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المؤلفون: Philippe Leray, N. Jourdan, O. Varela Pedreira, E. Dentoni-Litta, Thomas Witters, Werner Gillijns, Nancy Heylen, L. Ramakers, E. Grieten, Zaid El-Mekki, Gayle Murdoch, V. Vega-Gonzalez, Anne-Laure Charley, Ivan Ciofi, Zsolt Tokei, H. Vats, S. V. Gompel, M. H. van der Veen, L. Halipre, J. Swerts, A. Haider, Bilal Chehab, S. Park, N. Bazzazian, Quoc Toan Le, B. De Wachter, T. Peissker, Harinarayanan Puliyalil, Naoto Horiguchi, Miroslav Cupak, J. Versluijs, G. T. Martinez, Y. Kimura, R. Kim, J. Geypen, J. Uk-Lee, N. Nagesh, D. Montero, L. Rynders, M. Ercken, D. Batuk, K. Croes, Patrick Verdonck, Manoj Jaysankar, Y. Drissi, T. Webers
المصدر: 2021 IEEE International Interconnect Technology Conference (IITC).
مصطلحات موضوعية: chemistry.chemical_compound, Atomic layer deposition, Materials science, chemistry, Analytical chemistry, Nucleation, chemistry.chemical_element, Chemical vapor deposition, Tin, Cobalt, Layer (electronics), Titanium nitride, Titanium oxide
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::775097fabe7d875876eeac9844668bb1
https://doi.org/10.1109/iitc51362.2021.9537535 -
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المؤلفون: Zaid El-Mekki, F. Schleicher, Frederic Lazzarino, D. Trivkovic, Zsolt Tokei, B. De-Wachter, S. V. Gompel, L. Halipre, E. Vancoille, S. Decoster, G. Muroch, Thomas Witters, L. Dupas, O. Varela-Pereira, B. Briggs, Quoc Toan Le, Harinarayanan Puliyalil, Christopher J. Wilson, Philippe Leray, N. Jourdan, I. Demonie, C. Lorant, Joost Bekaert, Nancy Heylen, Y. Kimura, Rogier Baert, M. H. van der Veen, J. Versluijs, Miroslav Cupak, Patrick Verdonck, K. Croes, Manoj Jaysankar, Anne-Laure Charley, J. Heijlen, J. Uk-Lee, Ivan Ciofi, Y. Drissi, V. Vega-Gonzalez, S. Paolillo, H. Vats, D. Montero, L. Rynders, Els Kesters, M. Ercken, A. Lesniewska, R. Kim, Lieve Teugels, T. Webers
المصدر: 2020 IEEE International Electron Devices Meeting (IEDM).
مصطلحات موضوعية: Thermal shock, Reliability (semiconductor), Materials science, chemistry, Process integration, Analytical chemistry, chemistry.chemical_element, Time-dependent gate oxide breakdown, Dielectric, Tin, Ruthenium
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::9d5b5a73112c7be6f5016d4aa4c44eb7
https://doi.org/10.1109/iedm13553.2020.9372096 -
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المؤلفون: Nancy Heylen, K. Croes, Rogier Baert, S. Park, Geoffrey Pourtois, Jean-Philippe Soulie, Katia Devriendt, Christopher J. Wilson, Ming Mao, Q-T. Le, V. Blanco, Gayle Murdoch, Herbert Struyf, Anshul Gupta, V. Vega, Lieve Teugels, S. Paolillo, N. Jourdan, Kiroubanand Sankaran, J. Sweerts, Ivan Ciofi, S. Decoster, P. Morin, Els Kesters, Juergen Boemmels, Frederic Lazzarino, Zs. Tokei, Christoph Adelmann, M. H. van der Veen, M. Ercken, Kris Vanstreels, S. Van Elshocht, M. O'Toole, J. Versluijs, M. H. Na, Frank Holsteyns, Houman Zahedmanesh
المصدر: 2020 IEEE International Electron Devices Meeting (IEDM).
