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1دورية أكاديمية
المؤلفون: Patrick Philipp, Lukasz Rzeznik, Tom Wirtz
المصدر: Beilstein Journal of Nanotechnology, Vol 7, Iss 1, Pp 1749-1760 (2016)
مصطلحات موضوعية: atomic mixing, depth profiling, helium ion microscopy, ion bombardment, numerical simulations, polymers, SDTRIMSP, Technology, Chemical technology, TP1-1185, Science, Physics, QC1-999
وصف الملف: electronic resource
Relation: https://doaj.org/toc/2190-4286
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2دورية أكاديمية
المؤلفون: Lukasz Rzeznik, Yves Fleming, Tom Wirtz, Patrick Philipp
المصدر: Beilstein Journal of Nanotechnology, Vol 7, Iss 1, Pp 1113-1128 (2016)
مصطلحات موضوعية: Helium ion microscopy, irradiation, polymers, preferential sputtering, secondary ion mass spectrometry, simulations, Technology, Chemical technology, TP1-1185, Science, Physics, QC1-999
وصف الملف: electronic resource
Relation: https://doaj.org/toc/2190-4286
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3
المؤلفون: Lukasz Rzeznik, Patrick Philipp, Tom Wirtz
المصدر: Beilstein Journal of Nanotechnology, Vol 7, Iss 1, Pp 1749-1760 (2016)
Beilstein Journal of Nanotechnologyمصطلحات موضوعية: ion bombardment, depth profiling, General Physics and Astronomy, chemistry.chemical_element, 02 engineering and technology, Binary collision approximation, atomic mixing, lcsh:Chemical technology, 010402 general chemistry, Mass spectrometry, lcsh:Technology, 01 natural sciences, Molecular physics, Full Research Paper, SDTRIMSP, Ion, numerical simulations, Neon, Monatomic ion, Physics::Plasma Physics, Sputtering, Nanotechnology, lcsh:TP1-1185, General Materials Science, Electrical and Electronic Engineering, lcsh:Science, polymers, lcsh:T, Chemistry, 021001 nanoscience & nanotechnology, lcsh:QC1-999, 0104 chemical sciences, Secondary ion mass spectrometry, Nanoscience, helium ion microscopy, lcsh:Q, Atomic physics, 0210 nano-technology, lcsh:Physics, Field ion microscope
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4
المؤلفون: Tom Wirtz, Lukasz Rzeznik, Yves Fleming, Patrick Philipp
المصدر: Beilstein Journal of Nanotechnology, Vol 7, Iss 1, Pp 1113-1128 (2016)
Beilstein Journal of Nanotechnologyمصطلحات موضوعية: Analytical chemistry, General Physics and Astronomy, chemistry.chemical_element, 02 engineering and technology, secondary ion mass spectrometry, lcsh:Chemical technology, 01 natural sciences, lcsh:Technology, Full Research Paper, Ion, Molecular dynamics, Sputtering, Physics::Plasma Physics, 0103 physical sciences, preferential sputtering, Nanotechnology, General Materials Science, lcsh:TP1-1185, Irradiation, Electrical and Electronic Engineering, Diffusion (business), lcsh:Science, Helium, polymers, 010302 applied physics, irradiation, lcsh:T, 021001 nanoscience & nanotechnology, lcsh:QC1-999, Secondary ion mass spectrometry, Nanoscience, chemistry, Helium ion microscopy, lcsh:Q, simulations, 0210 nano-technology, Field ion microscope, lcsh:Physics