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1دورية أكاديمية
المصدر: Transactions on Cryptographic Hardware and Embedded Systems, Vol 2024, Iss 2 (2024)
مصطلحات موضوعية: Random number generation, Parameterized stochastic models, Dedicated statistical tests, Physical isolation, Hardware monitoring, Computer engineering. Computer hardware, TK7885-7895, Information technology, T58.5-58.64
وصف الملف: electronic resource
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المؤلفون: Maryline Bawedin, Monica Simion, Melania Popescu, I. Ionica, Licinius Benea
المصدر: IEEE Sensors Journal. 20:14032-14041
مصطلحات موضوعية: Materials science, Silicon, business.industry, 010401 analytical chemistry, Silicon on insulator, chemistry.chemical_element, 01 natural sciences, 0104 chemical sciences, Contact angle, chemistry, MOSFET, Optoelectronics, Surface modification, Electrical and Electronic Engineering, Fourier transform infrared spectroscopy, Biochip, business, Instrumentation, Biosensor
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المؤلفون: Sorin Cristoloveanu, Gerard Ghibaudo, Licinius Benea, Yasuhisa Omura, Shingo Sato, Irina Ionica
المساهمون: Institut de Microélectronique, Electromagnétisme et Photonique - Laboratoire d'Hyperfréquences et Caractérisation (IMEP-LAHC ), Institut polytechnique de Grenoble - Grenoble Institute of Technology (Grenoble INP )-Université Savoie Mont Blanc (USMB [Université de Savoie] [Université de Chambéry])-Centre National de la Recherche Scientifique (CNRS)-Université Grenoble Alpes [2016-2019] (UGA [2016-2019]), Kansai University
المصدر: Solid-State Electronics
Solid-State Electronics, Elsevier, 2019, 159, pp.197-203. ⟨10.1016/j.sse.2019.03.059⟩مصطلحات موضوعية: 010302 applied physics, Materials science, Admittance, business.industry, Contact resistance, Silicon on insulator, 02 engineering and technology, 021001 nanoscience & nanotechnology, Condensed Matter Physics, Series and parallel circuits, 01 natural sciences, Capacitance, Electronic, Optical and Magnetic Materials, 0103 physical sciences, MOSFET, Materials Chemistry, Equivalent circuit, Optoelectronics, [SPI.NANO]Engineering Sciences [physics]/Micro and nanotechnologies/Microelectronics, Electrical and Electronic Engineering, 0210 nano-technology, business, Electrical impedance, ComputingMilieux_MISCELLANEOUS
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المؤلفون: Cécile Delacour, Melania Banu, Mihaela Kusko, Licinius Benea, Maryline Bawedin, Sorin Cristoloveanu, Monica Simion, I. Ionica
المساهمون: Institut de Microélectronique, Electromagnétisme et Photonique - Laboratoire d'Hyperfréquences et Caractérisation (IMEP-LAHC ), Institut polytechnique de Grenoble - Grenoble Institute of Technology (Grenoble INP )-Université Savoie Mont Blanc (USMB [Université de Savoie] [Université de Chambéry])-Centre National de la Recherche Scientifique (CNRS)-Université Grenoble Alpes [2016-2019] (UGA [2016-2019]), National Institute for Research and Development in Microtechnologies (IMT-Bucharest), Thermodynamique et biophysique des petits systèmes (NEEL - TPS), Institut Néel (NEEL), Institut polytechnique de Grenoble - Grenoble Institute of Technology (Grenoble INP )-Centre National de la Recherche Scientifique (CNRS)-Université Grenoble Alpes [2016-2019] (UGA [2016-2019])-Institut polytechnique de Grenoble - Grenoble Institute of Technology (Grenoble INP )-Centre National de la Recherche Scientifique (CNRS)-Université Grenoble Alpes [2016-2019] (UGA [2016-2019]), PHC Brancusi (project 38 395QA), European Project: 687931,H2020,H2020-ICT-2015,REMINDER(2016), European Project: 662175,H2020,ECSEL-2014-2,WAYTOGO FAST(2015), Thermodynamique et biophysique des petits systèmes (TPS)
