يعرض 1 - 10 نتائج من 8,001 نتيجة بحث عن '"Logic testing"', وقت الاستعلام: 1.03s تنقيح النتائج
  1. 1
    مؤتمر
    Requirements-Driven Logic Testing for Deep Neural Networks

    المؤلفون: Hang, Yuqi, Liu, Chen, Hu, Lifa, Gao, Xinyi

    المصدر: 2023 IEEE 23rd International Conference on Software Quality, Reliability, and Security Companion (QRS-C) QRS-C Software Quality, Reliability, and Security Companion (QRS-C), 2023 IEEE 23rd International Conference on. :18-24 Oct, 2023

    Relation: 2023 IEEE 23rd International Conference on Software Quality, Reliability, and Security Companion (QRS-C)

    Full Text Finder
    أضف إلى المفضلة
  2. 2
    مؤتمر
    Application of Open-Source Software in Digital Electronics Education

    المؤلفون: Bonev, Borislav B., Yakimov, Peter I.

    المصدر: 2023 XXXII International Scientific Conference Electronics (ET) Scientific Conference Electronics (ET), 2023 XXXII International. :1-5 Sep, 2023

    Relation: 2023 XXXII International Scientific Conference Electronics (ET)

    أضف إلى المفضلة
  3. 3
    مؤتمر
    In-Flight Logic Analysis on OPS-SAT

    المؤلفون: Henkel, M., Hormer, A.J., Evans, D., Wenger, M.

    المصدر: 2023 17th International Conference on Telecommunications (ConTEL) Telecommunications (ConTEL), 2023 17th International Conference on. :1-6 Jul, 2023

    Relation: 2023 17th International Conference on Telecommunications (ConTEL)

    Full Text Finder
    أضف إلى المفضلة
  4. 4
    مؤتمر
    Optimal Test Sequences for Logic Verification closure in State Dependent RTL Digital designs

    المؤلفون: Vanaraj, Anantharaj Thalaimalai, Sekar K, Raja, R, Marshal, G, Lakshminarayanan

    المصدر: 2022 13th International Conference on Computing Communication and Networking Technologies (ICCCNT) Computing Communication and Networking Technologies (ICCCNT), 2022 13th International Conference on. :1-6 Oct, 2022

    Relation: 2022 13th International Conference on Computing Communication and Networking Technologies (ICCCNT)

    أضف إلى المفضلة
  5. 5
    مؤتمر
    Runtime Fault Diagnostics for GPU Tensor Cores

    المؤلفون: Hukerikar, Saurabh, Saxena, Nirmal

    المصدر: 2022 IEEE International Test Conference (ITC) ITC Test Conference (ITC), 2022 IEEE International. :524-528 Sep, 2022

    Relation: 2022 IEEE International Test Conference (ITC)

    Full Text Finder
    أضف إلى المفضلة
  6. 6
    Guideline
    IEEE Guide for Application of the Single-Failure Criterion to Nuclear Power Generating Station Safety Systems

    المصدر: IEEE Std 379.1-2024. :1-28 Jul, 2024

    أضف إلى المفضلة
  7. 7
    دورية أكاديمية
    Test Methodology for Defect-Based Bridge Faults

    المؤلفون: Chang, S., Nien, Y., Hu, Y., Wu, K., Wang, C., Huang, F., Tang, Y., Chen, Y., Chen, M., Chao, M.C.

    المصدر: IEEE Transactions on Very Large Scale Integration (VLSI) Systems IEEE Trans. VLSI Syst. Very Large Scale Integration (VLSI) Systems, IEEE Transactions on. 30(7):975-988 Jul, 2022

    Full Text Finder
    أضف إلى المفضلة
  8. 8
    دورية أكاديمية
    Hardware Patching Methodology for Neutralizing Timing Hardware Trojans Using Vulnerability Analysis and Time Borrowing Scheme

    المؤلفون: Khormizi, F., Shabani, A., Alizadeh, B.

    المصدر: IEEE Transactions on Circuits and Systems II: Express Briefs IEEE Trans. Circuits Syst. II Circuits and Systems II: Express Briefs, IEEE Transactions on. 69(6):2937-2941 Jun, 2022

    Full Text Finder
    أضف إلى المفضلة
  9. 9
    دورية أكاديمية
    Detecting Hardware Trojans Using Combined Self-Testing and Imaging

    المؤلفون: Vashistha, N., Lu, H., Shi, Q., Woodard, D.L., Asadizanjani, N., Tehranipoor, M.M.

    المصدر: IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems IEEE Trans. Comput.-Aided Des. Integr. Circuits Syst. Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on. 41(6):1730-1743 Jun, 2022

    Full Text Finder
    أضف إلى المفضلة
  10. 10
    مؤتمر
    An Area-Efficient Scannable In Situ Timing Error Detection Technique Featuring Low Test Overhead for Resilient Circuits

    المؤلفون: Zhang, Hao, He, Weifeng, Sun, Yanan, Seok, Mingoo

    المصدر: 2021 IEEE/ACM International Conference On Computer Aided Design (ICCAD) Computer Aided Design (ICCAD), 2021 IEEE/ACM International Conference On. :1-9 Nov, 2021

    Relation: 2021 IEEE/ACM International Conference On Computer Aided Design (ICCAD)

    Full Text Finder
    أضف إلى المفضلة
أدوات البحث: أحصل على تغذية RSS – أرسل هذا البحث بالبريد الإلكتروني – حفظ البحث – جدول التنبيهات: لا شيء