المؤلفون: Liou, J. G.

المساهمون: Corona, Juan C., Tsujimori, T.

وصف الملف: text

الإتاحة: https://www.accessscience.com/content/article/a291100

المؤلفون: Chen, M. -C, Chen, C. -H, Wang, J. -C, Tsai, A. -C, Liou, J. -P^{Aff3, IDs41419024067944_cor5}, Pan, S. -L^{Aff2, IDs41419024067944_cor6}, Teng, C. -M^{Aff1, IDs41419024067944_cor7}

المصدر: Cell Death & Disease. 15(7)

المؤلفون: Zhang, Z., Lin, B., Wu, C.G., Hsieh, T., Liou, J., Li, Y., Peng, C.

المصدر: IEEE Transactions on Neural Systems and Rehabilitation Engineering IEEE Trans. Neural Syst. Rehabil. Eng. Neural Systems and Rehabilitation Engineering, IEEE Transactions on. 30:1483-1493 2022

المؤلفون: Behrman, K., Zhu, Z., Sun, T., Cavallari, M., Li, H., Sundaram, K., Liou, J., Kymissis, I.

المصدر: IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 68(9):4630-4636 Sep, 2021

المؤلفون: Alesbrook, L.S., Burchell, M.J., Cornwell, L.T., Corsaro, R.D., Giovane, F., Liou, J.-C., Tandy, J., Wozniakiewicz, P.J.

المصدر: In International Journal of Impact Engineering May 2024 187

المؤلفون: Liou, J. J.

المصدر: 2017 IEEE 12th International Conference on ASIC (ASICON) ASIC (ASICON), 2017 IEEE 12th International Conference on. :XXII-XXVI Oct, 2017

Relation: 2017 IEEE 12th International Conference on ASIC (ASICON)

المؤلفون: Chen, S., Lian, S., Wu, T.R., Chang, T., Liou, J., Lu, D.D., Kao, K., Chen, N., Lee, W., Tsai, J.

المصدر: IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 66(6):2509-2512 Jun, 2019

المؤلفون: Cornwell, L.T., Wozniakiewicz, P.J., Burchell, M.J., Alesbrook, L.S., Corsaro, R.D., Giovane, F., Liou, J.-C.

المصدر: In Advances in Space Research 1 October 2023 72(7):2959-2970

المؤلفون: Wong, Hei, Liou, J. J., Wei, R. H.

المصدر: 2019 8th International Symposium on Next Generation Electronics (ISNE) Next Generation Electronics (ISNE), 2019 8th International Symposium on. :1-2 Oct, 2019

Relation: 2019 8th International Symposium on Next Generation Electronics (ISNE)

المؤلفون: Liou, J.-J., Hsieh, M.-T., Cherng, J.-F., Chen, H.H.

المصدر: 2015 IFIP/IEEE International Conference on Very Large Scale Integration (VLSI-SoC) Very Large Scale Integration (VLSI-SoC), 2015 IFIP/IEEE International Conference on. :177-182 Oct, 2015

Relation: 2015 IFIP/IEEE International Conference on Very Large Scale Integration (VLSI-SoC)