-
1مؤتمر
المؤلفون: Chao, T.S., Chien, C.H., Chiao, S.K., Lin, H.C., Liaw, M.C., Chen, L.P., Huang, T.Y., Lei, T.F., Chang, C.Y.
المصدر: Proceedings of Technical Papers. International Symposium on VLSI Technology, Systems, and Applications VLSI Technology, Systems, and Applications, 1997. Proceedings of Technical Papers. 1997 International Symposium on. :316-319 1997
Relation: International Symposium on VLSI Technology, Systems, and Applications
-
2دورية أكاديمية
المؤلفون: Ming-Shan Shieh, Pang-Shiu Chen, Tsai, M.-J., Lei, T.F.
المصدر: IEEE Electron Device Letters IEEE Electron Device Lett. Electron Device Letters, IEEE. 26(10):740-742 Oct, 2005
-
3دورية أكاديمية
المؤلفون: Wu, S.-L., Lee, C.-L., Lei, T.F., Chang, H.-C.
المصدر: IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 40(10):1797-1804 Oct, 1993
-
4مؤتمر
المؤلفون: Wang, S.D., Chang, M.N., Chen, C.Y., Lei, T.F.
المصدر: 2005 IEEE International Reliability Physics Symposium, 2005. Proceedings. 43rd Annual. Reliability physics Reliability Physics Symposium, 2005. Proceedings. 43rd Annual. 2005 IEEE International. :622-623 2005
Relation: 2005 IEEE International Reliability Physics Symposium. Proceedings 43rd Annual
-
5دورية أكاديمية
المؤلفون: Huang, C.T., Lei, T.F., Chu, C.H., Shvu, S.H.
المصدر: IEEE Electron Device Letters IEEE Electron Device Lett. Electron Device Letters, IEEE. 17(3):88-90 Mar, 1996
-
6دورية أكاديمية
المصدر: IEEE Electron Device Letters IEEE Electron Device Lett. Electron Device Letters, IEEE. 14(8):379-381 Aug, 1993
-
7دورية أكاديمية
المؤلفون: Wu, S.L., Lee, C.-L., Lei, T.F.
المصدر: IEEE Electron Device Letters IEEE Electron Device Lett. Electron Device Letters, IEEE. 13(1):23-25 Jan, 1992
-
8مؤتمر
المؤلفون: Lin, J.C., Chen, S.Y., Chen, H.W., Lin, H.C., Jhou, Z.W., Chou, S., Ko, J., Lei, T.F., Haung, H.S.
المصدر: 2005 IEEE International Integrated Reliability Workshop Integrated Reliability Workshop Integrated Reliability Workshop Final Report, 2005 IEEE International. :4 pp. 2005
Relation: 2005 IEEE International Integrated Reliability Workshop Final Report
-
9مؤتمر
المؤلفون: Chen, S.Y., Lin, J.C., Chen, H.W., Jhou, Z.W., Lin, H.C., Chou, S., Ko, J., Lei, T.F., Haung, H.S.
المصدر: 2005 IEEE International Integrated Reliability Workshop Integrated Reliability Workshop Integrated Reliability Workshop Final Report, 2005 IEEE International. :3 pp. 2005
Relation: 2005 IEEE International Integrated Reliability Workshop Final Report
-
10مؤتمر
المؤلفون: Chao, T.S., Chu, C.H., Wang, C.F., Ho, K.J., Lei, T.F., Lee, C.L.
المصدر: International Electron Devices and Materials Symposium Electron Devices and Materials Symposium, 1994. EDMS 1994. 1994 International. :5-5 1994
Relation: International Electron Devices and Materials Symposium
Full Text Finder