-
1مؤتمر
المؤلفون: Ku, S.H., Lin, T.W., Cheng, C.H., Lee, C.W., Chen, Ti-Wen, Tsai, Wen-Jer, Lu, T.C., Lu, W.P., Chen, K.C., Wang, Tahui, Lu, Chih-Yuan
المصدر: 2018 IEEE International Memory Workshop (IMW) Memory Workshop (IMW), 2018 IEEE International. :1-4 May, 2018
Relation: 2018 IEEE International Memory Workshop (IMW)
-
2مؤتمر
المؤلفون: Zous, N.K., Chen, Y.J., Chin, C.Y., Tsai, W.J., Lu, T.C., Chen, M.S., Lu, W.P., Tahui Wang, Pan, S.C., Ku, J., Chih-Yuan Lu
المصدر: Proceedings of the 11th International Symposium on the Physical and Failure Analysis of Integrated Circuits. IPFA 2004 (IEEE Cat. No.04TH8743) Physical and failure analysis of integrated circuits Physical and Failure Analysis of Integrated Circuits, 2004. IPFA 2004. Proceedings of the 11th International Symposium on the. :119-121 2004
Relation: Proceedings of the 11th International Symposium on the Physical and Failure Analysis of Integrated Circuits. IPFA 2004
-
3مؤتمر
المؤلفون: Chiu, J.P., Chou, Y.L., Ma, H.C., Tahui Wang, Ku, S.H., Zou, N.K., Chen, Vincent, Lu, W.P., Chen, K.C., Chih-Yuan Lu
المصدر: 2009 IEEE International Electron Devices Meeting (IEDM) Electron Devices Meeting (IEDM), 2009 IEEE International. :1-4 Dec, 2009
Relation: 2009 IEEE International Electron Devices Meeting (IEDM)
-
4مؤتمر
المؤلفون: Tang, Chun-Jung, Li, C.W., Wang, Tahui, Gu, S.H., Chen, P.C., Chang, Y.W., Lu, T.C., Lu, W.P., Chen, K.C., Lu, Chih-Yuan
المصدر: 2007 IEEE International Electron Devices Meeting Electron Devices Meeting, 2007. IEDM 2007. IEEE International. :173-176 Dec, 2007
Relation: 2007 IEEE International Electron Devices Meeting
-
5مؤتمر
المؤلفون: Chang, Y.W., Wu, G.W., Chen, P.C., Chen, C.H., Yang, I.C., Chin, C.Y., Huang, I.J., Tsai, W.J., Lu, T.C., Lu, W.P., Chen, K.C., Lu, C.Y.
المصدر: 2007 22nd IEEE Non-Volatile Semiconductor Memory Workshop Non-Volatile Semiconductor Memory Workshop, 2007 22nd IEEE. :81-82 Aug, 2007
Relation: 2007 22nd IEEE Non-Volatile Semiconductor Memory Workshop
-
6مؤتمر
المؤلفون: Gu, S.H., Li, C.W., Wang, Tahui, Lu, W.P., Chen, K.C., Ku, Joseph, Lu, Chih-Yuan
المصدر: 2006 International Electron Devices Meeting Electron Devices Meeting, 2006. IEDM '06. International. :1-4 Dec, 2006
Relation: 2006 International Electron Devices Meeting
-
7مؤتمر
المؤلفون: Shih, Y.H., Lai, E.K., Hsieh, J.Y., Hsu, T.H., Wu, M.D., Lu, C.P., Ni, K.P., Chou, T.Y., Yang, L.W., Hsieh, K.Y., Liaw, M.H., Lu, W.P., Chen, K.C., Ku, Joseph, Ni, F.L., Liu, Rich, Lu, Chih-Yuan
المصدر: 2006 International Electron Devices Meeting Electron Devices Meeting, 2006. IEDM '06. International. :1-4 Dec, 2006
Relation: 2006 International Electron Devices Meeting
-
8مؤتمر
المؤلفون: Tsai, W.J., Zous, N.K., Chen, H.Y., Liu, L., Yeh, C.C., Chen, S., Lu, W.P., Tahui Wang, Ku, J., Chih-Yuan Lu
المصدر: 2006 IEEE International Reliability Physics Symposium Proceedings Reliability Physics Symposium Proceedings, 2006. 44th Annual., IEEE International. :693-694 Mar, 2006
Relation: 2006 IEEE International Reliability Physics Symposium Proceedings
-
9دورية أكاديمية
المؤلفون: Zous, N.K., Lee, M.Y., Tsai, W.J., Kuo, A., Huang, L.T., Lu, T.C., Liu, C.J., Tahui Wang, Lu, W.P., Wenchi Ting, Ku, J., Chih-Yuan Lu
المصدر: IEEE Electron Device Letters IEEE Electron Device Lett. Electron Device Letters, IEEE. 25(9):649-651 Sep, 2004
-
10دورية أكاديمية
المؤلفون: Lu, W.P., Sundareshan, M.K.
المصدر: IEEE Transactions on Communications IEEE Trans. Commun. Communications, IEEE Transactions on. 40(4):658-660 Apr, 1992