المؤلفون: Lee, Tsung-En, Chiang, Hung-Li, Chang, Chih-Yu, Su, Yuan-Chun, Chang, Shu-Jui, Wu, Jui-Jen, Lin, Bo-Jiun, Wang, Jer-Fu, Haw, Shu-Chih, Chiu, Shang-Jui, Ching, He-Liang, Lin, Yan-Gu, Yun, Wei-Sheng, Hsu, Chen-Feng, Lee, Hengyuan, Lee, Tung-Ying, Passlack, Matthias, Cheng, Chao-Ching, Chang, Chih-Sheng, Wong, H.-S. Philip, Chang, Wen-Hao, Chang, Meng-Fan, Lin, Yu-Ming, Radu, Iuliana P.

المصدر: 2023 International Electron Devices Meeting (IEDM) Electron Devices Meeting (IEDM), 2023 International. :1-4 Dec, 2023

Relation: 2023 International Electron Devices Meeting (IEDM)

المؤلفون: Liang, Yan-Kui, Zheng, Jun-Yang, Lin, Yu-Lon, Chen, Yu, Chen, Kuan-Lun, Hsieh, Dong-Ru, Peng, Li-Chi, Chiu, Ching-Hua, Lu, Yu-Chcng, Chou, Tsung-Te, Kei, Chi-Chung, Lu, Chun-Chieh, Huang, Huai-Ying, Lin, Yu-Ming, Tseng, Yuan-Chieh, Chao, Tien-Sheng, Chang, Edward Yi, Lin, Chun-Hsiung

المصدر: 2023 International Electron Devices Meeting (IEDM) Electron Devices Meeting (IEDM), 2023 International. :1-4 Dec, 2023

Relation: 2023 International Electron Devices Meeting (IEDM)

المؤلفون: Liang, Yan-Kui, Zheng, June-Yang, Lin, Jing-Wei, Hua, Yi Miao, Chou, Tsung-Te, Lu, Chun-Chieh, Huang, Huai-Ying, Lin, Yu-Ming, Kei, Chi-Chung, Chang, Edward-Yi, Lin, Chun-Hsiung

المصدر: 2023 7th IEEE Electron Devices Technology & Manufacturing Conference (EDTM) Electron Devices Technology & Manufacturing Conference (EDTM), 2023 7th IEEE. :1-3 Mar, 2023

Relation: 2023 7th IEEE Electron Devices Technology & Manufacturing Conference (EDTM)

المؤلفون: Su, Li, Chang, Chen-Chieh, Lin, Yu-Ming, Lu, Li-Chun, Liu, Yi-Wen, Bai, Ming-Sian, Chern, Chyh-Hong

مصطلحات موضوعية: Physics - Classical Physics, Physics - Applied Physics

URL الوصول: http://arxiv.org/abs/2210.08920

المؤلفون: Chang, Yu-Hsun, Lin, Yu-Ming, Lee, Cheng-Yu, Hsu, Pei-Chia, Chen, Chih-Ming, Ho, Cheng-En

المصدر: In Journal of Materials Research and Technology July-August 2024 31:1008-1016

المؤلفون: Passlack, Matthias, Tasneem, Nujhat, Park, Chinsung, Ravindran, Prasanna Venkat, Chen, Hang, Das, Dipjyoti, Yu, Shimeng, Chen, Edward, Wang, Jer-Fu, Chang, Chih-Sheng, Lin, Yu-Ming, Radu, Iuliana, Khan, Asif

المصدر: Journal of Applied Physics; 4/7/2024, Vol. 135 Issue 13, p1-9, 9p

مصطلحات موضوعية: THRESHOLD voltage, TRANSISTORS, METAL semiconductor field-effect transistors, SILICON, METAL oxide semiconductor field-effect transistors

المؤلفون: Huang, Mei-Chu, Chao, Yu-Wei, Lin, Yu-Ming, Wu, Bing-Syuan, Chou, Chun-Ting, Chen, Hong-Sing, Tsai, Cheng-Che

المصدر: In Tetrahedron Letters 19 September 2024 148

المؤلفون: Lu, Li-Shin, Lin, Yu-Ming, Chen, Chao-Chang A.

المصدر: 2018 IEEE International Conference on Advanced Manufacturing (ICAM) Advanced Manufacturing (ICAM), 2018 IEEE International Conference on. :127-130 Nov, 2018

Relation: 2018 IEEE International Conference on Advanced Manufacturing (ICAM)

المؤلفون: Lin, Yu-Ming, Wu, Hung-Wei, Tai, Tzu-Chun, Hung, Cheng-Yuan, Chang, Shoou-Jinn, Wang, Yeong-Her

المصدر: 2018 IEEE/MTT-S International Microwave Symposium - IMS Microwave Symposium - IMS, 2018 IEEE/MTT-S International. :359-362 Jun, 2018

Relation: 2018 IEEE/MTT-S International Microwave Symposium - IMS 2018

المؤلفون: Tai, Tzu-Chun, Wu, Hung-Wei, Lin, Yu-Ming, Wang, Sin-Pei, Wang, Yeong-Her, Chang, Shoou-Jinn

المصدر: 2018 IEEE/MTT-S International Microwave Symposium - IMS Microwave Symposium - IMS, 2018 IEEE/MTT-S International. :1385-1388 Jun, 2018

Relation: 2018 IEEE/MTT-S International Microwave Symposium - IMS 2018