المؤلفون: van den Brom, H. E., van Leeuwen, R., Warmerdam, J. M., Schaacke, R.

المصدر: 2024 IEEE International Instrumentation and Measurement Technology Conference (I2MTC) Instrumentation and Measurement Technology Conference (I2MTC), 2024 IEEE International. :1-6 May, 2024

Relation: 2024 IEEE International Instrumentation and Measurement Technology Conference (I2MTC)

المؤلفون: Lodetti, S., Davis, P. N., Ritzmann, D., Wright, P. S., Khokhlov, V., Meyer, J., Istrate, D., Kasri, K., Van Den Brom, H., Ye, G., Van Leeuwen, R., Gallarreta, A., De La Vega, D.

المصدر: 2022 IEEE 12th International Workshop on Applied Measurements for Power Systems (AMPS) Applied Measurements for Power Systems (AMPS), 2022 IEEE 12th International Workshop on. :1-6 Sep, 2022

Relation: 2022 IEEE 12th International Workshop on Applied Measurements for Power Systems (AMPS)

المؤلفون: van den Brom, H.E., van Leeuwen, R., Marais, Z., ten Have, B., Hartman, T., Azpurua, M., Pous, M., Kok, G., van Veghel, M., Kolevatov, I., Malmbekk, H., Silva, F., Leferink, F.

المصدر: IEEE Transactions on Electromagnetic Compatibility IEEE Trans. Electromagn. Compat. Electromagnetic Compatibility, IEEE Transactions on. 63(6):1865-1874 Dec, 2021

المؤلفون: Marais, Z., van den Brom, H.E., Rietveld, G., van Leeuwen, R., Hoogenboom, D., Rens, J.

المصدر: 2019 International Symposium on Electromagnetic Compatibility - EMC EUROPE Electromagnetic Compatibility - EMC EUROPE, 2019 International Symposium on. :202-207 Sep, 2019

Relation: 2019 International Symposium on Electromagnetic Compatibility - EMC EUROPE

المؤلفون: van den Brom, H.E., van Leeuwen, R., Rietveld, G., Houtzager, E.

المصدر: IEEE Transactions on Instrumentation and Measurement IEEE Trans. Instrum. Meas. Instrumentation and Measurement, IEEE Transactions on. 70:1-8 2021

المؤلفون: van Leeuwen, R.^Aff10

المساهمون: de Jongh MD, T.O.H., editor^Aff1, Jongen-Hermus MSc, F.J., editor^Aff2, Damen MD PhD, J., editor^Aff3, Daelmans MD PhD, H.E.M., editor^Aff4, Franssen MD PhD, R., editor^Aff5, de Klerk-van der Wiel MSc, I., editor^Aff6, Pieterse MD, A.D., editor^Aff7, Schouwenberg MD PhD, B.J.J.W., editor^Aff8, Schuring MD, F., editor^Aff9

المصدر: Physical Diagnostics : The technique and significance of physical examination. :103-115

المؤلفون: van den Brom, H.E., van Leeuwen, R., Hornecker, R.

المصدر: IEEE Transactions on Instrumentation and Measurement IEEE Trans. Instrum. Meas. Instrumentation and Measurement, IEEE Transactions on. 68(6):2084-2090 Jun, 2019

المؤلفون: Pavlyukh, Y., Stefanucci, G., van Leeuwen, R.

المصدر: Phys. Rev. B 102, 045121 (2020)

مصطلحات موضوعية: Condensed Matter - Strongly Correlated Electrons

URL الوصول: http://arxiv.org/abs/2004.05344

المؤلفون: van den Brom, H.E., Rietveld, G., Hoogenboom, D., van Leeuwen, R., Marais, Z., Kok, G.J.P., Sharma, S., van Veghel, M.G.A.

المصدر: 2020 Conference on Precision Electromagnetic Measurements (CPEM) Precision Electromagnetic Measurements (CPEM), 2020 Conference on. :1-2 Aug, 2020

Relation: 2020 Conference on Precision Electromagnetic Measurements (CPEM 2020)

المؤلفون: van Leeuwen, R.^Aff10

المساهمون: de Jongh, T.O.H., editor^Aff1, Jongen-Hermus, F.J., editor^Aff2, Damen, J., editor^Aff3, Daelmans, H.E.M., editor^Aff4, Franssen, R., editor^Aff5, de Klerk-van der Wiel, I., editor^Aff6, Pieterse, A.D., editor^Aff7, Schouwenberg, B.J.J.W., editor^Aff8, Schuring, F., editor^Aff9

المصدر: Fysische diagnostiek : Uitvoering en betekenis van het lichamelijk onderzoek. :101-114