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1مؤتمر
المؤلفون: Ng, Tony, Kim, Hyo Jin, Lee, Vincent T., DeTone, Daniel, Yang, Tsun-Yi, Shen, Tianwei, Ilg, Eddy, Balntas, Vassileios, Mikolajczyk, Krystian, Sweeney, Chris
المصدر: 2022 IEEE/CVF Conference on Computer Vision and Pattern Recognition (CVPR) CVPR Computer Vision and Pattern Recognition (CVPR), 2022 IEEE/CVF Conference on. :12787-12797 Jun, 2022
Relation: 2022 IEEE/CVF Conference on Computer Vision and Pattern Recognition (CVPR)
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2مؤتمر
المؤلفون: Reagen, Brandon, Choi, Woo-Seok, Ko, Yeongil, Lee, Vincent T., Lee, Hsien-Hsin S., Wei, Gu-Yeon, Brooks, David
المصدر: 2021 IEEE International Symposium on High-Performance Computer Architecture (HPCA) HPCA High-Performance Computer Architecture (HPCA), 2021 IEEE International Symposium on. :26-39 Feb, 2021
Relation: 2021 IEEE International Symposium on High-Performance Computer Architecture (HPCA)
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3تقرير
المؤلفون: Dangwal, Deeksha, Lee, Vincent T., Kim, Hyo Jin, Shen, Tianwei, Cowan, Meghan, Shah, Rajvi, Trippel, Caroline, Reagen, Brandon, Sherwood, Timothy, Balntas, Vasileios, Alaghi, Armin, Ilg, Eddy
مصطلحات موضوعية: Computer Science - Computer Vision and Pattern Recognition
URL الوصول: http://arxiv.org/abs/2105.03812
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4تقرير
المؤلفون: Dangwal, Deeksha, Cowan, Meghan, Alaghi, Armin, Lee, Vincent T., Reagen, Brandon, Trippel, Caroline
مصطلحات موضوعية: Computer Science - Cryptography and Security, Computer Science - Hardware Architecture
URL الوصول: http://arxiv.org/abs/2105.00378
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5
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6مؤتمر
المؤلفون: Lee, Vincent T., Mazumdar, Amrita, del Mundo, Carlo C., Alaghi, Armin, Ceze, Luis, Oskin, Mark
المصدر: 2018 IEEE International Parallel and Distributed Processing Symposium (IPDPS) IPDPS Parallel and Distributed Processing Symposium, 2018 IEEE International. :896-907 May, 2018
Relation: 2018 IEEE International Parallel and Distributed Processing Symposium (IPDPS)
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7مؤتمر
المؤلفون: Lee, Vincent T., Alaghi, Armin, Ceze, Luis
المصدر: 2018 Design, Automation & Test in Europe Conference & Exhibition (DATE) Design, Automation & Test in Europe Conference & Exhibition (DATE), 2018. :1417-1422 Mar, 2018
Relation: 2018 Design, Automation & Test in Europe Conference & Exhibition (DATE)
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8مؤتمر
المؤلفون: Lee, Vincent T., Alaghi, Armin, Hayes, John P., Sathe, Visvesh, Ceze, Luis
المصدر: Design, Automation & Test in Europe Conference & Exhibition (DATE), 2017. :13-18 Mar, 2017
Relation: 2017 Design, Automation & Test in Europe Conference & Exhibition (DATE)
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9
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10تقرير
المؤلفون: Lee, Vincent T., Alaghi, Armin, Ceze, Luis, Oskin, Mark
مصطلحات موضوعية: Computer Science - Emerging Technologies
URL الوصول: http://arxiv.org/abs/1810.04756