يعرض 1 - 10 نتائج من 9,257 نتيجة بحث عن '"Low-Frequency Noise"', وقت الاستعلام: 0.83s تنقيح النتائج
  1. 1
    مؤتمر
    Phase Retrieval Algorithm Based on Transport of Intensity Equation under the Fusion of Regularization and Grating Modulation

    المؤلفون: Cheng, Hong, Zhang, Tianyi, Wu, Wentong, Kong, Meng, Cheng, Si, Ju, Hanping

    المصدر: 2024 3rd International Conference on Image Processing and Media Computing (ICIPMC) Image Processing and Media Computing (ICIPMC), 2024 3rd International Conference on. :245-253 May, 2024

    Relation: 2024 3rd International Conference on Image Processing and Media Computing (ICIPMC)

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  2. 2
    دورية أكاديمية
    Low-Frequency Noise in InGaAs-OI Transistors

    المؤلفون: Marquez, C., Navarro, C., Karg, S., Ortega, R., Zota, C., Gamiz, F.

    المصدر: IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 71(6):3964-3969 Jun, 2024

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  3. 3
    مؤتمر
    Capacity Estimation for a MIMO Communication Channel in Presence of Noise Complex

    المؤلفون: Parshin, Alexander, Grachev, Maxim

    المصدر: 2024 13th Mediterranean Conference on Embedded Computing (MECO) Embedded Computing (MECO), 2024 13th Mediterranean Conference on. :1-4 Jun, 2024

    Relation: 2024 13th Mediterranean Conference on Embedded Computing (MECO)

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  4. 4
    مؤتمر
    $\mathrm{I}_{\text{GS}}-\mathrm{I}_{\text{GD}}$ Gate Current Noise Model at Low Frequency

    المؤلفون: Torri, F., Leman, O., Malcovati, P., Baschirotto, A.

    المصدر: 2024 19th Conference on Ph.D Research in Microelectronics and Electronics (PRIME) Ph.D Research in Microelectronics and Electronics (PRIME), 2024 19th Conference on. :1-4 Jun, 2024

    Relation: 2024 19th Conference on PhD Research in Microelectronics and Electronics (PRIME)

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  5. 5
    مؤتمر
    A Simplified Topology for the Design of Low Noise Voltage Amplifiers for Low Frequency Noise Measurements

    المؤلفون: Scandurra, Graziella, Achtenberg, Krzysztof, Ciofi, Carmine

    المصدر: 2024 IEEE International Instrumentation and Measurement Technology Conference (I2MTC) Instrumentation and Measurement Technology Conference (I2MTC), 2024 IEEE International. :1-6 May, 2024

    Relation: 2024 IEEE International Instrumentation and Measurement Technology Conference (I2MTC)

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  6. 6
    مؤتمر
    Fluctuation-Enhanced Sensing of Organic Vapors by Ink-Printed MoS2 Devices under UV Irradiation

    المؤلفون: Drozdowska, Katarzyna, Smulko, Janusz, Rumyantsev, Sergey, Kwiatkowski, Andrzej

    المصدر: 2024 IEEE International Instrumentation and Measurement Technology Conference (I2MTC) Instrumentation and Measurement Technology Conference (I2MTC), 2024 IEEE International. :1-5 May, 2024

    Relation: 2024 IEEE International Instrumentation and Measurement Technology Conference (I2MTC)

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  7. 7
    مؤتمر
    A Simple, Portable, Two Channels Correlation Spectrum Analyzer for Low Frequency Noise Measurements

    المؤلفون: Ciofi, Carmine, Cardillo, Emanuele, Ferro, Luigi, Giusi, Gino, Scandurra, Graziella

    المصدر: 2024 IEEE International Instrumentation and Measurement Technology Conference (I2MTC) Instrumentation and Measurement Technology Conference (I2MTC), 2024 IEEE International. :1-6 May, 2024

    Relation: 2024 IEEE International Instrumentation and Measurement Technology Conference (I2MTC)

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  8. 8
    دورية أكاديمية
    Electromagnetic–Thermal Far-Infrared Detection Using Arrays of Schottky Barrier Diode Detectors in a Foundry CMOS Tuned at 20 Terahertz

    المؤلفون: Farooq, M.M., Pouya, B., K. O, K.

    المصدر: IEEE Sensors Letters IEEE Sens. Lett. Sensors Letters, IEEE. 8(7):1-4 Jul, 2024

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  9. 9
    دورية أكاديمية
    A Nanoribbon-Based Ion-Gated Lateral Bipolar Amplifier for Ion Sensing

    المؤلفون: Xu, Z., Chen, S., Hu, Q., Zhang, S., Zhang, Z.

    المصدر: IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 71(7):4362-4367 Jul, 2024

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  10. 10
    دورية أكاديمية
    Impact of Doped Hafnium Oxides on Memory Window and Low-Frequency Noise in Ferroelectric FETs

    المؤلفون: Kumar, A., Mishra, N., Bulusu, A., Mehrotra, S., Dasgupta, A.

    المصدر: IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 71(7):4015-4020 Jul, 2024

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