يعرض 1 - 10 نتائج من 91 نتيجة بحث عن '"Liu, Zeye"', وقت الاستعلام: 1.89s تنقيح النتائج
  1. 1
    دورية أكاديمية
    Development of an Expert-Level Right Ventricular Abnormality Detection Algorithm Based on Deep Learning

    المؤلفون: Liu, ZeyeAff1, Aff2, Aff3, Aff4, Li, HangAff1, Aff2, Aff3, Aff4, Li, Wenchao, Zhang, FengwenAff1, Aff2, Aff3, Aff4, Ouyang, WenbinAff1, Aff2, Aff3, Aff4, Wang, ShouzhengAff1, Aff2, Aff3, Aff4, Zhi, Aihua, Pan, XiangbinAff1, Aff2, Aff3, Aff4, IDs1253902300581z_cor8

    المصدر: Interdisciplinary Sciences: Computational Life Sciences. 15(4):653-662

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  2. 2
    مؤتمر
    High Defect-Density Yield Learning using Three-Dimensional Logic Test Chips

    المؤلفون: Liu, Zeye, Shawn Blanton, R. D.

    المصدر: 2020 IEEE International Test Conference (ITC) Test Conference (ITC), 2020 IEEE International. :1-10 Nov, 2020

    Relation: 2020 IEEE International Test Conference (ITC)

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  3. 3
    دورية أكاديمية
    Global, regional, and national time trends in cancer mortality attributable to high fasting plasma glucose: an age-period cohort analysis

    المؤلفون: Xie, Jing, Liu, Zeye, Ren, Liqun, He, Liyun, Lu, Shan, Meng, Xiangzhi, Zhang, Xin, Su, Zhanhao, Jing, Shenqi, Shan, Tao, Wang, Junjie, Xia, Ruibing, Feng, Wei, Li, Yakun, Liu, NaifengAff1, Aff12, IDs1288902316076x_cor15, Liu, YunAff7, Aff9, IDs1288902316076x_cor16

    المصدر: BMC Public Health. 23(1)

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  4. 4
    مؤتمر
    Improving Test Chip Design Efficiency via Machine Learning

    المؤلفون: Liu, Zeye, Huang, Qicheng, Fang, Chenlei, Blanton, R. D.

    المصدر: 2019 IEEE International Test Conference (ITC) Test Conference (ITC), 2019 IEEE International. :1-10 Nov, 2019

    Relation: 2019 IEEE International Test Conference (ITC)

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  5. 5
    مؤتمر
    IPSA: Integer Programming via Sparse Approximation for Efficient Test-Chip Design

    المؤلفون: Huang, Qicheng, Fang, Chenlei, Liu, Zeye, Ding, Ruizhou, Blanton, R. D. Shawn

    المصدر: 2019 IEEE 37th International Conference on Computer Design (ICCD) Computer Design (ICCD), 2019 IEEE 37th International Conference on. :11-19 Nov, 2019

    Relation: 2019 IEEE 37th International Conference on Computer Design (ICCD)

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  6. 6
    مؤتمر
    Characterization of Locked Sequential Circuits via ATPG

    المؤلفون: Duvalsaint, Danielle, Liu, Zeye, Ravikumar, Ananya, Blanton, Ronald D.

    المصدر: 2019 IEEE International Test Conference in Asia (ITC-Asia) ITC-ASIA Test Conference in Asia (ITC-Asia), 2019 IEEE International. :97-102 Sep, 2019

    Relation: 2019 IEEE International Test Conference in Asia (ITC-Asia)

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  7. 7
    مؤتمر
    FLightNNs: Lightweight Quantized Deep Neural Networks for Fast and Accurate Inference

    المؤلفون: Ding, Ruizhou, Liu, Zeye, Chin, Ting-Wu, Marculescu, Diana, Shawn Blanton, R. D.

    المصدر: 2019 56th ACM/IEEE Design Automation Conference (DAC) Design Automation Conference (DAC), 2019 56th ACM/IEEE. :1-6 Jun, 2019

    Relation: 2019 56th ACM/IEEE Design Automation Conference (DAC)

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  8. 8
    مؤتمر
    Regularizing Activation Distribution for Training Binarized Deep Networks

    المؤلفون: Ding, Ruizhou, Chin, Ting-Wu, Liu, Zeye, Marculescu, Diana

    المصدر: 2019 IEEE/CVF Conference on Computer Vision and Pattern Recognition (CVPR) Computer Vision and Pattern Recognition (CVPR), 2019 IEEE/CVF Conference on. :11400-11409 Jun, 2019

    Relation: 2019 IEEE/CVF Conference on Computer Vision and Pattern Recognition (CVPR)

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  9. 9
    مؤتمر
    Path Delay Test of the Carnegie Mellon Logic Characterization Vehicle

    المؤلفون: Niewenhuis, Ben, Ravikumar, Balaji, Liu, Zeye, Blanton, R. D. Shawn

    المصدر: 2019 IEEE 37th VLSI Test Symposium (VTS) VLSI Test Symposium (VTS), 2019 IEEE 37th. :1-6 Apr, 2019

    Relation: 2019 IEEE 37th VLSI Test Symposium (VTS)

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  10. 10
    مؤتمر
    CompactNet: High Accuracy Deep Neural Network Optimized for On-Chip Implementation

    المؤلفون: Goel, Abhinav, Liu, Zeye, Blanton, Ronald D.

    المصدر: 2018 IEEE International Conference on Big Data (Big Data) Big Data (Big Data), 2018 IEEE International Conference on. :4723-4729 Dec, 2018

    Relation: 2018 IEEE International Conference on Big Data (Big Data)

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