المؤلفون: J. T. Shilo, J. Pelleg, M. Sinder

المصدر: AIP Advances, Vol 8, Iss 11, Pp 115203-115203-7 (2018)

مصطلحات موضوعية: Physics, QC1-999

وصف الملف: electronic resource

Relation: https://doaj.org/toc/2158-3226

URL الوصول: https://doaj.org/article/74a85f27ad53438883b69d453038e153

المؤلفون: V. Aguf, J. Pelleg, M. Sinder

المصدر: AIP Advances, Vol 5, Iss 6, Pp 067124-067124-7 (2015)

مصطلحات موضوعية: Physics, QC1-999

وصف الملف: electronic resource

Relation: https://doaj.org/toc/2158-3226

URL الوصول: https://doaj.org/article/3ca963377a76463ea44810bcaa394dd4

لا يتم عرض هذه النتيجة على الضيوف.
تسجيل الدخول للوصول الكامل.

المؤلفون: Felipe M. Sinder, Gustavo S. Neves, Paolo V. Sirieiro, Humberto Miranda

المصدر: Revista Brasileira de Ciência e Movimento; v. 29 n. 4 (2021)
Revista Brasileira de Ciência e Movimento
Universidade Católica de Brasília (UCB)
instacron:UCB

مصطلحات موضوعية: membros superiores, General Engineering, dosagem mínima, pré fadiga, repetições máximas

وصف الملف: application/pdf

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::a3aca0bf9b0c9d022b2a58e32feb3530
https://portalrevistas.ucb.br/index.php/rbcm/article/view/12854

المؤلفون: M. Sinder

المصدر: Defect and Diffusion Forum. 383:153-158

مصطلحات موضوعية: Radiation, Materials science, chemistry.chemical_element, 02 engineering and technology, 010402 general chemistry, 021001 nanoscience & nanotechnology, Condensed Matter Physics, 01 natural sciences, Oxygen, 0104 chemical sciences, chemistry, Chemical physics, General Materials Science, Diffusion (business), 0210 nano-technology

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::05843f256982460597f77e646f7670da
https://doi.org/10.4028/www.scientific.net/ddf.383.153

المؤلفون: Jian Min Shi, M. Sinder, Klaus-Dieter Becker

المصدر: Defect and Diffusion Forum. 383:147-152

مصطلحات موضوعية: Radiation, Materials science, Basis (linear algebra), Diffusion, Kinetics, Analytical chemistry, chemistry.chemical_element, Nitrogen doped, 02 engineering and technology, 010402 general chemistry, 021001 nanoscience & nanotechnology, Condensed Matter Physics, 01 natural sciences, Oxygen, 0104 chemical sciences, chemistry, General Materials Science, Thin film, 0210 nano-technology

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::0df51c4d575a7957b8afa0cceec4eeed
https://doi.org/10.4028/www.scientific.net/ddf.383.147

المؤلفون: M. Sinder, Klaus-Dieter Becker, Jianmin Shi

المصدر: Solid State Ionics. 341:115044

مصطلحات موضوعية: Anatase, Diffusion equation, Materials science, Ambipolar diffusion, 02 engineering and technology, General Chemistry, Rate equation, 010402 general chemistry, 021001 nanoscience & nanotechnology, Condensed Matter Physics, 01 natural sciences, Crystallographic defect, 0104 chemical sciences, Ion, Condensed Matter::Materials Science, Chemical physics, General Materials Science, Thin film, Diffusion (business), 0210 nano-technology

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::5552a6712b61bd657202019c3bb58940
https://doi.org/10.1016/j.ssi.2019.115044

المؤلفون: Joshua Pelleg, M. Sinder, Z. Burshtein

المصدر: Solid State Ionics. 274:123-127

مصطلحات موضوعية: Dopant, Ambipolar diffusion, Band gap, Inorganic chemistry, Oxide, chemistry.chemical_element, Ionic bonding, General Chemistry, Condensed Matter Physics, Thermal diffusivity, Oxygen, Crystal, chemistry.chemical_compound, chemistry, Chemical physics, General Materials Science

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::415775f620ec9bf57064879b0c4c234b
https://doi.org/10.1016/j.ssi.2015.03.002

المؤلفون: Joshua Pelleg, M. Sinder, Z. Burshtein

المصدر: Journal of Physics and Chemistry of Solids. 75:570-582

مصطلحات موضوعية: Valence (chemistry), Dopant, Inorganic chemistry, Oxide, Ionic bonding, chemistry.chemical_element, General Chemistry, Condensed Matter Physics, Redox, Oxygen, Reaction rate, Condensed Matter::Materials Science, chemistry.chemical_compound, chemistry, Chemical physics, Vacancy defect, General Materials Science, Physics::Chemical Physics

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::7dd536a41ac21bfbc41a0f4aa7959d00
https://doi.org/10.1016/j.jpcs.2013.12.016

المؤلفون: Joshua Pelleg, J. T. Shilo, M. Sinder

المصدر: AIP Advances, Vol 8, Iss 11, Pp 115203-115203-7 (2018)

مصطلحات موضوعية: Materials science, Scanning electron microscope, Analytical chemistry, General Physics and Astronomy, 02 engineering and technology, Substrate (electronics), Activation energy, Sputter deposition, 010402 general chemistry, 021001 nanoscience & nanotechnology, 01 natural sciences, lcsh:QC1-999, 0104 chemical sciences, X-ray photoelectron spectroscopy, Sputtering, Thin film, 0210 nano-technology, Yttria-stabilized zirconia, lcsh:Physics

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::d7178ec740f0f1ea42d5322fe9115830
https://doaj.org/article/74a85f27ad53438883b69d453038e153