المؤلفون: Wu, C.C., Liao, S.H., Ho, C.W.

المصدر: 2010 3rd International Conference on Information Management, Innovation Management and Industrial Engineering Information Management, Innovation Management and Industrial Engineering (ICIII), 2010 International Conference on. 4:159-162 Nov, 2010

Relation: 2010 International Conference on Information Management, Innovation Management and Industrial Engineering (ICIII)

المؤلفون: Chang, H.W., Guo, Y.M., Liao, S.H., Chang, W.C., Shaw, C.C.

المصدر: In Journal of Alloys and Compounds 25 April 2020 821

المؤلفون: Jeng, J.T., Hung, H.C., Lin, C.R., Wu, C.H., Chen, K.L., Chen, J.-C., Yang, H.C., Liao, S.H., Horng, H.E.

المصدر: IEEE Transactions on Applied Superconductivity IEEE Trans. Appl. Supercond. Applied Superconductivity, IEEE Transactions on. 15(2):793-796 Jun, 2005

المؤلفون: Shen, J.X., Chang Xie, Juren Ding, Shultz, A., Liao, S.H.

المصدر: IEEE Transactions on Magnetics IEEE Trans. Magn. Magnetics, IEEE Transactions on. 35(5):2595-2597 Sep, 1999

المؤلفون: Liao, S.H., Chang, S.T., Lin, C.Y.

المصدر: 2006 International SiGe Technology and Device Meeting SiGe Technology and Device Meeting, 2006. ISTDM 2006. Third International. :1-2 2006

Relation: 2006 International SiGe Technology and Device Meeting

المؤلفون: Chang, S.T., Lin, C.Y., Liao, S.H.

المصدر: 2006 International SiGe Technology and Device Meeting SiGe Technology and Device Meeting, 2006. ISTDM 2006. Third International. :1-2 2006

Relation: 2006 International SiGe Technology and Device Meeting

المؤلفون: Liao, S.H.

المصدر: IEEE Transactions on Magnetics IEEE Trans. Magn. Magnetics, IEEE Transactions on. 26(1):328-332 Jan, 1990

المؤلفون: Mitsumata, C., Kobayashi, T., Liao, S.H.

المصدر: IEEE Transactions on Magnetics IEEE Trans. Magn. Magnetics, IEEE Transactions on. 31(6):2630-2632 Nov, 1995

المؤلفون: Yuan, S.W., Kobayashi, T., Liao, S.H.

المصدر: IEEE Transactions on Magnetics IEEE Trans. Magn. Magnetics, IEEE Transactions on. 31(6):2627-2629 Nov, 1995

المؤلفون: Wu, C.C., Lin, D.W., Keshavarzi, A., Huang, C.H., Chan, C.T., Tseng, C.H., Chen, C.L., Hsieh, C.Y., Wong, K.Y., Cheng, M.L., Li, T.H., Lin, Y.C., Yang, L.Y., Lin, C.P., Hou, C.S., Lin, H.C., Yang, J.L., Yu, K.F., Chen, M.J., Hsieh, T.H., Peng, Y.C., Chou, C.H., Lee, C.J., Huang, C.W., Lu, C.Y., Yang, F.K., Chen, H.K., Weng, L.W., Yen, P.C., Wang, S.H., Chang, S.W., Chuang, S.W., Gan, T.C., Wu, T.L., Lee, T.Y., Huang, W.S., Huang, Y.J., Tseng, Y.W., Wu, C.M., Ou-Yang, Eric, Hsu, K.Y., Lin, L.T., Wang, S.B., Kwok, T.M., Su, C.C., Tsai, C.H., Huang, M.J., Lin, H.M., Chang, A.S., Liao, S.H., Chen, L.S., Chen, J.H., Lim, P.S., Yu, X.F., Ku, S.Y., Lee, Y.B., Hsieh, P.C., Wang, P.W., Chiu, Y.H., Lin, S.S., Tao, H.J., Cao, M., Mii, Y.J.

المصدر: 2010 International Electron Devices Meeting Electron Devices Meeting (IEDM), 2010 IEEE International. :27.1.1-27.1.4 Dec, 2010

Relation: 2010 IEEE International Electron Devices Meeting (IEDM)