المؤلفون: Zhang, M., Chou, L., Zhang, H., Qian, H., Jin, C., Chen, B., Cheng, R., Liu, Y., Bernard, G., Loubriat, S., Nguyen, B., Yu, X., Chen, J., Han, G.

المصدر: IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 71(6):3994-3997 Jun, 2024

المؤلفون: Schwarzenbach, W., Nguyen, B., Ecarnot, L., Loubriat, S., Detard, M., Cela, E., Bertrand-Giuliani, C., Chabanne, G., Maddalon, C., Daval, N., Maleville, C.

المصدر: IEEE Journal of the Electron Devices Society IEEE J. Electron Devices Soc. Electron Devices Society, IEEE Journal of the. 7:863-868 2019

المؤلفون: Schwarzenbach, W., Nguyen, B. -Y., Ecarnot, L., Loubriat, S., Detard, M., Cela, E., Bertrand-Giuliani, C., Chabanne, G., Maddalon, C., Daval, N., Girard, C., Maleville, C.

المصدر: 2018 IEEE SOI-3D-Subthreshold Microelectronics Technology Unified Conference (S3S) SOI-3D-Subthreshold Microelectronics Technology Unified Conference (S3S), 2018 IEEE. :1-2 Oct, 2018

Relation: 2018 IEEE SOI-3D-Subthreshold Microelectronics Technology Unified Conference (S3S)

المؤلفون: Schwarzenbach, W., Allibert, F., Le Royer, C., Grenouillet, L., Malaquin, C., Bertrand-Giuliani, C., Boedt, F., Loubriat, S., Michau, C., Parissi, D., Nguyen, B.-Y.

المصدر: 2016 IEEE SOI-3D-Subthreshold Microelectronics Technology Unified Conference (S3S) SOI-3D-Subthreshold Microelectronics Technology Unified Conference (S3S), 2016 IEEE. :1-2 Oct, 2016

Relation: 2016 IEEE SOI-3D-Subthreshold Microelectronics Technology Unified Conference (S3S)

المؤلفون: Betti Beneventi, G., Perniola, L., Fantini, A., Blachier, D., Toffoli, A., Gourvest, E., Maitrejean, S., Sousa, V., Jahan, C., Nodin, J.F., Persico, A., Loubriat, S., Roule, A., Lhostis, S., Feldis, H., Reimbold, G., Billon, T., De Salvo, B., Larcher, L., Pavan, P., Bensahel, D., Mazoyer, P., Annunziata, R., Boulanger, F.

المصدر: 2010 Proceedings of the European Solid State Device Research Conference Solid-State Device Research Conference (ESSDERC), 2010 Proceedings of the European. :313-316 Sep, 2010

Relation: ESSDERC 2010 - 40th European Solid State Device Research Conference

المؤلفون: Pijolat, M., Loubriat, S., Mercier, D., Reinhardt, A., Defay, E., Deguet, C., Aid, M., Queste, S., Ballandras, S.

المصدر: 2010 IEEE International Frequency Control Symposium Frequency Control Symposium (FCS), 2010 IEEE International. :661-664 Jun, 2010

Relation: 2010 IEEE International Frequency Control Symposium (FCS)

المؤلفون: Betti Beneventi, G., Gourvest, E., Fantini, A., Perniola, L., Sousa, V., Maitrejean, S., Bastien, J.C., Bastard, A., Fargeix, A., Hyot, B., Jahan, C., Nodin, J.F., Persico, A., Blachier, D., Toffoli, A., Loubriat, S., Roule, A., Lhostis, S., Feldis, H., Reimbold, G., Billon, T., De Salvo, B., Larcher, L., Pavan, P., Bensahel, D., Mazoyer, P., Annunziata, R., Boulanger, F.

المصدر: 2010 IEEE International Memory Workshop Memory Workshop (IMW), 2010 IEEE International. :1-4 May, 2010

Relation: 2010 IEEE International Memory Workshop (IMW)

المؤلفون: Perniola, L., Sousa, V., Fantini, A., Arbaoui, E., Bastard, A., Armand, M., Fargeix, A., Jahan, C., Nodin, J.-F., Persico, A., Blachier, D., Toffoli, A., Loubriat, S., Gourvest, E., Betti Beneventi, G., Feldis, H., Maitrejean, S., Lhostis, S., Roule, A., Cueto, O., Reimbold, G., Poupinet, L., Billon, T., De Salvo, B., Bensahel, D., Mazoyer, P., Annunziata, R., Zuliani, P., Boulanger, F.

المصدر: IEEE Electron Device Letters IEEE Electron Device Lett. Electron Device Letters, IEEE. 31(5):488-490 May, 2010

المؤلفون: Betti Beneventi, G., Perniola, L., Sousa, V., Gourvest, E., Maitrejean, S., Bastien, J.C., Bastard, A., Hyot, B., Fargeix, A., Jahan, C., Nodin, J.F., Persico, A., Fantini, A., Blachier, D., Toffoli, A., Loubriat, S., Roule, A., Lhostis, S., Feldis, H., Reimbold, G., Billon, T., De Salvo, B., Larcher, L., Pavan, P., Bensahel, D., Mazoyer, P., Annunziata, R., Zuliani, P., Boulanger, F.

المصدر: In Solid State Electronics November-December 2011 65-66:197-204

المؤلفون: Loubriat, S., Muyard, D., Fillot, F., Roule, A., Veillerot, M., Barnes, J.P., Gergaud, P., Vandroux, L., Verdier, M., Maitrejean, S.

المصدر: In Microelectronic Engineering 2011 88(5):817-821