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1دورية أكاديمية
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المؤلفون: Linjun Cao, Feiran Dong, Yongzhen Xie
المصدر: Sustainability
Volume 11
Issue 18
Sustainability, Vol 11, Iss 18, p 4826 (2019)مصطلحات موضوعية: Micro level, Geography, Planning and Development, TJ807-830, Relational contract, Management, Monitoring, Policy and Law, TD194-195, board power hierarchy, Renewable energy sources, Power (social and political), green governance performance, 0502 economics and business, Macro level, GE1-350, Industrial organization, Hierarchy, 050208 finance, Environmental effects of industries and plants, Renewable Energy, Sustainability and the Environment, Corporate governance, 05 social sciences, Building and Construction, Environmental sciences, corporate mission, Power structure, Business, green governance conducts, 050203 business & management, Mechanism (sociology)
وصف الملف: application/pdf
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المؤلفون: Paul S. Ho, Laura Spinella, Linjun Cao, Szu-Tung Hu
المصدر: 2018 IEEE International Electron Devices Meeting (IEDM).
مصطلحات موضوعية: 010302 applied physics, Materials science, Condensed matter physics, Monte Carlo method, 02 engineering and technology, 021001 nanoscience & nanotechnology, Energy minimization, Microstructure, 01 natural sciences, Laser linewidth, Grain growth, Electrical resistivity and conductivity, 0103 physical sciences, Precession, Grain boundary, 0210 nano-technology
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::be47b4a6a15685205ff5ae67590ecb5c
https://doi.org/10.1109/iedm.2018.8614547 -
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المؤلفون: Ashwini Chandrashekar, Jinping Liu, Bharat Krishnan, M. Gribelyuk, A. Zainuddin, Kassim Joseph K, T. J. Tang, Zhiguo Sun, J. Yang, Eswar Ramanathan, Shishir Ray, Ritesh Ray Chaudhuri, Tian Shen, Jay Mody, Huang Liu, Anbu Selvam Km Mahalingam, Kong Boon Yeap, Linjun Cao, Rinus T. P. Lee, Ryan Sporer, D. Damjanovic, N. Petrov
المصدر: 2018 IEEE Symposium on VLSI Technology.
مصطلحات موضوعية: Interconnection, Materials science, business.industry, Annealing (metallurgy), Dielectric, Nanosecond, Laser, Capacitance, law.invention, Grain growth, law, Optoelectronics, Nanosecond laser, business
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::0dd407cc68abf63f0ac888a120bb66aa
https://doi.org/10.1109/vlsit.2018.8510651 -
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المؤلفون: Laura Spinella, Paul S. Ho, Szu-Tung Hu, Linjun Cao
المصدر: 2018 IEEE International Interconnect Technology Conference (IITC).
مصطلحات موضوعية: Materials science, Reliability (semiconductor), business.industry, Microelectronics, Node (circuits), RC time constant, business, Microstructure, Electromigration, Scaling, Engineering physics, Manufacturing cost
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::cda43202ef6694c3d282700eff7e68ec
https://doi.org/10.1109/iitc.2018.8430393 -
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المؤلفون: Haojun Zhang, Tian Shen, Ronald G. Filippi, Linjun Cao, Bianzhu Fu, Kong Boon Yeap, Seungman Choi, Cathryn Christiansen, Patrick Justison, James Zhang, Sean P. Ogden
المصدر: IRPS
مصطلحات موضوعية: 010302 applied physics, Materials science, Drift velocity, Condensed matter physics, 02 engineering and technology, 021001 nanoscience & nanotechnology, Kinetic energy, 01 natural sciences, Electromigration, Grain size, Metal, Back end of line, visual_art, Computer Science::Multimedia, 0103 physical sciences, visual_art.visual_art_medium, Grain boundary diffusion coefficient, 0210 nano-technology, Line (formation)
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::f339b2b92ceef48dc5396572ea2db08f
https://doi.org/10.1109/irps.2018.8353600 -
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المؤلفون: Manjunatha Prabhu, C.S. Premachandran, Daniel Smith, Rakesh Ranjan, S. Cimino, Zhuo-Jie George Wu, Linjun Cao, Patrick Justison, Walter Yao, Sean Ogdan, Luke England, Sukesh Kannan
المصدر: 2018 IEEE 2nd Electron Devices Technology and Manufacturing Conference (EDTM).
