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المؤلفون: Philippe Fontaine, A. Fouchet, J.-M. Dubuisson, J.-M. Kiat, Niels Keller, Christer Engblom, Y. M. Abiven, Gianluca Ciatto, Bruno Berini, Yves Dumont, M. Lecroard, N. Aubert, P.-E. Janolin
المساهمون: Synchrotron SOLEIL (SSOLEIL), Centre National de la Recherche Scientifique (CNRS), Laboratoire Structures, Propriétés et Modélisation des solides (SPMS), Institut de Chimie du CNRS (INC)-CentraleSupélec-Centre National de la Recherche Scientifique (CNRS), Groupe d'Etude de la Matière Condensée (GEMAC), Université de Versailles Saint-Quentin-en-Yvelines (UVSQ)-Centre National de la Recherche Scientifique (CNRS)
المصدر: Journal of Synchrotron Radiation
Journal of Synchrotron Radiation, International Union of Crystallography, 2019, 26 (4), pp.1374-1387. ⟨10.1107/S1600577519003722⟩مصطلحات موضوعية: Diffraction, Nuclear and High Energy Physics, Materials science, Ultra-high vacuum, 02 engineering and technology, X-ray absorption (XAS), 01 natural sciences, tender X-rays, law.invention, Optics, law, diffractometers, 0103 physical sciences, [CHIM]Chemical Sciences, [PHYS.COND]Physics [physics]/Condensed Matter [cond-mat], Spectroscopy, Instrumentation, Diffractometer, diffraction anomalous fine structure (DAFS), 010302 applied physics, X-ray absorption spectroscopy, Radiation, business.industry, [CHIM.MATE]Chemical Sciences/Material chemistry, 021001 nanoscience & nanotechnology, Synchrotron, Beamline, functional oxides, X-ray crystallography, 0210 nano-technology, business
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2دورية أكاديمية
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