يعرض 1 - 10 نتائج من 103 نتيجة بحث عن '"Lian, Nan"', وقت الاستعلام: 1.11s تنقيح النتائج
  1. 1
    مؤتمر
    Common Source Line-to-Word Line Short Improvement by Eliminating SLT Sidewall Notch in 3D NAND Deep Trench Patterning

    المؤلفون: Chung, Yao-An, Chu, Yuan-Chieh, Chang, Chih-Chin, Lee, Hong-Ji, Lian, Nan-Tzu, Yang, Tahone, Chen, Kuang-Chao, Lu, Chih-Yuan

    المصدر: 2023 34th Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC) SEMI Advanced Semiconductor Manufacturing Conference (ASMC), 2023 34th Annual. :1-4 May, 2023

    Relation: 2023 34th Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC)

    Full Text Finder
    أضف إلى المفضلة
  2. 2
    مؤتمر
    Post-Etch Yield Killer Defects in 3D NAND High Aspect Ratio Etching Process

    المؤلفون: Chang, Chih-Chin, Hsiao, Ching-Hung, Chen, Yi-Che, Wang, Ching-Hung, Chung, Yao-An, Wang, Li-Wei, Lee, Hong-Ji, Lian, Nan-Tzu, Lee, Shih-Chin, Han, Tzung-Ting, Yang, Tahone, Chen, Kuang-Chao, Lu, Chih-Yuan

    المصدر: 2023 34th Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC) SEMI Advanced Semiconductor Manufacturing Conference (ASMC), 2023 34th Annual. :1-4 May, 2023

    Relation: 2023 34th Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC)

    Full Text Finder
    أضف إلى المفضلة
  3. 3
    مؤتمر
    Machine learning Assists on High Aspect Ratio Slit Trench Etching in 3D NAND

    المؤلفون: Chang, Yu-Fan, Lee, Hong-Ji, Chou, Fu-Hsing, Lee, Shih-Chin, Chung, Yao-An, Lian, Nan-Tzu, Han, Tzung-Ting, Yang, Tahone, Chen, Kuang-Chao, Lu, Chih-Yuan

    المصدر: 2022 33rd Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC) SEMI Advanced Semiconductor Manufacturing Conference (ASMC), 2022 33rd Annual. :1-4 May, 2022

    Relation: 2022 33rd Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC)

    Full Text Finder
    أضف إلى المفضلة
  4. 4
    مؤتمر
    Improvement of Twisting and Line-Edge Roughness of 3D NAND Deep Trench Etching on Yield Enhancement : AEPM: Advanced Equipment Processes and Materials

    المؤلفون: Chung, Yao-An, Chiu, Yuan-Chieh, Chang, Yu-Fan, Lee, Hong-Ji, Lian, Nan-Tzu, Yang, Tahone, Chen, Kuang-Chao, Lu, Chih-Yuan

    المصدر: 2022 33rd Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC) SEMI Advanced Semiconductor Manufacturing Conference (ASMC), 2022 33rd Annual. :1-4 May, 2022

    Relation: 2022 33rd Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC)

    Full Text Finder
    أضف إلى المفضلة
  5. 5
    مؤتمر
    Width Walk Control in 3D NAND Staircase Structure Etching

    المؤلفون: Hsiao, Ching-Hung, Cheng, Chen-Yu, Lee, Hong-Ji, Lian, Nan-Tzu, Han, Tzung-Ting, Yang, Tahone, Chen, Kuang-Chao, Lu, Chih-Yuan

    المصدر: 2021 32nd Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC) Advanced Semiconductor Manufacturing Conference (ASMC), 2021 32nd Annual SEMI. :1-4 May, 2021

    Relation: 2021 32nd Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC)

    Full Text Finder
    أضف إلى المفضلة
  6. 6
    مؤتمر
    Study of Plasma Ash Rate Enhancement by Machine Learning Models for TAT Improvement

    المؤلفون: Jheng, Shao-Lou, Wu, Jyunhong, Yang, Zusing, Chiu, Yuan-Chieh, Wu, Ming-Tsung, Lee, Hong-Ji, Lian, Nan-Tzu, Yang, Tahone, Chen, Kuang-Chao, Lu, Chih-Yuan

    المصدر: 2021 32nd Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC) Advanced Semiconductor Manufacturing Conference (ASMC), 2021 32nd Annual SEMI. :1-4 May, 2021

    Relation: 2021 32nd Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC)

    Full Text Finder
    أضف إلى المفضلة
  7. 7
    مؤتمر
    Oval-Shaped OP-Layer Hole Etching: Shape Deformation, Local Arcing, and Hole Bridging Improvements

    المؤلفون: Yang, Zusing, Chang, Yao-Yuan, Wu, Ming-Tsung, Lee, Hong-Ji, Lian, Nan-Tzu, Yang, Tahone, Chen, Kuang-Chao, Lu, Chih-Yuan

    المصدر: 2020 31st Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC) SEMI Advanced Semiconductor Manufacturing Conference (ASMC), 2020 31st Annual. :1-4 Aug, 2020

    Relation: 2020 31st Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC)

    Full Text Finder
    أضف إلى المفضلة
  8. 8
    مؤتمر
    Impact of Asymmetric Memory Hole Profile on Silicon Selective Epitaxial Growth in 3D NAND Memory : AEPM: Advanced Equipment Processes and Materials

    المؤلفون: Chang, Yao-Yuan, Yang, Zusing, Wu, Ming-Tsung, Lee, Hong-Ji, Lian, Nan-Tzu, Yang, Tahone, Chen, Kuang-Chao, Lu, Chih-Yuan

    المصدر: 2020 31st Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC) SEMI Advanced Semiconductor Manufacturing Conference (ASMC), 2020 31st Annual. :1-4 Aug, 2020

    Relation: 2020 31st Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC)

    Full Text Finder
    أضف إلى المفضلة
  9. 9
    مؤتمر
    Study of Plasma Arcing Mechanism in High Aspect Ratio Slit Trench Etching

    المؤلفون: Chung, Yao-An, Lung, Cheng-Yi, Chiu, Yuan-Chieh, Lee, Hong-Ji, Lian, Nan-Tzu, Yang, Tahone, Chen, Kuang-Chao, Lu, Chih-Yuan

    المصدر: 2019 30th Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC) Advanced Semiconductor Manufacturing Conference (ASMC), 2019 30th Annual SEMI. :1-4 May, 2019

    Relation: 2019 30th Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC)

    Full Text Finder
    أضف إلى المفضلة
  10. 10
    مؤتمر
    Pre-Epitaxial Plasma Etch Treatment for the Selective Epitaxial Growth of Silicon in High Aspect Ratio 3D NAND Memory

    المؤلفون: Lung, Cheng-Yi, Chung, Yao-An, Wu, Ming-Tsung, Lee, Hong-Ji, Lian, Nan-Tzu, Yang, Tahone, Chen, Kuang-Chao, Lu, Chih-Yuan

    المصدر: 2019 30th Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC) Advanced Semiconductor Manufacturing Conference (ASMC), 2019 30th Annual SEMI. :1-5 May, 2019

    Relation: 2019 30th Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC)

    Full Text Finder
    أضف إلى المفضلة
أدوات البحث: أحصل على تغذية RSS – أرسل هذا البحث بالبريد الإلكتروني – حفظ البحث – جدول التنبيهات: لا شيء