المؤلفون: Lothar Striider, Julia Schmidt, Robert Hartmann, Heike Soltau, Martin Huth, Jeffrey M. Davis

المصدر: Microscopy and Microanalysis. 24:728-729

مصطلحات موضوعية: Physics, 010401 analytical chemistry, Resolution (electron density), Solid-state, X-ray, 020206 networking & telecommunications, 02 engineering and technology, Fano plane, Mass spectrometry, 01 natural sciences, 0104 chemical sciences, 0202 electrical engineering, electronic engineering, information engineering, Limit (mathematics), Atomic physics, Instrumentation, Energy (signal processing)

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::91d1ac4751618d52a3e11c36b86bef4d
https://doi.org/10.1017/s1431927618004130

المؤلفون: Lothar Striider, Peter D. Nellist, Yukihito Kondo, Martin Simson, Heike Soltau, Robert Ritz, Martin Hum, Hao Yang, Julia Schmidt, H. Ryll, Ryusuke Sagawa

المصدر: Microscopy and Microanalysis. 23:58-59

مصطلحات موضوعية: 0301 basic medicine, 03 medical and health sciences, 030104 developmental biology, Materials science, 010308 nuclear & particles physics, 0103 physical sciences, 01 natural sciences, Instrumentation

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::0d279e213209db5bb75ca9a10c46614c
https://doi.org/10.1017/s1431927617000976

المؤلفون: Julia Schmidt, Heike Soltau, Robert Hartman, Lothar Striider, Martin Huth, Jeffrey M. Davis

المصدر: Microscopy and Microanalysis. 23:1010-1011

مصطلحات موضوعية: Materials science, Optics, business.industry, 010401 analytical chemistry, X-ray, 02 engineering and technology, 021001 nanoscience & nanotechnology, 0210 nano-technology, business, 01 natural sciences, Instrumentation, 0104 chemical sciences, Camera resectioning

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::f64a0d183e994fafcb42cbffcb97c883
https://doi.org/10.1017/s1431927617005712

المؤلفون: M. Den Hertog, Martin Huth, Lothar Striider, H. Ryll, K. El Hajraoui, Vadim Migunov, Robert Hartmann, Martin Simson, Heike Soltau, Julia Schmidt, Sebastian Ihle, Rafal E. Dunin-Borkowski

المساهمون: Matériaux, Rayonnements, Structure (MRS), Institut Néel (NEEL), Institut polytechnique de Grenoble - Grenoble Institute of Technology (Grenoble INP )-Centre National de la Recherche Scientifique (CNRS)-Université Joseph Fourier - Grenoble 1 (UJF)-Institut polytechnique de Grenoble - Grenoble Institute of Technology (Grenoble INP )-Centre National de la Recherche Scientifique (CNRS)-Université Joseph Fourier - Grenoble 1 (UJF), Institute for Genetics, Department of Evolutionary Genetics

المصدر: Microscopy and Microanalysis
Microscopy and Microanalysis, Cambridge University Press (CUP), 2015, 21 (Suppl. S3), pp.1585-1586. ⟨10.1017/S1431927615008703⟩

مصطلحات موضوعية: 010302 applied physics, Materials science, Optics, business.industry, 0103 physical sciences, 02 engineering and technology, [PHYS.COND]Physics [physics]/Condensed Matter [cond-mat], 021001 nanoscience & nanotechnology, 0210 nano-technology, business, 01 natural sciences, Instrumentation, ComputingMilieux_MISCELLANEOUS

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::f95ed9948ded37ec8a48ac02e5cca19b
https://hal.archives-ouvertes.fr/hal-01638848

المؤلفون: Martin Huth, Martin Simson, Timothy J. Pennycook, R Sa gawa, Lothar Striider, Hao Yang, R N Rutte, Lewys Jones, Gerardo T. Martinez, Peter D. Nellist, Yukihito Kondo, Heike Soltau, B D Davis

المصدر: Microscopy and Microanalysis. 22:466-467

مصطلحات موضوعية: 010302 applied physics, Materials science, business.industry, 02 engineering and technology, Electron, 021001 nanoscience & nanotechnology, 01 natural sciences, Ptychography, Optics, 0103 physical sciences, Phase imaging, 0210 nano-technology, business, Instrumentation

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::550929ce754aee8ca702a3102ce66d2e
https://doi.org/10.1017/s1431927616003184

المؤلفون: Ryusuke Sagawa, Martin Huth, Peter D. Nellist, Knut Müller, Hao Yang, Julia Schmidt, Heike Soltau, Martin Simson, Lewys Jones, Sebastian Ihle, Lothar Striider, H. Ryll, Robert Hartmann, Yukihito Kondo, Hiroyuki Banba

المصدر: Microscopy and Microanalysis. 21:2211-2212

مصطلحات موضوعية: Materials science, Instrumentation

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::9d83250a4f0363a0cac236a8e33343b1
https://doi.org/10.1017/s1431927615011836

المؤلفون: Gerhard Lutz, Adrian Niculae, Daniel Steigenhöfer, Heike Soltau, Udo Weber, Lothar Striider, Julia Schmidt, Martin Huth, Jeffrey M. Davis, Sebastian Ihle, Peter Holl

المصدر: Microscopy and Microanalysis. 21:167-168

مصطلحات موضوعية: Materials science, Instrumentation

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::249675483d68dfa3eda4510d988a2f3d
https://doi.org/10.1017/s1431927615001634