المؤلفون: Wang, S., Hu, Y., Burgues, J., Marco, S., Liu, S.-C.

المصدر: 2020 2nd IEEE International Conference on Artificial Intelligence Circuits and Systems (AICAS) Artificial Intelligence Circuits and Systems (AICAS), 2020 2nd IEEE International Conference on. :178-182 Aug, 2020

Relation: 2020 2nd IEEE International Conference on Artificial Intelligence Circuits and Systems (AICAS)

المؤلفون: Kiselev, I., Ceolini, E., Wong, D., De Cheveigne, A., Liu, S.-C.

المصدر: 2017 IEEE 42nd Conference on Local Computer Networks Workshops (LCN Workshops) LCN-WORKSHOPS Local Computer Networks Workshops (LCN Workshops), 2017 IEEE 42nd Conference on. :35-43 Oct, 2017

Relation: 2017 IEEE 42nd Conference on Local Computer Networks Workshops (LCN Workshops)

المؤلفون: Lin, W.-C., Yang, T.-H., Wu, C.-C., Liu, S.-C., Wang, C.-H.

المصدر: 2017 International Conference on Computing Intelligence and Information System (CIIS) CIIS Computing Intelligence and Information System (CIIS), 2017 International Conference on. :7-12 Apr, 2017

Relation: 2017 International Conference on Computing Intelligence and Information System (CIIS)

المؤلفون: Liu, S.-C., Hao, J., Lu, Z.-X., Zhang, M.-C., Zhao, J.

المصدر: 2016 IEEE Far East NDT New Technology & Application Forum (FENDT) Technology & Application Forum (FENDT), 2016 IEEE Far East NDT New. :66-70 Jun, 2016

Relation: 2016 IEEE Far East NDT New Technology & Application Forum (FENDT)

المؤلفون: Liu, S.-C., Liu, Y.

المصدر: 2016 17th IEEE/ACIS International Conference on Software Engineering, Artificial Intelligence, Networking and Parallel/Distributed Computing (SNPD) Software Engineering, Artificial Intelligence, Networking and Parallel/Distributed Computing (SNPD), 2016 17th IEEE/ACIS International Conference on. :517-522 May, 2016

Relation: 2016 17th IEEE/ACIS International Conference on Software Engineering, Artificial Intelligence, Networking and Parallel/Distributed Computing (SNPD)

المؤلفون: Yang, M., Liu, S.-C., Delbruck, T.

المصدر: IEEE Journal of Solid-State Circuits IEEE J. Solid-State Circuits Solid-State Circuits, IEEE Journal of. 50(9):2149-2160 Sep, 2015

المؤلفون: Tong Z.-B., Sun J.-T., Liu S.-C., Zhang W., Kuang M.-L.

المصدر: Journal of Mining and Metallurgy. Section B: Metallurgy, Vol 58, Iss 2, Pp 169-178 (2022)

مصطلحات موضوعية: desulfurization slag, glass-ceramics, diopside and nepheline, kinetics, factsage, Mining engineering. Metallurgy, TN1-997

وصف الملف: electronic resource

Relation: https://doaj.org/toc/1450-5339; https://doaj.org/toc/2217-7175

URL الوصول: https://doaj.org/article/a57db373f15f490b88d3a95267a12965

المؤلفون: Liu, S. C., Dai, G. M., Chang, E. Y.

المصدر: 2015 IEEE 22nd International Symposium on the Physical and Failure Analysis of Integrated Circuits Physical and Failure Analysis of Integrated Circuits (IPFA), 2015 IEEE 22nd International Symposium on the. :378-380 Jun, 2015

Relation: 2015 IEEE 22nd International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA)

المؤلفون: Liu, S.-C., Yang, M., Steiner, A., Moeckel, R., Delbruck, T.

المصدر: IEEE Transactions on Biomedical Circuits and Systems IEEE Trans. Biomed. Circuits Syst. Biomedical Circuits and Systems, IEEE Transactions on. 9(2):207-216 Apr, 2015

المؤلفون: Brandli, C., Berner, R., Yang, M., Liu, S.-C., Delbruck, T.

المصدر: IEEE Journal of Solid-State Circuits IEEE J. Solid-State Circuits Solid-State Circuits, IEEE Journal of. 49(10):2333-2341 Oct, 2014