يعرض 1 - 10 نتائج من 25 نتيجة بحث عن '"Lu, Zhebie"', وقت الاستعلام: 0.86s تنقيح النتائج
  1. 1
    مؤتمر
    Design of a Non-destructive Device Test Platform Capable of Double-pulse Tests and Short-circuit Tests with Fast Overcurrent Protection for Wide Band-gap Devices

    المؤلفون: Lu, Zhebie, Iannuzzo, Francesco

    المصدر: 2023 25th European Conference on Power Electronics and Applications (EPE'23 ECCE Europe) Power Electronics and Applications (EPE'23 ECCE Europe), 2023 25th European Conference on. :1-7 Sep, 2023

    Relation: 2023 25th European Conference on Power Electronics and Applications (EPE'23 ECCE Europe)

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  2. 2
    مؤتمر
    A Guideline for Silicon Carbide MOSFET Thermal Characterization based on Source-Drain Voltage

    المؤلفون: Zhang, Yi, Zhang, Yichi, Xu, Zhiliang, Wang, Zhongxu, Wong, Hon, Lu, Zhebie, Caruso, Antonio

    المصدر: 2023 IEEE Applied Power Electronics Conference and Exposition (APEC) Applied Power Electronics Conference and Exposition (APEC), 2023 IEEE. :378-385 Mar, 2023

    Relation: 2023 IEEE Applied Power Electronics Conference and Exposition (APEC)

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  3. 3
    مؤتمر
    Factors Affecting Self-Sustained Switching Oscillations of Cascode GaN Devices and Mitigation Strategy During Parameter Design

    المؤلفون: Lu, Zhebie, Iannuzzo, Francesco

    المصدر: 2023 IEEE Applied Power Electronics Conference and Exposition (APEC) Applied Power Electronics Conference and Exposition (APEC), 2023 IEEE. :1-5 Mar, 2023

    Relation: 2023 IEEE Applied Power Electronics Conference and Exposition (APEC)

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  4. 4
    مؤتمر
    Short Circuit Capability and Performance Degradation of Cascode GaN Devices - A Case Study

    المؤلفون: Lu, Zhebie, Iannuzzo, Francesco

    المصدر: 2022 IEEE Energy Conversion Congress and Exposition (ECCE) Energy Conversion Congress and Exposition (ECCE), 2022 IEEE. :1-5 Oct, 2022

    Relation: 2022 IEEE Energy Conversion Congress and Exposition (ECCE)

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  5. 5
    تقرير
    A Guideline for Silicon Carbide MOSFET Thermal Characterization based on Source-Drain Voltage

    المؤلفون: Zhang, Yi, Zhang, Yichi, Xu, Zhiliang, Wang, Zhongxu, Wong, Hon, Lu, Zhebie, Caruso, Antonio

    مصطلحات موضوعية: Physics - Applied Physics

    URL الوصول: http://arxiv.org/abs/2211.15174

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  6. 6
    مؤتمر
    Modular Heatsink Design for High Power Converters Considering Cooling Wind Speed Optimization

    المؤلفون: Lu, Zhebie, Zhu, Ankang, Li, Chengmin, Luo, Haoze, Li, Wuhua, He, Xiangning

    المصدر: 2020 IEEE 9th International Power Electronics and Motion Control Conference (IPEMC2020-ECCE Asia) Power Electronics and Motion Control Conference (IPEMC2020-ECCE Asia), 2020 IEEE 9th International. :830-833 Nov, 2020

    Relation: 2020 IEEE 9th International Power Electronics and Motion Control Conference (IPEMC2020-ECCE Asia)

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  7. 7
    مؤتمر
    A Coupled Inductor Based Circuit for Voltage Balancing among Series Connected SiC MOSFETs

    المؤلفون: Chen, Saizhen, Li, Chengmin, Lu, Zhebie, Luo, Haoze, Li, Wuhua, He, Xiangning

    المصدر: 2020 IEEE Applied Power Electronics Conference and Exposition (APEC) Applied Power Electronics Conference and Exposition (APEC), 2020 IEEE. :2588-2593 Mar, 2020

    Relation: 2020 IEEE Applied Power Electronics Conference and Exposition (APEC)

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  8. 8
    مؤتمر
    Design of Active SiC MOSFET Gate Driver for Crosstalk Suppression Considering Impedance Coordination between Gate Loop and Power Loop

    المؤلفون: Lu, Zhebie, Li, Chengmin, Wu, Han, Li, Wuhua, He, Xiangning, Li, Shan

    المصدر: 2019 IEEE Applied Power Electronics Conference and Exposition (APEC) Applied Power Electronics Conference and Exposition (APEC), 2019 IEEE. :986-990 Mar, 2019

    Relation: 2019 IEEE Applied Power Electronics Conference and Exposition (APEC)

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  9. 9
    مؤتمر
    Junction Temperature Measurement Based on Electroluminescence Effect in Body Diode of SiC Power MOSFET

    المؤلفون: Li, Chengmin, Lu, Zhebie, Wu, Han, Li, Wuhua, He, Xiangning, Li, Shan

    المصدر: 2019 IEEE Applied Power Electronics Conference and Exposition (APEC) Applied Power Electronics Conference and Exposition (APEC), 2019 IEEE. :338-343 Mar, 2019

    Relation: 2019 IEEE Applied Power Electronics Conference and Exposition (APEC)

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  10. 10
    دورية أكاديمية
    Junction temperature monitoring for cascode GaN devices using the Si MOSFET's body diode voltage drop

    المؤلفون: Lu, Zhebie, Iannuzzo, Francesco

    المصدر: In Microelectronics Reliability November 2023 150

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