المصدر: 2018 CAS Proceedings
2018 International Semiconductor Conference (CAS)
2018 International Semiconductor Conference (CAS), Oct 2018, Sinaia, Romania. pp.143-146, ⟨10.1109/SMICND.2018.8539753⟩مصطلحات موضوعية: DNA detection, SOI, Work (thermodynamics), Materials science, [SDV.BIO]Life Sciences [q-bio]/Biotechnology, business.industry, 010401 analytical chemistry, Field effect, Silicon on insulator, Charge (physics), 02 engineering and technology, 021001 nanoscience & nanotechnology, 01 natural sciences, Fluorescence, 0104 chemical sciences, Threshold voltage, ψ-MOSFET, MOSFET, Optoelectronics, field-effect, Sensitivity (control systems), [SPI.NANO]Engineering Sciences [physics]/Micro and nanotechnologies/Microelectronics, 0210 nano-technology, business, surface functionalization
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::16d7d0583f5d7f13ded87be976ef86a6
https://hal.science/hal-02007655 -
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المؤلفون: Davide Bucci, X. Mescot, I. Ionica, Maryline Bawedin, Licinius Benea, Miltiadis Alepidis
المساهمون: Institut de Microélectronique, Electromagnétisme et Photonique - Laboratoire d'Hyperfréquences et Caractérisation (IMEP-LAHC), Université Savoie Mont Blanc (USMB [Université de Savoie] [Université de Chambéry])-Centre National de la Recherche Scientifique (CNRS)-Université Grenoble Alpes (UGA)-Institut polytechnique de Grenoble - Grenoble Institute of Technology (Grenoble INP ), Université Grenoble Alpes (UGA)
المصدر: Solid-State Electronics
Solid-State Electronics, Elsevier, 2020, 168, pp.107721. ⟨10.1016/j.sse.2019.107721⟩مصطلحات موضوعية: Work (thermodynamics), Materials science, Silicon, chemistry.chemical_element, Silicon on insulator, Hardware_PERFORMANCEANDRELIABILITY, 02 engineering and technology, 01 natural sciences, 0103 physical sciences, MOSFET, Hardware_INTEGRATEDCIRCUITS, Materials Chemistry, Wafer, [SPI.NANO]Engineering Sciences [physics]/Micro and nanotechnologies/Microelectronics, Electrical and Electronic Engineering, Ohmic contact, 010302 applied physics, Mechanics, 021001 nanoscience & nanotechnology, Condensed Matter Physics, [SPI.TRON]Engineering Sciences [physics]/Electronics, Electronic, Optical and Magnetic Materials, chemistry, Transient (oscillation), 0210 nano-technology, Voltage
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المؤلفون: Licinius Benea, Maryline Bawedin, Cécile Delacour, Sorin Cristoloveanu, T. Cerba, I. Ionica
المساهمون: Institut de Microélectronique, Electromagnétisme et Photonique - Laboratoire d'Hyperfréquences et Caractérisation (IMEP-LAHC ), Institut polytechnique de Grenoble - Grenoble Institute of Technology (Grenoble INP )-Université Savoie Mont Blanc (USMB [Université de Savoie] [Université de Chambéry])-Centre National de la Recherche Scientifique (CNRS)-Université Grenoble Alpes [2016-2019] (UGA [2016-2019]), Laboratoire des technologies de la microélectronique (LTM ), Commissariat à l'énergie atomique et aux énergies alternatives (CEA)-Centre National de la Recherche Scientifique (CNRS)-Université Grenoble Alpes [2016-2019] (UGA [2016-2019]), Thermodynamique et biophysique des petits systèmes (TPS), Institut Néel (NEEL), Institut polytechnique de Grenoble - Grenoble Institute of Technology (Grenoble INP )-Centre National de la Recherche Scientifique (CNRS)-Université Grenoble Alpes [2016-2019] (UGA [2016-2019])-Institut polytechnique de Grenoble - Grenoble Institute of Technology (Grenoble INP )-Centre National de la Recherche Scientifique (CNRS)-Université Grenoble Alpes [2016-2019] (UGA [2016-2019]), AGIR-POLE CLEPS, ANR-10-LABX-0055,MINOS Lab,Minatec Novel Devices Scaling Laboratory(2010), European Project: 662175,H2020,ECSEL-2014-2,WAYTOGO FAST(2015), European Project: 687931,H2020,H2020-ICT-2015,REMINDER(2016), Thermodynamique et biophysique des petits systèmes (NEEL - TPS)
