المؤلفون: Li, Yushu, Su, Yongyi, Yang, Xulei, Jia, Kui, Xu, Xun

مصطلحات موضوعية: Computer Science - Computer Vision and Pattern Recognition

URL الوصول: http://arxiv.org/abs/2405.18911

المؤلفون: Li, Yushu, Xu, Xun, Su, Yongyi, Jia, Kui

المصدر: 2023 IEEE/CVF International Conference on Computer Vision (ICCV) ICCV Computer Vision (ICCV), 2023 IEEE/CVF International Conference on. :11802-11812 Oct, 2023

Relation: 2023 IEEE/CVF International Conference on Computer Vision (ICCV)

المؤلفون: Wang, Chuyuan^{Aff1, Aff2}, Qiao, Jing, Liu, Shanshan, Piao, Sichen, Zhou, Yun, Hu, Yuedong, Wan, Chao, Sun, Yizhou, Ning, Hong, Chen, Lei, Zhang, He, Hu, Ruolin, Wang, Haoyu^{Aff1, Aff2}, Wang, Weiwei^{Aff1, Aff2}, Zhao, Lei, Mao, Jinyuan, Li, Min, Teng, Weiping^{Aff1, Aff2}, Shan, Zhongyan^{Aff1, Aff2, IDs12020023036725_cor19}, Li, Yushu^{Aff1, Aff2, IDs12020023036725_cor20}

المصدر: Endocrine: International Journal of Basic and Clinical Endocrinology. 84(3):1072-1080

المؤلفون: Gong, Kaijun, Yin, Zhuowen, Li, Yushu, Guo, Kailing, Xu, Xiangmin

مصطلحات موضوعية: Computer Science - Computer Vision and Pattern Recognition

URL الوصول: http://arxiv.org/abs/2310.02776

المؤلفون: Li, Tianbin^{Aff1, Aff2, IDs0060302403881y_cor1}, Peng, Feng, Chen, Chao, Ma, Chunchi^{Aff1, Aff2}, Li, Yonglin, Wang, Yixiang, Li, Yushu

المصدر: Rock Mechanics and Rock Engineering. :1-16

المؤلفون: Lei, Xiao^Aff37, Hou, Jingwen^Aff38, Li, Yushu^Aff37, Zhou, Hang^Aff38, Yuan, Jiaxin^Aff38

المساهمون: Angrisani, Leopoldo, Series Editor^Aff1, Arteaga, Marco, Series Editor^Aff2, Chakraborty, Samarjit, Series Editor^Aff3, Chen, Shanben, Series Editor^Aff4, Chen, Tan Kay, Series Editor^Aff5, Dillmann, Rüdiger, Series Editor^Aff6, Duan, Haibin, Series Editor^Aff7, Ferrari, Gianluigi, Series Editor^Aff8, Ferre, Manuel, Series Editor^Aff9, Hirche, Sandra, Series Editor^Aff10, Jabbari, Faryar, Series Editor^Aff11, Jia, Limin, Series Editor^Aff12, Kacprzyk, Janusz, Series Editor^Aff13, Khamis, Alaa, Series Editor^Aff14, Kroeger, Torsten, Series Editor^Aff15, Li, Yong, Series Editor^Aff16, Liang, Qilian, Series Editor^Aff17, Martín, Ferran, Series Editor^Aff18, Ming, Tan Cher, Series Editor^Aff19, Minker, Wolfgang, Series Editor^Aff20, Misra, Pradeep, Series Editor^Aff21, Mukhopadhyay, Subhas, Series Editor^Aff22, Ning, Cun-Zheng, Series Editor^Aff23, Nishida, Toyoaki, Series Editor^Aff24, Oneto, Luca, Series Editor^Aff25, Panigrahi, Bijaya Ketan, Series Editor^Aff26, Pascucci, Federica, Series Editor^Aff27, Qin, Yong, Series Editor^Aff28, Seng, Gan Woon, Series Editor^Aff29, Speidel, Joachim, Series Editor^Aff30, Veiga, Germano, Series Editor^Aff31, Wu, Haitao, Series Editor^Aff32, Zamboni, Walter, Series Editor^Aff33, Tan, Kay Chen, Series Editor^Aff34, Hu, Cungang, editor^Aff35, Cao, Wenping, editor^Aff36

المصدر: Conference Proceedings of the 2023 3rd International Joint Conference on Energy, Electrical and Power Engineering. 1208:297-303

المؤلفون: Karlsson, Hyunjoo Kim, Li, Yushu

المصدر: Working papers in economics and statistics.

مصطلحات موضوعية: Economics, Nationalekonomi

وصف الملف: electronic

URL الوصول: https://urn.kb.se/resolve?urn=urn:nbn:se:lnu:diva-131073
https://doi.org/10.15626/ns.wp.2024.10
https://lnu.diva-portal.org/smash/get/diva2:1878056/FULLTEXT01.pdf

المؤلفون: Li, Yushu, Cheng, Sang, Li, Qi, He, Jinliang

المصدر: 2020 IEEE Conference on Electrical Insulation and Dielectric Phenomena (CEIDP) Electrical Insulation and Dielectric Phenomena (CEIDP), 2020 IEEE Conference on. :354-357 Oct, 2020

Relation: 2020 IEEE Conference on Electrical Insulation and Dielectric Phenomena (CEIDP)

المؤلفون: Li, Yushu, Cheng, Sang, Zhu, Yujie, Hu, Jun, He, Jinliang, Li, Qi

المصدر: 2020 IEEE International Conference on High Voltage Engineering and Application (ICHVE) High Voltage Engineering and Application (ICHVE), 2020 IEEE International Conference on. :1-4 Sep, 2020

Relation: 2020 IEEE International Conference on High Voltage Engineering and Application (ICHVE)

المؤلفون: Li, Yushu, Zhu, Yujie, Luo, Zhen, Hu, Jun, He, Jinliang, Li, Qi

المصدر: 2020 IEEE International Conference on High Voltage Engineering and Application (ICHVE) High Voltage Engineering and Application (ICHVE), 2020 IEEE International Conference on. :1-4 Sep, 2020

Relation: 2020 IEEE International Conference on High Voltage Engineering and Application (ICHVE)