المؤلفون: Lee, Jian-Hsing, Nidhi, Karuna, Lin, Ting-You, Liao, Hsueh-Chun, Lee, Scott, Ker, Ming-Dou

المصدر: 2022 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) Physical and Failure Analysis of Integrated Circuits (IPFA), 2022 IEEE International Symposium on the. :1-6 Jul, 2022

Relation: 2022 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA)

المؤلفون: Lee, Jian-Hsing, Nidhi, Karuna, Lin, Tingyou, Liao, Hsueh-Chun, Tseng, Fu-Chun, Lee, Scott

المصدر: 2021 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) Physical and Failure Analysis of Integrated Circuits (IPFA), 2021 IEEE International Symposium on the. :1-5 Sep, 2021

Relation: 2021 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA)

المؤلفون: Chang, Ruey-Dar, Liao, Hsueh-Chun, Lin, Jui-Chang, Tsai, Jung-Ruey

المصدر: 2018 22nd International Conference on Ion Implantation Technology (IIT) Ion Implantation Technology (IIT), 2018 22nd International Conference on. :86-89 Sep, 2018

Relation: 2018 22nd International Conference on Ion Implantation Technology (IIT)

المؤلفون: Tsai, Jung-Ruey, Chang, Ruey-Dar, Chou, Cheng-Hui, Liao, Hsueh-Chun, Huang, Sz-Kai, Lin, Sung-Hung, Lin, Jui-Chang

المصدر: 2016 International Conference on Microelectronic Test Structures (ICMTS) Microelectronic Test Structures (ICMTS), 2016 International Conference on. :168-171 Mar, 2016

Relation: 2016 International Conference on Microelectronic Test Structures (ICMTS)

المؤلفون: Tsai, Jung-Ruey, Chang, Yi-Sheng, Lin, Jui-Chang, Bai, Shu-Ming, Sheu, Gene, Yang, Shao-Ming, Wu, Chun-Hsien, Liao, Hsueh-Chun, Chang, Ruey-Dar

المصدر: 2014 International Symposium on Next-Generation Electronics (ISNE) Next-Generation Electronics (ISNE), 2014 International Symposium on. :1-4 May, 2014

Relation: 2014 International Symposium on Next-Generation Electronics (ISNE)

المؤلفون: Liao, Hsueh-Chun, Wu, Yeh-Wei, Chang, Ruey-Dar, Tsai, Jung-Ruey

المصدر: 2013 International Symposium on Next-Generation Electronics Next-Generation Electronics (ISNE), 2013 IEEE International Symposium on. :62-64 Feb, 2013

Relation: 2013 International Symposium on Next-Generation Electronics (ISNE)

المؤلفون: Chang, Ruey-Dar, Liao, Hsueh-Chun, Tai, Chih-Ming

المصدر: In Vacuum June 2017 140:161-164

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