المصدر: 2018 EUROSOI-ULIS Proceedings
2018 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EUROSOI-ULIS)
2018 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EUROSOI-ULIS), Mar 2018, Granada, Spain. pp.141-144, ⟨10.1109/ULIS.2018.8354754⟩مصطلحات موضوعية: 010302 applied physics, SOI, [PHYS]Physics [physics], Materials science, Condensed matter physics, Silicon, nanoindentation, chemistry.chemical_element, Ψ-MOSFET, 02 engineering and technology, Nanoindentation, 021001 nanoscience & nanotechnology, 01 natural sciences, law.invention, metal-semiconductor contact, Pressure measurement, Electrical transport, chemistry, law, 0103 physical sciences, MOSFET, field-effect, [SPI.NANO]Engineering Sciences [physics]/Micro and nanotechnologies/Microelectronics, 0210 nano-technology, Drain current
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::b962f9a95bc2ebb13ce0132622e04d70
https://hal.univ-grenoble-alpes.fr/hal-01948053 -
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المؤلفون: S. Cristoloveanu, Shingo Sato, Licinius Benea, Yasuhisa Omura, Gerard Ghibaudo
المساهمون: Institut de Microélectronique, Electromagnétisme et Photonique - Laboratoire d'Hyperfréquences et Caractérisation (IMEP-LAHC ), Institut polytechnique de Grenoble - Grenoble Institute of Technology (Grenoble INP )-Université Savoie Mont Blanc (USMB [Université de Savoie] [Université de Chambéry])-Centre National de la Recherche Scientifique (CNRS)-Université Grenoble Alpes [2016-2019] (UGA [2016-2019]), Kansai University
المصدر: 2018 EUROSOI-ULIS Proceedings
2018 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EUROSOI-ULIS)
2018 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EUROSOI-ULIS), Mar 2018, Granada, Spain. pp.221-224, ⟨10.1109/ULIS.2018.8354774⟩مصطلحات موضوعية: 010302 applied physics, Materials science, Admittance, business.industry, contact resistance, Contact resistance, Silicon on insulator, 02 engineering and technology, 021001 nanoscience & nanotechnology, 01 natural sciences, Capacitance, pseudo-MOSFET, Frequency domain, split-CV, 0103 physical sciences, MOSFET, impedance, Optoelectronics, Wafer, [SPI.NANO]Engineering Sciences [physics]/Micro and nanotechnologies/Microelectronics, 0210 nano-technology, business, Electrical impedance
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::bcca62bc22e6e913f243c64901bf0187
https://hal.archives-ouvertes.fr/hal-02007662 -
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المؤلفون: Médéric Vindret, Licinius Benea, Irina Ionica, Cécile Delacour, Pascal Xavier, Jean Martins, Dominique Rauly, Eric Chamberod
المساهمون: XAVIER, Pascal, Institut de Microélectronique, Electromagnétisme et Photonique - Laboratoire d'Hyperfréquences et Caractérisation (IMEP-LAHC ), Institut polytechnique de Grenoble - Grenoble Institute of Technology (Grenoble INP )-Université Savoie Mont Blanc (USMB [Université de Savoie] [Université de Chambéry])-Centre National de la Recherche Scientifique (CNRS)-Université Grenoble Alpes [2016-2019] (UGA [2016-2019]), Thermodynamique et biophysique des petits systèmes (TPS), Institut Néel (NEEL), Institut polytechnique de Grenoble - Grenoble Institute of Technology (Grenoble INP )-Centre National de la Recherche Scientifique (CNRS)-Université Grenoble Alpes [2016-2019] (UGA [2016-2019])-Institut polytechnique de