المؤلفون: Ling Kuey Yang, Mei Ying Hsiao, Yi Heng Chen

المصدر: Proceedings of the 21th International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA).

مصطلحات موضوعية: Flash (photography), Identification (information), Materials science, Electronic engineering, NAND gate, Reliability (statistics), Reliability engineering

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::a7fab3391f0e29ff7794df6be053f248
https://doi.org/10.1109/ipfa.2014.6898130

المؤلفون: Hsin-Heng Wang, Chiu-Tsung Huang, Shin-Hsien Chen, Kuo, R., Sophia Liu, Ling-Kuey Yang, Houng-Chi Wei, Pittikoun, S., Shirota, R., Chin-chen Cho

المصدر: 2008 International Symposium on VLSI Technology, Systems & Applications (VLSI-TSA); 2008, p87-88, 2p