مصطلحات موضوعية: Interconnection, Computer science, Order (business), Inflection point, Electronic engineering, Electric potential, Electrical conductor, Bottleneck, Conductor
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::f3b4b449b819b2556b63b50762bf16b9
https://doi.org/10.1109/iedm13553.2020.9371903 -
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المؤلفون: V. Vega-Gonzalez, J. Bekaert, E. Kesters, Q. T. Le, C. Lorant, O. Varela P., L. Teugels, N. Heylen, Z. El-Mekki, M. van der Veen, T. Webers, C. J. Wilson, H. Vats, L. Rynders, M. Cupak, J. Uk-Lee, Y. Drissi, L. Halipre, A.-L. Charley, P. Verdonck, T. Witters, S. V. Gompel, B. Briggs, Y. Kimura, N. Jourdan, I. Ciofi, A. Gupta, A. Contino, G. Boccardi, S. Lariviere, L. Dupas, B. De-Wachter, E. Vancoille, S. Decoster, F. Lazzarino, M Ercken, P. Debacker, R. Kim, D. Trivkovic, K. Croes, P. Leray, L. Dillemans, Y.-F. Chen, Z. Tokei, J. Versluijs, A. Lesniewska, S. Paolillo, R. Baert, H. Puliyalil
المصدر: 2019 IEEE International Electron Devices Meeting (IEDM).
مصطلحات موضوعية: 010302 applied physics, Chamfer, Materials science, business.industry, 02 engineering and technology, 021001 nanoscience & nanotechnology, 01 natural sciences, Electromigration, Modulation, 0103 physical sciences, Process integration, Optoelectronics, Node (circuits), Static random-access memory, Place and route, 0210 nano-technology, business, Block (data storage)
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::7eecb12b8a386042eac7e3255fe54876
https://doi.org/10.1109/iedm19573.2019.8993538 -
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المؤلفون: Victor Blanco, Gayle Murdoch, S. Paolillo, Danny Wan, Christoph Adelmann, Bogumila Kutrzeba Kotowska, Nouredine Rassoul, Frederic Lazzarino, Christopher J. Wilson, Jürgen Bömmels, Zsolt Tokei, M. Ercken
المصدر: 2018 IEEE International Interconnect Technology Conference (IITC).
مصطلحات موضوعية: 010302 applied physics, Interconnection, Materials science, Annealing (metallurgy), business.industry, Extreme ultraviolet lithography, Copper interconnect, chemistry.chemical_element, 02 engineering and technology, 021001 nanoscience & nanotechnology, 01 natural sciences, Copper, Ruthenium, chemistry, Electrical resistivity and conductivity, 0103 physical sciences, Optoelectronics, 0210 nano-technology, business, Critical dimension
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::87ff871b8552326059f2788385084bb2
https://doi.org/10.1109/iitc.2018.8454841 -
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المؤلفون: E. Dentoni Litta, R. Ritzenthaler, T. Schram, A. Spessot, B. O'Sullivan, Y. Ji, G. Mannaert, C. Lorant, F. Sebaai, A. Thiam, M. Ercken, S. Demuynck, N. Horiguchi
المصدر: Extended Abstracts of the 2017 International Conference on Solid State Devices and Materials.