Grenoble - Grenoble Institute of Technology (Grenoble INP )-Centre National de la Recherche Scientifique (CNRS)-Université Grenoble Alpes [2016-2019] (UGA [2016-2019]), Institut des Géosciences de l’Environnement (IGE), Institut national des sciences de l'Univers (INSU - CNRS)-Centre National de la Recherche Scientifique (CNRS)-Institut polytechnique de Grenoble - Grenoble Institute of Technology (Grenoble INP )-Institut de Recherche pour le Développement (IRD)-Université Grenoble Alpes [2016-2019] (UGA [2016-2019]), IUT de Grenoble, Université Joseph Fourier - Grenoble 1 (UJF), Nanonets2Sense
المصدر: HAL
International Workshop on Semi-conducting Nanomaterials for Health, Environment and Security Applications
International Workshop on Semi-conducting Nanomaterials for Health, Environment and Security Applications, Nanonets2Sense, Nov 2018, Grenoble, Franceمصطلحات موضوعية: [SPI.NANO] Engineering Sciences [physics]/Micro and nanotechnologies/Microelectronics, [SPI.NANO]Engineering Sciences [physics]/Micro and nanotechnologies/Microelectronics, [SPI.TRON] Engineering Sciences [physics]/Electronics, [SPI.TRON]Engineering Sciences [physics]/Electronics
URL الوصول: https://explore.openaire.eu/search/publication?articleId=dedup_wf_001::f2fdceca377f6373ee794616b74ab535
https://hal.archives-ouvertes.fr/hal-02016817 -
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المساهمون: Institut de Microélectronique, Electromagnétisme et Photonique - Laboratoire d'Hyperfréquences et Caractérisation (IMEP-LAHC ), Institut polytechnique de Grenoble - Grenoble Institute of Technology (Grenoble INP )-Université Savoie Mont Blanc (USMB [Université de Savoie] [Université de Chambéry])-Centre National de la Recherche Scientifique (CNRS)-Université Grenoble Alpes [2016-2019] (UGA [2016-2019]), Thermodynamique et biophysique des petits systèmes (TPS), Institut Néel (NEEL), Institut polytechnique de Grenoble - Grenoble Institute of Technology (Grenoble INP )-Centre National de la Recherche Scientifique (CNRS)-Université Grenoble Alpes [2016-2019] (UGA [2016-2019])-Institut polytechnique de Grenoble - Grenoble Institute of Technology (Grenoble INP )-Centre National de la Recherche Scientifique (CNRS)-Université Grenoble Alpes [2016-2019] (UGA [2016-2019])
المصدر: 2017 EUROSOI-ULIS Proceedings
2017 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EUROSOI-ULIS)
2017 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EUROSOI-ULIS), Apr 2017, Athens, Greece. pp.19-22, ⟨10.1109/ULIS.2017.7962590⟩مصطلحات موضوعية: Materials science, [SDV.BIO]Life Sciences [q-bio]/Biotechnology, Silicon on insulator, Field effect, Nanotechnology, 02 engineering and technology, Hardware_PERFORMANCEANDRELIABILITY, 7. Clean energy, 01 natural sciences, body potential, 0103 physical sciences, MOSFET, Hardware_INTEGRATEDCIRCUITS, Wafer, field-effect, Surface charge, Sensitivity (control systems), [SPI.NANO]Engineering Sciences [physics]/Micro and nanotechnologies/Microelectronics, 010302 applied physics, SOI, business.industry, Ψ-MOSFET, 021001 nanoscience & nanotechnology, Optoelectronics, biochemical sensor, Electric potential, 0210 nano-technology, business, Biosensor
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المؤلفون: M L Benea, Licinius Benea
المصدر: IOP Conference Series: Materials Science and Engineering. 85:012004
مصطلحات موضوعية: Materials science, Metallurgy, chemistry.chemical_element, Substrate (electronics), Tungsten, engineering.material, law.invention, chemistry, Optical microscope, Coating, law, Vickers hardness test, Ultimate tensile strength, engineering, Deposition (law), Electrochemical potential