on Automation of Software Test (AST)

المؤلفون: Lee, Taejun, Kim, Minju, Kim, Sung-Phil

المصدر: 2020 8th International Winter Conference on Brain-Computer Interface (BCI) Brain-Computer Interface (BCI), 2020 8th International Winter Conference on. :1-4 Feb, 2020

Relation: 2020 8th International Winter Conference on Brain-Computer Interface (BCI)

المؤلفون: Lee, Seungji, Lee, Taejun, Yang, Taeyang, Seomoon, Eunbi, Yoon, Changrak, Kim, Sung-Phil

المصدر: TENCON 2018 - 2018 IEEE Region 10 Conference Region 10 Conference, TENCON, 2018 - 2018 IEEE. :0446-0450 Oct, 2018

Relation: TENCON 2018 - 2018 IEEE Region 10 Conference

المؤلفون: Lee, Junesoo, Kong, Duk-Jo, Lee, Taejun

المصدر: In Organizational Dynamics August 2024

المؤلفون: Lee, Eun Hee, Lee, Taejun, Lee, Byung-Kwan

المصدر: New Media & Society; Sep2024, Vol. 26 Issue 9, p5195-5218, 24p

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لا يتم عرض هذه النتيجة على الضيوف.
تسجيل الدخول للوصول الكامل.

المؤلفون: Lee, Taejun (David), Lee-Geiller, Seulki, Lee, Byung-Kwan

المصدر: In Government Information Quarterly October 2021 38(4)

المؤلفون: Oh, Dong Kyo, Lee, Taejun, Ko, Byoungsu, Badloe, Trevon, Ok, Jong G.^Aff2, Rho, Junsuk^{Aff1, Aff3}

المصدر: Frontiers of Optoelectronics. 14(2):229-251

المؤلفون: Lee, Taejun (David), Huhmann, Bruce A., Yun, TaiWoong

المصدر: International Journal of Bank Marketing, 2020, Vol. 38, Issue 7, pp. 1421-1440.

URL الوصول: http://www.emeraldinsight.com/doi/10.1108/IJBM-03-2020-0090