المؤلفون: Chang, H.K., Huang, H.Y., Lo, T.Y, Lee, S.K., Yang, K.W., Tang, C.L., Liu, Gary, Wu, C.T., Lin, M.H., Chu, W.C., Kuo, T.J., Fu, S.K., Tien, H.W., Tsai, C.H., Wei, Megan, Chen, H.P., Lee, M.H., Lu, C.W., Shue, Winston S., Cao, Min

المصدر: 2023 IEEE International Interconnect Technology Conference (IITC) and IEEE Materials for Advanced Metallization Conference (MAM)(IITC/MAM) Advanced Metallization Conference (MAM)(IITC/MAM), 2023 IEEE International Interconnect Technology Conference (IITC) and IEEE Materials for. :1-4 May, 2023

Relation: 2023 IEEE International Interconnect Technology Conference (IITC) and IEEE Materials for Advanced Metallization Conference (MAM)(IITC/MAM)

المؤلفون: Lin, Y.H., Lee, C.C., Liao, C.Y., Lin, M.H., Tu, W. C., Chen, Robin, Chen, H.P., Shue, Winston S., Cao, Min

المصدر: 2023 IEEE International Reliability Physics Symposium (IRPS) Reliability Physics Symposium (IRPS), 2023 IEEE International. :1-4 Mar, 2023

Relation: 2023 IEEE International Reliability Physics Symposium (IRPS)

المؤلفون: Lin, M.H., Lo, C.C.

المصدر: 2005 9th IFIP/IEEE International Symposium on Integrated Network Management, 2005. IM 2005. Integrated network management Integrated Network Management, 2005. IM 2005. 2005 9th IFIP/IEEE International Symposium on. :339-352 2005

Relation: 2005 9th IFIP/IEEE International Symposium on Integrated Network Management

المؤلفون: Lin, M.H., Lin, Y.L., Yang, G.S., Yeh, M.-S., Chang, K.P., Su, K.C., Tahui Wang

المصدر: Proceedings of the 11th International Symposium on the Physical and Failure Analysis of Integrated Circuits. IPFA 2004 (IEEE Cat. No.04TH8743) Physical and failure analysis of integrated circuits Physical and Failure Analysis of Integrated Circuits, 2004. IPFA 2004. Proceedings of the 11th International Symposium on the. :177-180 2004

Relation: Proceedings of the 11th International Symposium on the Physical and Failure Analysis of Integrated Circuits. IPFA 2004

المؤلفون: Lin, M.H., Lin, Y.L., Chen, J.M., Tsai, C.C., Yeh, M.-S., Liu, C.C., Hsu, S., Wang, C.H., Sheng, Y.C., Chang, K.P., Su, K.C., Chang, Y.J., Tahui Wang

المصدر: 2004 IEEE International Reliability Physics Symposium. Proceedings Reliability physics Reliability Physics Symposium Proceedings, 2004. 42nd Annual. 2004 IEEE International. :229-233 2004

Relation: 2004 IEEE International Reliability Physics Symposium. Proceedings

المؤلفون: Lin, M.H., Yang, G.S., Lin, Y.L., Lin, M.T., Lin, C.C., Yeh, M.S., Chang, K.P., Su, K.C., Chen, J.K., Chang, Y.J., Tahui Wang

المصدر: IEEE International Integrated Reliability Workshop Final Report, 2002. Integrated reliability Integrated Reliability Workshop Final Report, 2002. IEEE International. :50-54 2002

Relation: IEEE International Integrated Reliability Workshop

المؤلفون: Chen, Y.F., Lin, M.H., Chou, C.H., Chang, W.C., Huang, S.C., Chang, Y.J., Fu, K.Y., Lee, M.T., Liu, C.H., Fan, S.K.

المصدر: 2000 IEEE International Integrated Reliability Workshop Final Report (Cat. No.00TH8515) Integrated reliability workshop Integrated Reliability Workshop Final Report, 2000 IEEE International. :98-101 2000

Relation: 2000 IEEE International Integrated Reliability Workshop Final Report

المؤلفون: Lin, M.H.

المصدر: Proceedings of the Seventh IEEE International Conference on Computer Vision Computer vision Computer Vision, 1999. The Proceedings of the Seventh IEEE International Conference on. 1:648-653 vol.1 1999

Relation: Proceedings of the Seventh IEEE International Conference on Computer Vision

المؤلفون: Lin, M.H., Lin, Y.L., Chen, J.M., Yeh, M.-S., Chang, K.P., Su, K.C., Tahui Wang

المصدر: IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 52(12):2602-2608 Dec, 2005

المؤلفون: Lin, M.H., Tomasi, C.

المصدر: IEEE Transactions on Pattern Analysis and Machine Intelligence IEEE Trans. Pattern Anal. Mach. Intell. Pattern Analysis and Machine Intelligence, IEEE Transactions on. 26(8):1073-1078 Aug, 2004