المؤلفون: Jiang, Y.Q., Wang, J.B., Liu, T.C., Li, C.H.

المصدر: 2015 Fifth International Conference on Instrumentation and Measurement, Computer, Communication and Control (IMCCC) Instrumentation and Measurement, Computer, Communication and Control (IMCCC), 2015 Fifth International Conference on. :20-24 Sep, 2015

Relation: 2015 Fifth International Conference on Instrumentation & Measurement, Computer, Communication and Control (IMCCC)

المؤلفون: Liu, T.C., Kabuyanagi, S., Nishimura, T., Yajima, T., Toriumi, A.

المصدر: IEEE Electron Device Letters IEEE Electron Device Lett. Electron Device Letters, IEEE. 38(6):716-719 Jun, 2017

المؤلفون: Prohira, S., Novikov, A., Besson, D.Z., Ratzlaff, K., Stockham, J., Stockham, M., Clem, J.M., Young, R., Gorham, P.W., Allison, P., Banerjee, O., Batten, L., Beatty, J.J., Belov, K., Binns, W.R., Bugaev, V., Cao, P., Chen, C., Chen, P., Connolly, A., Cremonesi, L., Dailey, B., Deaconu, C., Dowkontt, P.F., Fox, B.D., Gordon, J., Hast, C., Hill, B., Hupe, R., Israel, M.H., Kowalski, J., Lam, J., Learned, J.G., Liewer, K.M., Liu, T.C., Ludwig, A., Matsuno, S., Miki, C., Mottram, M., Mulrey, K., Nam, J., Nichol, R.J., Oberla, E., Rauch, B.F., Roberts, J., Romero-Wolf, A., Rotter, B., Russell, J., Saltzberg, D., Schoorlemmer, H., Seckel, D., Stafford, S., Strutt, B., Tatem, K., Varner, G.S., Vieregg, A.G., Wissel, S.A., Wu, F.

المصدر: In Nuclear Inst. and Methods in Physics Research, A 21 February 2019 918:60-66

المؤلفون: Liu, T.C., Kuo, J. B.

المصدر: 2012 IEEE International Conference on Electron Devices and Solid State Circuit (EDSSC) Electron Devices and Solid State Circuit (EDSSC), 2012 IEEE International Conference on. :1-2 Dec, 2012

Relation: 2012 IEEE International Conference of Electron Devices and Solid-State Circuits (EDSSC)

المؤلفون: Liu, T.C., Ikegaya, H., Nishimura, T., Toriumi, A.

المصدر: IEEE Electron Device Letters IEEE Electron Device Lett. Electron Device Letters, IEEE. 37(7):847-850 Jul, 2016

المؤلفون: Allison, P., Banerjee, O., Beatty, J.J., Connolly, A., Deaconu, C., Gordon, J., Gorham, P.W., Kovacevich, M., Miki, C., Oberla, E., Roberts, J., Rotter, B., Stafford, S., Tatem, K., Batten, L., Belov, K., Besson, D.Z., Binns, W.R., Bugaev, V., Cao, P., Chen, C., Chen, P., Chen, Y., Clem, J.M., Cremonesi, L., Dailey, B., Dowkontt, P.F., Hsu, S., Huang, J., Hupe, R., Israel, M.H., Kowalski, J., Lam, J., Learned, J.G., Liewer, K.M., Liu, T.C., Ludwig, A.B., Matsuno, S., Mulrey, K., Nam, J., Nichol, R.J., Novikov, A., Prohira, S., Rauch, B.F., Ripa, J., Romero-Wolf, A., Russell, J., Saltzberg, D., Seckel, D., Shiao, J., Stockham, J., Stockham, M., Strutt, B., Varner, G.S., Vieregg, A.G., Wang, S., Wissel, S.A., Wu, F., Young, R.

المصدر: In Nuclear Inst. and Methods in Physics Research, A 21 June 2018 894:47-56

المؤلفون: Liu, T.C.-K., Kim, D.I., Vaughan, R.G.

المصدر: Canadian Journal of Electrical and Computer Engineering Can. J. Electr. Comput. Eng. Electrical and Computer Engineering, Canadian Journal of. 32(4):207-213 Jan, 2007

المؤلفون: Wang, L.L., Liu, T.C., Cai, Y., Zhang, S.

المصدر: IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 61(5):1436-1443 May, 2014

لا يتم عرض هذه النتيجة على الضيوف.
تسجيل الدخول للوصول الكامل.

لا يتم عرض هذه النتيجة على الضيوف.
تسجيل الدخول للوصول الكامل.