مصطلحات موضوعية: Back end of line, Electrostatic discharge, Materials science, business.industry, Stress migration, Gate dielectric, Breakdown voltage, Optoelectronics, Time-dependent gate oxide breakdown, Front end of line, business, Hot-carrier injection
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::283bd355708559543b68c29509c6595a
https://doi.org/10.1109/edtm.2018.8421432 -
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المؤلفون: Dhruv Singh, A. Gassaria, V. Chauhan, A. da Silva, P. Lindo, Daniel J. Dechene, M. Gribelyuk, I. Ahsan, M. Hasan, Judson R. Holt, Rod Augur, Jaeger Daniel, G. Northrop, G. Gomba, Ghosh Somnath, H. Narisetty, Basanth Jagannathan, Ting-Hsiang Hung, P. Liu, Y. Zhong, T. Gordon, Y. Fan, C. Schiller, A. Blauberg, O. Patterson, B. Morganfeld, Andres Bryant, J. Choo, T. Nigam, B. Senapati, V. Sardesai, N. Baliga, C. An, I. Ramirez, Rishikesh Krishnan, Arkadiusz Malinowski, S. Lucarini, Z. Sun, Sadanand V. Deshpande, R. Bhelkar, Mahender Kumar, Kong Boon Yeap, D. Conklin, Q. Fang, R. Gauthier, Purushothaman Srinivasan, S. Crown, M. Ozbek, Linjun Cao, G. Han, Z. Song, L. Huang, C. Serrau, R. Sweeney, M. Tan, Keith Donegan, Souvick Mitra, A. Zainuddin, P. Agnello, Balasubramanian S. Haran, Haifeng Sheng, B. Greene, A. Hassan, Tabakman Keith, Xin Wang, Sanjay Parihar, L. Cheng, M. Lagus, Jessica Dechene, D. Xu, G. Gifford, M. Zhao, Jeyaraj Antony Johnson, Y. Yan, Rick Carter, Manoj Joshi, W. Kim, Gabriela Dilliway, Jack M. Higman, S. Kalaga, Kai Zhao, Jinping Liu, A. Ogino, M. Lipinski, Amanda L. Tessier, Garo Jacques Derderian, S. Madisetti, N. Shah, Christopher Ordonio, M. Aminpur, Rakesh Ranjan, S. Saudari, Christa Montgomery, Tony Tae-Hyoung Kim, Jeric Sarad, Jae Gon Lee, Bharat Krishnan, Joseph F. Shepard, L. Hu, J. Sporre, Akil K. Sutton, Eswar Ramanathan, Cathryn Christiansen, J.H. Han, J. Lemon, Patrick Justison, Natalia Borjemscaia, Scott C. Johnson, B. Cohen, Kan Zhang, Srikanth Samavedam, G. Xu, T. Xuan, Unoh Kwon, C. Meng, Katsunori Onishi, Y. Shi, C. Huang, R. Coleman, Manfred Eller, Shreesh Narasimha, B. Kannan, J. Yang, Vivek Joshi, W. Ma, Christopher D. Sheraw, A. K. M. Mahalingam, Craig Child, E. Woodard, Tao Chu, Y. Jin, D. K. Sohn, Hasan M. Nayfeh, Mary Claire Silvestre, M. Lingalugari, G. Biery, Tian Shen, Carl J. Radens, E. Kaste, C-H. Lin, K. Han, K. Anil, Ankur Arya, Mehta Jaladhi, Jia Zeng, S.L. Liew, Michael V. Aquilino, M. Yu, M. Chen, Rohit Pal, E. Maciejewski, Stephan Grunow, Robert Fox, Rinus T. P. Lee
المصدر: 2017 IEEE International Electron Devices Meeting (IEDM).
مصطلحات موضوعية: 010302 applied physics, Computer science, Extreme ultraviolet lithography, Process (computing), 02 engineering and technology, 021001 nanoscience & nanotechnology, Low voltage sram, 01 natural sciences, Capacitance, CMOS, Computer architecture, Logic gate, 0103 physical sciences, Leverage (statistics), 0210 nano-technology, Immersion lithography
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::5545f519d7dcbb19a8a64d95e77053fd
https://doi.org/10.1109/iedm.2017.8268476 -
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المؤلفون: Ram Asra, Francis Benistant, Haojun Zhang, Edmund Banghart, Linjun Cao, Shesh Mani Pandey, Pei Zhao, Manfred Eller, Kenta Yamada, Pala Balasubramaniam, Xiaoli He, Srikanth Samavedam, Vinayak Mahajan, Manoj Joshi, Baofu Zhu
المصدر: 2017 Symposium on VLSI Technology.
مصطلحات موضوعية: 010302 applied physics, Materials science, business.industry, Stress induced, 02 engineering and technology, Dielectric, 01 natural sciences, 020202 computer hardware & architecture, Logic gate, 0103 physical sciences, 0202 electrical engineering, electronic engineering, information engineering, Electronic engineering, Optoelectronics, business
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::d1c082b227235676664442426f3c9a99
https://doi.org/10.23919/vlsit.2017.7998182 -
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المؤلفون: Linjun Cao, Jian-Hsing Lee, Natarajan Mahadeva Iyer, Haojun Zhang
المصدر: 2017 IEEE Electron Devices Technology and Manufacturing Conference (EDTM).
مصطلحات موضوعية: 010302 applied physics, Physics, Interconnection, Current distribution, 020208 electrical & electronic engineering, Operating frequency, Analytical equations, 02 engineering and technology, Function (mathematics), 01 natural sciences, Computer Science::Hardware Architecture, CMOS, 0103 physical sciences, 0202 electrical engineering, electronic engineering, information engineering, Electronic engineering, Current (fluid), Current density
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::dd0badd71e3e7b1a6eea5678411a3e7c
https://doi.org/10.1109/edtm.2017.7947499