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1مؤتمر
المؤلفون: Maszara, W.P., Lin, M.-R.
المصدر: 2013 Proceedings of the ESSCIRC (ESSCIRC) ESSCIRC (ESSCIRC), 2013 Proceedings of the. :3-8 Sep, 2013
Relation: ESSCIRC 2013 - 39th European Solid State Circuits Conference
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2مؤتمر
المؤلفون: Maszara, W. P., Lin, M.-R.
المصدر: 2013 Proceedings of the European Solid-State Device Research Conference (ESSDERC) Solid-State Device Research Conference (ESSDERC), 2013 Proceedings of the European. :3-8 Sep, 2013
Relation: ESSDERC 2013 - 43rd European Solid State Device Research Conference
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3دورية أكاديمية
المؤلفون: Yu, W.-Y.Aff1, Aff2, Hwang, H.-F., Chen, C.-Y., Lin, M.-R.Aff2, IDs0019802005799x_cor4
المصدر: Osteoporosis International: With other metabolic bone diseases. 32(6):1061-1070
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4مؤتمر
المؤلفون: Krivokapic, Z., Krishnamohan, T., Halliyal, A., Jafarpour, A., Cherian, S., Holbrook, A., Zheng, W., Randolph, A., Lin, M.-R.
المصدر: Digest. International Electron Devices Meeting, Electron devices meeting Electron Devices Meeting, 2002. IEDM '02. International. :185-188 2002
Relation: IEEE International Electron Devices Meeting
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5مؤتمر
المؤلفون: Krivokapic, Z., Maszara, W., Achutan, K., King, P., Gray, J., Sidorow, M., Zhao, E., Zhang, J., Chan, J., Marathe, A., Lin, M.-R.
المصدر: Digest. International Electron Devices Meeting, Electron devices meeting Electron Devices Meeting, 2002. IEDM '02. International. :271-274 2002
Relation: IEEE International Electron Devices Meeting
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6مؤتمر
المؤلفون: Maszara, W.P., Krivokapic, Z., King, P., Goo, J.-S., Lin, M.-R.
المصدر: Digest. International Electron Devices Meeting, Electron devices meeting Electron Devices Meeting, 2002. IEDM '02. International. :367-370 2002
Relation: IEEE International Electron Devices Meeting
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7مؤتمر
المؤلفون: Zhang, J., Zhao, E., Xiang, Q., Chan, J., Jeon, J., Goo, J.-S., Marathe, A., Ogle, B., Lin, M.-R., Taylor, K.
المصدر: IEEE International Integrated Reliability Workshop Final Report, 2002. Integrated reliability Integrated Reliability Workshop Final Report, 2002. IEEE International. :92-95 2002
Relation: IEEE International Integrated Reliability Workshop
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8مؤتمر
المؤلفون: Xiang, Q., Wu, Y., Lin, M.-R.
المصدر: 29th European Solid-State Device Research Conference Solid-State Device Research Conference, 1999. Proceeding of the 29th European. 1:352-355 1999
Relation: 29th European Solid-State Device Research Conference
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9مؤتمر
المؤلفون: Xiang, Q., Martin, D., Yu, B., Yeap, G.C.-F., Lin, M.-R.
المصدر: 29th European Solid-State Device Research Conference Solid-State Device Research Conference, 1999. Proceeding of the 29th European. 1:564-567 1999
Relation: 29th European Solid-State Device Research Conference
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10مؤتمر
المؤلفون: Li, E., Rosenbaum, E., Tao, J., Yeap, G.C.-F., Lin, M.-R., Fang, P.
المصدر: 1999 IEEE International Reliability Physics Symposium Proceedings. 37th Annual (Cat. No.99CH36296) Reliability physics Reliability Physics Symposium Proceedings, 1999. 37th Annual. 1999 IEEE International. :253-258 1999
Relation: 1999 IEEE International Reliability Physics Symposium Proceedings. 37th Annual
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