المؤلفون: Ku, S.H., Lin, T.W., Cheng, C.H., Lee, C.W., Chen, Ti-Wen, Tsai, Wen-Jer, Lu, T.C., Lu, W.P., Chen, K.C., Wang, Tahui, Lu, Chih-Yuan

المصدر: 2018 IEEE International Memory Workshop (IMW) Memory Workshop (IMW), 2018 IEEE International. :1-4 May, 2018

Relation: 2018 IEEE International Memory Workshop (IMW)

المؤلفون: Zous, N.K., Chen, Y.J., Chin, C.Y., Tsai, W.J., Lu, T.C., Chen, M.S., Lu, W.P., Tahui Wang, Pan, S.C., Ku, J., Chih-Yuan Lu

المصدر: Proceedings of the 11th International Symposium on the Physical and Failure Analysis of Integrated Circuits. IPFA 2004 (IEEE Cat. No.04TH8743) Physical and failure analysis of integrated circuits Physical and Failure Analysis of Integrated Circuits, 2004. IPFA 2004. Proceedings of the 11th International Symposium on the. :119-121 2004

Relation: Proceedings of the 11th International Symposium on the Physical and Failure Analysis of Integrated Circuits. IPFA 2004

المؤلفون: Chiu, J.P., Chou, Y.L., Ma, H.C., Tahui Wang, Ku, S.H., Zou, N.K., Chen, Vincent, Lu, W.P., Chen, K.C., Chih-Yuan Lu

المصدر: 2009 IEEE International Electron Devices Meeting (IEDM) Electron Devices Meeting (IEDM), 2009 IEEE International. :1-4 Dec, 2009

Relation: 2009 IEEE International Electron Devices Meeting (IEDM)

المؤلفون: Tang, Chun-Jung, Li, C.W., Wang, Tahui, Gu, S.H., Chen, P.C., Chang, Y.W., Lu, T.C., Lu, W.P., Chen, K.C., Lu, Chih-Yuan

المصدر: 2007 IEEE International Electron Devices Meeting Electron Devices Meeting, 2007. IEDM 2007. IEEE International. :173-176 Dec, 2007

Relation: 2007 IEEE International Electron Devices Meeting

المؤلفون: Chang, Y.W., Wu, G.W., Chen, P.C., Chen, C.H., Yang, I.C., Chin, C.Y., Huang, I.J., Tsai, W.J., Lu, T.C., Lu, W.P., Chen, K.C., Lu, C.Y.

المصدر: 2007 22nd IEEE Non-Volatile Semiconductor Memory Workshop Non-Volatile Semiconductor Memory Workshop, 2007 22nd IEEE. :81-82 Aug, 2007

Relation: 2007 22nd IEEE Non-Volatile Semiconductor Memory Workshop

المؤلفون: Gu, S.H., Li, C.W., Wang, Tahui, Lu, W.P., Chen, K.C., Ku, Joseph, Lu, Chih-Yuan

المصدر: 2006 International Electron Devices Meeting Electron Devices Meeting, 2006. IEDM '06. International. :1-4 Dec, 2006

Relation: 2006 International Electron Devices Meeting

المؤلفون: Shih, Y.H., Lai, E.K., Hsieh, J.Y., Hsu, T.H., Wu, M.D., Lu, C.P., Ni, K.P., Chou, T.Y., Yang, L.W., Hsieh, K.Y., Liaw, M.H., Lu, W.P., Chen, K.C., Ku, Joseph, Ni, F.L., Liu, Rich, Lu, Chih-Yuan

المصدر: 2006 International Electron Devices Meeting Electron Devices Meeting, 2006. IEDM '06. International. :1-4 Dec, 2006

Relation: 2006 International Electron Devices Meeting

المؤلفون: Tsai, W.J., Zous, N.K., Chen, H.Y., Liu, L., Yeh, C.C., Chen, S., Lu, W.P., Tahui Wang, Ku, J., Chih-Yuan Lu

المصدر: 2006 IEEE International Reliability Physics Symposium Proceedings Reliability Physics Symposium Proceedings, 2006. 44th Annual., IEEE International. :693-694 Mar, 2006

Relation: 2006 IEEE International Reliability Physics Symposium Proceedings

المؤلفون: Zous, N.K., Lee, M.Y., Tsai, W.J., Kuo, A., Huang, L.T., Lu, T.C., Liu, C.J., Tahui Wang, Lu, W.P., Wenchi Ting, Ku, J., Chih-Yuan Lu

المصدر: IEEE Electron Device Letters IEEE Electron Device Lett. Electron Device Letters, IEEE. 25(9):649-651 Sep, 2004

المؤلفون: Lu, W.P., Sundareshan, M.K.

المصدر: IEEE Transactions on Communications IEEE Trans. Commun. Communications, IEEE Transactions on. 40(4):658-660 Apr, 1992