مصطلحات موضوعية: Materials science, CMOS, business.industry, law, Transistor, Optoelectronics, Diffusion (business), business, Dram, AND gate, High-κ dielectric, law.invention
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::9ad113f1a8aff2d01c775534795d762d
https://doi.org/10.7567/ssdm.2017.k-4-02 -
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المؤلفون: Adrien Vaysset, Eline Raymenants, Khashayar Babaei Gavan, Iuliana Radu, Kristof Paredis, Danny Wan, Cedric Huyghebaert, Dan Mocuta, A. Thiam, Christopher J. Wilson, Johan Swerts, Nouredine Rassoul, J. Jussot, Lennaert Wouters, Safak Sayan, Mauricio Manfrini, Sebastien Couet, M. Ercken, Laurent Souriau
مصطلحات موضوعية: Materials science, Fabrication, Physics and Astronomy (miscellaneous), General Physics and Astronomy, FOS: Physical sciences, 02 engineering and technology, Applied Physics (physics.app-ph), 01 natural sciences, 0103 physical sciences, Torque, Spin-½, 010302 applied physics, Interconnection, Condensed Matter - Materials Science, business.industry, General Engineering, Spin-transfer torque, Materials Science (cond-mat.mtrl-sci), Physics - Applied Physics, 021001 nanoscience & nanotechnology, Domain wall (magnetism), Ferromagnetism, Optoelectronics, 0210 nano-technology, business, Realization (systems)
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::7f482f0293f383448c4a4e167788300c
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المؤلفون: Erik Rosseel, Julien Ryckaert, E. Vecchio, W. Li, Philippe Matagne, Katia Devriendt, M. Ercken, J. Versluijs, Anabela Veloso, Stephan Brus, C. Delvaux, Z. Tao, Vasile Paraschiv, Nadine Collaert, Boon Teik Chan, Dan Mocuta, Niamh Waldron, Efrain Altamirano-Sanchez, T. Huynh-Bao
المصدر: 2016 IEEE SOI-3D-Subthreshold Microelectronics Technology Unified Conference (S3S).
مصطلحات موضوعية: 010302 applied physics, Engineering, Hardware_MEMORYSTRUCTURES, business.industry, Circuit design, Transistor, Electrical engineering, Hardware_PERFORMANCEANDRELIABILITY, 02 engineering and technology, 021001 nanoscience & nanotechnology, 01 natural sciences, law.invention, law, Logic gate, 0103 physical sciences, Vertical direction, Hardware_INTEGRATEDCIRCUITS, Electronic engineering, Static random-access memory, 0210 nano-technology, business, Scaling, Hardware_LOGICDESIGN, Voltage, Leakage (electronics)
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::3ef539062f48cee934246624d382a7b5
https://doi.org/10.1109/s3s.2016.7804409 -
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المؤلفون: Erik Rosseel, Julien Ryckaert, Efrain Altamirano-Sanchez, Philippe Matagne, T. Huynh-Bao, Katia Devriendt, Vasile Paraschiv, Adrian Chasin, Bertrand Parvais, Tsvetan Ivanov, Aaron Thean, A. Sibaja-Hernandez, Z. Tao, J. Versluijs, Eddy Simoen, Anabela Veloso, E. Vecchio, O. Richard, Boon Teik Chan, M. Ercken, B. Kaczer, Samuel Suhard, Stephan Brus, K. De Meyer, S. Ramesh, C. Delvaux, Nadine Collaert, Hugo Bender, P. Lagrain, Niamh Waldron
المساهمون: Electronics and Informatics, Physics, Faculty of Medicine and Pharmacy, Vriendenkring VUB, Faculty of Arts and Philosophy, Chemical Engineering and Industrial Chemistry, Faculty of Engineering
المصدر: 2016 IEEE Symposium on VLSI Technology.
مصطلحات موضوعية: 010302 applied physics, Materials science, business.industry, Doping, Stacking, Nanowire, Electrical engineering, 02 engineering and technology, 021001 nanoscience & nanotechnology, 01 natural sciences, Noise (electronics), PMOS logic, 0103 physical sciences, Optoelectronics, Static random-access memory, Electrical and Electronic Engineering, 0210 nano-technology, business, NMOS logic, Voltage
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::f64b857c9947bedfab2383d329a1f103
https://doi.org/10.1109/vlsit.2016.7573409 -
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المؤلفون: Guglielma Vecchio, Pieter Blomme, Laurent Sourieau, H. Hody, Janko Versluis, Jan Van Houdt, Chi Lim Tan, Geert Van den bosch, Vasile Paraschiv, M. Ercken
المصدر: 2016 IEEE 8th International Memory Workshop (IMW).
مصطلحات موضوعية: Hardware_MEMORYSTRUCTURES, Materials science, business.industry, Extreme ultraviolet lithography, Electrical engineering, NAND gate, Dielectric, Flash (photography), Planar, Logic gate, Charge trap flash, Multiple patterning, Optoelectronics, business
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::cca3fa09ee5485ec9ad4d24c5411368a
https://doi.org/10.1109/imw.2016.7495282