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المؤلفون: E. Camerlenghi, Ali Zadeh, Giovanni Santin, Veronique Ferlet-Cavrois, Alessandro Paccagnella, Simone Gerardin, Alessandra Costantino, Marta Bagatin, S. Beltrami, M. Bertuccio, Eamonn Daly
المصدر: IEEE Transactions on Nuclear Science. 65:318-325
مصطلحات موضوعية: 010302 applied physics, Nuclear and High Energy Physics, floating gate (FG) devices, Materials science, 010308 nuclear & particles physics, business.industry, single-event effects, NAND gate, Flash memories, heavy ions, Nuclear Energy and Engineering, Electrical and Electronic Engineering, Dielectric, 01 natural sciences, Fluence, Upset, Threshold voltage, Non-volatile memory, Planar, 0103 physical sciences, Optoelectronics, Irradiation, business
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المؤلفون: S. Beltrami, M. Bertuccio, Angelo Visconti, Christian Monzio Compagnoni, Davide Resnati, John Barber, Carmine Miccoli, Alessandro S. Spinelli, Giovanni M. Paolucci, Andrea L. Lacaita
مصطلحات موضوعية: 010302 applied physics, Negative-bias temperature instability, Condensed matter physics, sezele, Oxide, Charge (physics), 02 engineering and technology, Substrate (electronics), Trapping, 021001 nanoscience & nanotechnology, 01 natural sciences, Flash (photography), chemistry.chemical_compound, chemistry, 0103 physical sciences, Electronic engineering, Relaxation (physics), 0210 nano-technology, Phenomenology (particle physics)
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::5ab6ad66f6118d476aee20358ddd7917
http://hdl.handle.net/11311/987633 -
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المؤلفون: Lin Li, Niccolo Righetti, Christopher J. Larsen, David Daycock, S. Beltrami, Akira Goda, M. Bertuccio, Matthew J. King, Jeff Karpan, Giuseppina Puzzilli, Ceredig Roberts, Ricardo Basco, Elisa Camozzi, William Kueber
المصدر: 2015 IEEE International Memory Workshop (IMW).
مصطلحات موضوعية: Non-volatile memory, Planar, Interference (communication), Stack (abstract data type), AND-OR-Invert, Computer science, Logic gate, Electronic engineering, NAND gate, Hardware_ARITHMETICANDLOGICSTRUCTURES, Gate equivalent, Hardware_LOGICDESIGN
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::c49a1a003c2658e42a42b17b10dc09b6
https://doi.org/10.1109/imw.2015.7150269 -
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المؤلفون: Giovanni M. Paolucci, Angelo Visconti, Alessandro S. Spinelli, S. Beltrami, C. Monzio Compagnoni, M. Bertuccio, Andrea L. Lacaita
مصطلحات موضوعية: Physics, Hardware_MEMORYSTRUCTURES, sezele, business.industry, Semiconductor device modeling, NAND gate, Condensed Matter Physics, Interference (wave propagation), Memory array, Electronic, Optical and Magnetic Materials, Threshold voltage, Flash (photography), Materials Chemistry, Electronic engineering, Optoelectronics, State (computer science), Electrical and Electronic Engineering, business, Nanoscopic scale
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::eff59c7c031767d566b9ca61bd475223
http://hdl.handle.net/11311/961573 -
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المؤلفون: Giovanni M. Paolucci, Angelo Visconti, M. Bertuccio, C. Monzio Compagnoni, Alessandro S. Spinelli, S. Beltrami, Andrea L. Lacaita
المصدر: ESSDERC
مصطلحات موضوعية: Physics, Work (thermodynamics), sezele, business.industry, Electrical engineering, NAND gate, Interference (wave propagation), Threshold voltage, Flash (photography), Reliability (semiconductor), Optoelectronics, Sensitivity (control systems), business, Voltage
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::0b807e93b0da15cb6fe41a4aa53dd793
https://doi.org/10.1109/essderc.2014.6948756 -
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المؤلفون: Andrea L. Lacaita, Giovanni M. Paolucci, Jeffrey Alan Kessenich, Angelo Visconti, Christian Monzio Compagnoni, Alessandro S. Spinelli, M. Bertuccio, Carmine Miccoli, S. Beltrami, John Barber
مصطلحات موضوعية: Spectral approach, Engineering, sezele, business.industry, Time constant, Semiconductor device modeling, NAND gate, Charge (physics), Trapping, Computational physics, Flash (photography), Idle, Electronic engineering, business
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::22ac6e67ad8af187b18d71df61cb6072
http://hdl.handle.net/11311/818519 -
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المؤلفون: Simone Gerardin, L. T. Czeppel, M. Bertuccio, S. Beltrami, Marta Bagatin, Alessandro Paccagnella, Angelo Visconti
المصدر: Università degli Studi di Padova-IRIS
مصطلحات موضوعية: reliability, Materials science, X rays, business.industry, NAND Flash, NAND gate, Charge loss, radiation effects, X ray exposure, Flash memory, Threshold voltage, Non-volatile memory, Flash (photography), Electronic engineering, Optoelectronics, Irradiation, business
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::3c8465b05e1e011d7ca999bbd4992697
https://doi.org/10.1109/irps.2011.5784572 -
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المؤلفون: Simone Gerardin, Alessandro Paccagnella, M. Bertuccio, Angelo Visconti, S. Beltrami, L. T. Czeppel, Marta Bagatin
مصطلحات موضوعية: Nuclear and High Energy Physics, Materials science, business.industry, NAND Flash, Radiochemistry, Electrical engineering, NAND gate, radiation effects, total ionizing dose, Flash memory, Intrinsic and extrinsic aging, Threshold voltage, Flash (photography), Nuclear Energy and Engineering, Absorbed dose, Total dose, Irradiation, Electrical and Electronic Engineering, business
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::30a8899b843a396f3eddf5480f30faab
http://hdl.handle.net/11577/2491565 -
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المؤلفون: Franca Salamino, Monica Averna, Roberto Stifanese, Edon Melloni, R. De Tullio, M. Bertuccio, Sandro Pontremoli
المصدر: Journal of Molecular and Cellular Cardiology. 44:711-712
مصطلحات موضوعية: chemistry.chemical_compound, biology, chemistry, Biochemistry, biology.protein, Calpain, Proteolytic degradation, Cardiology and Cardiovascular Medicine, Molecular Biology, Hsp90, Nitric oxide
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