-
1دورية أكاديمية
المؤلفون: Orkun Furat, Lukas Petrich, Donal P. Finegan, David Diercks, Francois Usseglio-Viretta, Kandler Smith, Volker Schmidt
المصدر: npj Computational Materials, Vol 7, Iss 1, Pp 1-16 (2021)
مصطلحات موضوعية: Materials of engineering and construction. Mechanics of materials, TA401-492, Computer software, QA76.75-76.765
وصف الملف: electronic resource
Relation: https://doaj.org/toc/2057-3960
-
2دورية أكاديمية
المؤلفون: Tom Kirstein, Lukas Petrich, Ravi Raj Purohit Purushottam Raj Purohit, Jean-Sébastien Micha, Volker Schmidt
المصدر: Materials, Vol 16, Iss 9, p 3397 (2023)
مصطلحات موضوعية: Laue microdiffraction, Laue spot morphology, Laue spot quality, convolutional neural network, polycrystalline material, runtime performance, Technology, Electrical engineering. Electronics. Nuclear engineering, TK1-9971, Engineering (General). Civil engineering (General), TA1-2040, Microscopy, QH201-278.5, Descriptive and experimental mechanics, QC120-168.85
وصف الملف: electronic resource
-
3دورية أكاديمية
المؤلفون: Jaromír Kopeček, Jakub Staněk, Stanislav Habr, Filip Seitl, Lukas Petrich, Volker Schmidt, Viktor Beneš
المصدر: Image Analysis and Stereology, Vol 39, Iss 1, Pp 1-11 (2020)
مصطلحات موضوعية: 3d ebsd, grain boundaries, misorientation, polycrystalline microstructure, statistical image analysis, Medicine (General), R5-920, Mathematics, QA1-939
وصف الملف: electronic resource
-
4دورية أكاديمية
المؤلفون: Lukas Petrich, Orkun Furat, Mingyan Wang, Carl E. Krill III, Volker Schmidt
المصدر: Frontiers in Materials, Vol 8 (2021)
مصطلحات موضوعية: polycrystalline material, tessellation, generalized balanced power diagram, gradient-based optimization, image noise, Technology
وصف الملف: electronic resource
-
5دورية أكاديمية
المؤلفون: Andrea Schnepf, Christopher K. Black, Valentin Couvreur, Benjamin M. Delory, Claude Doussan, Axelle Koch, Timo Koch, Mathieu Javaux, Magdalena Landl, Daniel Leitner, Guillaume Lobet, Trung Hieu Mai, Félicien Meunier, Lukas Petrich, Johannes A. Postma, Eckart Priesack, Volker Schmidt, Jan Vanderborght, Harry Vereecken, Matthias Weber
المصدر: Frontiers in Plant Science, Vol 11 (2020)
مصطلحات موضوعية: functional-structural root architecture models, model comparison, benchmark, root water uptake, call for participation, Plant culture, SB1-1110
وصف الملف: electronic resource
-
6دورية أكاديمية
المؤلفون: Orkun Furat, Mingyan Wang, Matthias Neumann, Lukas Petrich, Matthias Weber, Carl E. Krill, Volker Schmidt
المصدر: Frontiers in Materials, Vol 6 (2019)
مصطلحات موضوعية: machine learning, segmentation, X-ray microtomography, polycrystalline microstructure, Ostwald ripening, statistical image analysis, Technology
وصف الملف: electronic resource
-
7
المؤلفون: Andreas Frey, Matthias Neumann, Lukas Petrich, Georg Lohrmann, Albert Stoll, Volker Schmidt, Fabio Martin
المصدر: Precision Agriculture. 21:1291-1303
مصطلحات موضوعية: 0106 biological sciences, Training set, biology, Computer science, business.industry, 010401 analytical chemistry, Machine learning, computer.software_genre, Weed control, biology.organism_classification, 01 natural sciences, Convolutional neural network, Drone, 0104 chemical sciences, Colchicum autumnale, 010602 entomology, Grassland management, Artificial intelligence, General Agricultural and Biological Sciences, business, computer
-
8
المؤلفون: Volker Schmidt, Lukas Petrich, Petr Král, Viktor Beneš, F. Seitl, Vaclav Sklenicka, Lenka Kunčická, Jakub Staněk
المصدر: Materials Characterization. 151:602-611
مصطلحات موضوعية: 010302 applied physics, Materials science, Misorientation, Mechanical Engineering, chemistry.chemical_element, 02 engineering and technology, 021001 nanoscience & nanotechnology, Condensed Matter Physics, Microstructure, 01 natural sciences, Copper, Grain size, chemistry, Mechanics of Materials, Transmission electron microscopy, 0103 physical sciences, General Materials Science, Grain boundary, Composite material, 0210 nano-technology, Saturation (chemistry), Electron backscatter diffraction
-
9
المؤلفون: Petr Šittner, Lukas Petrich, Volker Schmidt, Luděk Heller, Jakub Staněk, Viktor Beneš, Mingyan Wang, Daniel Westhoff, Carl E. Krill
المصدر: Microscopy and Microanalysis. 25:743-752
مصطلحات موضوعية: Diffraction, Tessellation, Materials science, Cross-entropy method, 02 engineering and technology, Crystal structure, 021001 nanoscience & nanotechnology, 01 natural sciences, Stability (probability), Computational physics, 010104 statistics & probability, Microscopy, Laguerre polynomials, Crystallite, 0101 mathematics, 0210 nano-technology, Instrumentation
-
10
المؤلفون: Lukas Petrich, Georg Lohrmann, Fabio Martin, Albert Stoll, Volker Schmidt
مصطلحات موضوعية: FOS: Computer and information sciences, Forestry, Applications (stat.AP), Horticulture, Agronomy and Crop Science, Statistics - Applications, Computer Science Applications
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::354a887b6d262f73e85492918abaaa0d