المؤلفون: Lee, Hoi-Jin, Han, Sihun, Park, Chanyeol, Park, Sunyong, Yang, Woonphil, Park, Jonghoon, Lee, Yunki, Kim, Bumsuk, Kim, Yitae, Lee, Jesuk

المصدر: 2024 IEEE 74th Electronic Components and Technology Conference (ECTC) ECTC Electronic Components and Technology Conference (ECTC), 2024 IEEE 74th. :1784-1789 May, 2024

Relation: 2024 IEEE 74th Electronic Components and Technology Conference (ECTC)

المؤلفون: Choi, Chulsoo, Park, Jonghoon, Lee, Yunki, Kim, Bumsuk, Kim, Junghoon, Kim, Sunwook, Kim, Junghyun, Roh, Sookyoung, Ahn, Sungmo, Mun, Sangeun, Lee, Beomsuk, Nah, Seungjoo, Park, Howoo, Kim, Hyunchul, Moon, Changrok, Yun, Seokho, Ahn, Jungchak, Yim, Joonseo

المصدر: 2023 International Electron Devices Meeting (IEDM) Electron Devices Meeting (IEDM), 2023 International. :1-4 Dec, 2023

Relation: 2023 International Electron Devices Meeting (IEDM)

المؤلفون: Park, Hye Yeon, Lee, Yunki, Park, Jonghoon, Song, Hyunseok, Lee, Taesung, Gweon, Hyung Keun, Jung, Yunji, Bae, Jeongmin, Kim, Boseong, Han, Junwon, Kim, Seungwon, Yoon, Cheolsang, Kim, Jeongki, Lee, Changkeun, Yoo, Sehoon, Kim, EuiYeol, Baek, Hyunmin, Park, Howoo, Kim, Bumsuk, Ahn, JungChak, Yim, JoonSeo

المصدر: 2022 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits) VLSI Technology and Circuits (VLSI Technology and Circuits), 2022 IEEE Symposium on. :353-354 Jun, 2022

Relation: 2022 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits)

المؤلفون: Joe, In-Sung, Lee, Yunki, Park, Hye Yeon, Uk Kim, Jong, Kang, Dongyeon, Kim, Taehoon, Kim, Minkwan, Lee, Kwangmin, Heo, Minsung, Ro, Inho, Kim, Jinhyung, Park, Inyong, Kwon, Seokjin, Yoon, Kisang, Park, Dami, Lee, Changkyu, Jo, Eunyoung, Jeon, Minhwan, Park, Chanho, Byun, Kyung Rae, Kwang Chang, Chong, Hur, JaeSung, Yoon, Kijoong, Jeon, Taeksoo, Lee, Jaehak, Park, Jungho, Kim, Bumsuk, Ahn, JungChak, Kim, Hyunchul, Moon, Chang-Rok, Kim, Hyoung-Sub

المصدر: 2021 Symposium on VLSI Circuits VLSI Circuits, 2021 Symposium on. :1-2 Jun, 2021

Relation: 2021 Symposium on VLSI Circuits

المؤلفون: Hoang Thi, Thai Thanh, Laney, Maddison, Zhang, Hongmanlin, Martinez, Fernando, Lee, Yunki, Jang, Young C.

المصدر: In Journal of Industrial and Engineering Chemistry 25 January 2024 129:69-104

المؤلفون: Rigo, Bruno, Bateman, Allison, Lee, Jimin, Kim, Hyeonseok, Lee, Yunki, Romero, Lissette, Jang, Young C., Herbert, Robert, Yeo, Woon-Hong

المصدر: In Biosensors and Bioelectronics 1 December 2023 241

المؤلفون: Prausnitz, Mark R. (ORCID 0000-0002-9076-8448), Cuba-Torres, Christian M., Liu, Nian (ORCID 0000-0002-5966-0244), Lee, Yunki (ORCID 0000-0002-7632-0858)

المصدر: Chemical Engineering Education. Spr 2022 56(2):90-101.

Peer Reviewed: Y

Page Count: 12

Descriptors: Chemical Engineering, Engineering Education, Student Interests, Undergraduate Students, Decision Making, Majors (Students), Student Attitudes, Student Experience, Student Characteristics, Student Surveys, Age Groups

مصطلحات جغرافية: Georgia

المؤلفون: Kim, Yitae, Choi, Wonchul, Park, Donghyuk, Jeoung, Heegeun, Kim, Bumsuk, Oh, Youngsun, Oh, Sunghoon, Park, Byungjun, Kim, Euiyeol, Lee, YunKi, Jung, Taesub, Kim, Yongwoon, Yoon, Sukki, Hong, Seokyong, Lee, Jesuk, Jung, Sangil, Moon, Chang-Rok, Park, Yongin, Lee, Duckhyung, Chang, Duckhyun

المصدر: 2018 IEEE International Solid-State Circuits Conference - (ISSCC) Solid-State Circuits Conference - (ISSCC), 2018 IEEE International. :84-86 Feb, 2018

Relation: 2018 IEEE International Solid-State Circuits Conference - (ISSCC)

المؤلفون: Shit, Arnab, Park, Sujeong, Lee, Yunki, Ryplida, Benny, Morgan, Nyssa, Jang, Young C., Jin, Eun-Jung, Park, Sung Young

المصدر: In Acta Biomaterialia September 2023

المؤلفون: Park, Donghyuk, Lee, Seung-Wook, Han, Jinhwa, Jang, Dongyoung, Kwon, Heesang, Cha, Seungwon, Kim, Mihye, Lee, Haewon, Suh, Sungho, Joo, Woong, Lee, Yunki, Nah, Seungjoo, Jeong, Heegeun, Kim, Bumsuk, Jung, Sangil, Lee, Jesuk, Kim, Yitae, Moon, Chang-Rok, Park, Yongin

المصدر: 2019 IEEE International Electron Devices Meeting (IEDM) Electron Devices Meeting (IEDM), 2019 IEEE International. :16.2.1-16.2.4 Dec, 2019

Relation: 2019 IEEE International Electron Devices Meeting (IEDM)